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    Non-contact methods for thermal properties measurement

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    Many of the renewable and sustainable energy technologies employ novel nanomaterials. For instance, thermal storage and thermoelectric conversion are in constant progress due to the emergence of new structures such as carbon-based materials, bulk nanostructures, 2D novel materials or nanowires. Thermal properties play a significant role to all these energy technologies as key parameters to evaluate the performance and efficiency of those materials in the final device. Understanding the effects of nanostructuring on thermal properties becomes critical, since a reduction in the thermal conductivity due to increased phonon scattering at interfaces is usually expected. Therefore, the determination of the thermal properties remains a critical aspect of material development effort, and measurement techniques are continuously developed or improved. Among those, non-contact heating methods are of importance since they bypass a frequent source of errors characteristic to contact-based thermal measurements, namely the thermal contact resistances, which can be dominant in nanoscale materials. Non-contact heating techniques are usually based on photothermal phenomenon, where heating is generated typically by incident radiation. This paper reviews non-contact heating measurement methods, providing an overview of basic principles for measurement along with associated theoretical model necessary for data reduction and their main applications. The techniques are categorized as time domain and frequency domain techniques, where the thermal response of the sample under study is analyzed as a function of time and frequency, respectively. Both types of methods study the transient response of the sample from a pulsed or modulated heating, and typical measurement output is thermal diffusivity. In addition, other non-contact techniques are also discussed, such as those based on steady-state response, from which the thermal conductivity is directly obtained, or those using AFM probe in the non-contact mode. Finally, main advantages and disadvantages of these techniques are summarized along with their associated uncertainties.The authors would like to acknowledge the financial support from ERC StG NanoTEC 240497. Authors also acknowledge CSIC through the Intramural INFANTE and MICINN through the CONSOLIDER-INGENIO 2010program (grant number CSD2010-00044) projects. D.A.B.-T. acknowledges Fulbright fellowship. M.S.M.-G. would like to thank her Salvador Madariaga fellowship from MECD.Peer reviewe
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