The Capacity Region of the Source-Type Model for Secret Key and Private Key Generation

The problem of simultaneously generating a secret key (SK) and private key (PK) pair among three terminals via public discussion is investigated, in which each terminal observes a component of correlated sources. All three terminals are required to generate a common secret key concealed from an eavesdropper that has access to public discussion, while two designated terminals are required to generate an extra private key concealed from both the eavesdropper and the remaining terminal. An outer bound on the SK-PK capacity region was established in [1], and was shown to be achievable for one case. In this paper, achievable schemes are designed to achieve the outer bound for the remaining two cases, and hence the SK-PK capacity region is established in general. The main technique lies in the novel design of a random binning-joint decoding scheme that achieves the existing outer bound.Comment: 20 pages, 4 figure

Three-dimensional super-resolution correlation-differential confocal microscopy with nanometer axial focusing accuracy

We present a correlation-differential confocal microscopy (CDCM), a novel method that can simultaneously improve the three-dimensional spatial resolution and axial focusing accuracy of confocal microscopy (CM). CDCM divides the CM imaging light path into two paths, where the detectors are before and after the focus with an equal axial offset in opposite directions. Then, the light intensity signals received from the two paths are processed by the correlation product and differential subtraction to improve the CM spatial resolution and axial focusing accuracy, respectively. Theoretical analyses and preliminary experiments indicate that, for the excitation wavelength of λ = 405 nm, numerical aperture of NA = 0.95, and the normalized axial offset of uM = 5.21, the CDCM resolution is improved by more than 20% and more than 30% in the lateral and axial directions, respectively, compared with that of the CM. Also, the axial focusing resolution important for the imaging of sample surface profiles is improved to 1 nm