Inelastic response of silicon to shock compression

The elastic and inelastic response of [001] oriented silicon to laser compression has been a topic of considerable discussion for well over a decade, yet there has been little progress in understanding the basic behaviour of this apparently simple material. We present experimental x-ray diffraction data showing complex elastic strain profiles in laser compressed samples on nanosecond timescales. We also present molecular dynamics and elasticity code modelling which suggests that a pressure induced phase transition is the cause of the previously reported 'anomalous' elastic waves. Moreover, this interpretation allows for measurement of the kinetic timescales for transition. This model is also discussed in the wider context of reported deformation of silicon to rapid compression in the literature

X-ray diffraction measurements of plasticity in shock-compressed vanadium in the region of 10-70 GPa

We report experiments in which powder-diffraction data were recorded from polycrystalline vanadium foils, shock-compressed to pressures in the range of 10-70 GPa. Anisotropic strain in the compressed material is inferred from the asymmetry of Debye-Scherrer diffraction images and used to infer residual strain and yield strength (residual von Mises stress) of the vanadium sample material. We find residual anisotropic strain corresponding to yield strength in the range of 1.2 GPa-1.8 GPa for shock pressures below 30 GPa, but significantly less anisotropy of strain in the range of shock pressures above this. This is in contrast to our simulations of the experimental data using a multi-scale crystal plasticity strength model, where a significant yield strength persists up to the highest pressures we access in the experiment. Possible mechanisms that could contribute to the dynamic response of vanadium that we observe for shock pressures ≥30 GPa are discussed

Femtosecond X-Ray Diffraction Studies of the Reversal of the Microstructural Effects of Plastic Deformation during Shock Release of Tantalum

We have used femtosecond x-ray diffraction (XRD) to study laser-shocked fiber-textured polycrystalline tantalum targets as the 37-253 GPa shock waves break out from the free surface. We extract the time and depth-dependent strain profiles within the Ta target as the rarefaction wave travels back into the bulk of the sample. In agreement with molecular dynamics (MD) simulations the lattice rotation and the twins that are formed under shock-compression are observed to be almost fully eliminated by the rarefaction process

Nonisentropic Release of a Shocked Solid

We present molecular dynamics (MD) simulations of shock and release in micron-scale tantalum crystals that exhibit post-breakout temperatures far exceeding those expected under the standard assumption of isentropic release. We show via an energy-budget analysis that this is due to plastic-work heating from material strength that largely counters thermoelastic cooling. The simulations are corroborated by experiments where the release temperatures of laser-shocked tantalum foils are deduced from their thermal strains via in situ x-ray diffraction, and are found to be close to those behind the shock

Single Hit Energy-resolved Laue Diffraction

In-situ white light Laue diffraction has been successfully used to interrogate the structure of single crystal materials undergoing rapid (nanosecond) dynamic compression up to megabar pressures. However, information on strain state accessible via this technique is limited, reducing its applicability for a range of applications. We present an extension to the existing Laue diffraction platform in which we record the photon energy of a subset of diffraction peaks. This allows for a measurement of the longitudinal and transverse strains in-situ during compression. Consequently, we demonstrate measurement of volumetric compression of the unit cell, in addition to the limited aspect ratio information accessible in conventional white light Laue. We present preliminary results for silicon, where only an elastic strain is observed. VISAR measurements show the presence of a two wave structure and measurements show that material downstream of the second wave does not contribute to the observed diffraction peaks, supporting the idea that this material may be highly disordered, or has undergone large scale rotation

In situ X-ray diffraction measurement of shock-wave-driven twinning and lattice dynamics

Pressure-driven shock waves in solid materials can cause extreme damage and deformation. Understanding this deformation and the associated defects that are created in the material is crucial in the study of a wide range of phenomena, including planetary formation and asteroid impact sites, the formation of interstellar dust clouds, ballistic penetrators, spacecraft shielding and ductility in high-performance ceramics. At the lattice level, the basic mechanisms of plastic deformation are twinning (whereby crystallites with a mirror-image lattice form) and slip (whereby lattice dislocations are generated and move), but determining which of these mechanisms is active during deformation is challenging. Experiments that characterized lattice defects have typically examined the microstructure of samples after deformation, and so are complicated by post-shock annealing and reverberations. In addition, measurements have been limited to relatively modest pressures (less than 100 gigapascals). In situ X-ray diffraction experiments can provide insights into the dynamic behaviour of materials, but have only recently been applied to plasticity during shock compression and have yet to provide detailed insight into competing deformation mechanisms. Here we present X-ray diffraction experiments with femtosecond resolution that capture in situ, lattice-level information on the microstructural processes that drive shock-wave-driven deformation. To demonstrate this method we shock-compress the body-centred-cubic material tantalum-an important material for high-energy-density physics owing to its high shock impedance and high X-ray opacity. Tantalum is also a material for which previous shock compression simulations and experiments have provided conflicting information about the dominant deformation mechanism. Our experiments reveal twinning and related lattice rotation occurring on the timescale of tens of picoseconds. In addition, despite the common association between twinning and strong shocks, we find a transition from twinning to dislocation-slip-dominated plasticity at high pressure (more than 150 gigapascals), a regime that recovery experiments cannot accurately access. The techniques demonstrated here will be useful for studying shock waves and other high-strain-rate phenomena, as well as a broad range of processes induced by plasticity

Phase transitions in shock compressed bismuth identified using single photon energy dispersive X-ray diffraction (SPEDX)

We present evidence for phase transitions in shock-compressed bismuth using the SPEDX x-ray diffraction technique. Experiments were performed on the Vulcan laser at the Central Laser Facility, RAL, Didcot, UK. We observed diffraction from the (110) bcc peak of Bi-V, and from its calculated lattice parameter the pressure was determined to be approximately 17 GPa. Upon further compression (higher laser intensities), no further diffraction from solid phases was observed. Shock melting of bismuth is thought to occur between 18 and 27 GPa. Diffraction results at lower pressures as a function of delay time are also presented

Nanosecond x-ray Laue diffraction apparatus suitable for laser shock compression experiments.

We have used nanosecond bursts of x-rays emitted from a laser-produced plasma, comprised of a mixture of mid-Z elements, to produce a quasiwhite-light spectrum suitable for performing Laue diffraction from single crystals. The laser-produced plasma emits x-rays ranging in energy from 3 to in excess of 10 keV, and is sufficiently bright for single shot nanosecond diffraction patterns to be recorded. The geometry is suitable for the study of laser-shocked crystals, and single-shot diffraction patterns from both unshocked and shocked silicon crystals are presented