CdTe/CZT spectrometers with 3-D imaging capabilities

Semiconductor detector technology has dramatically changed the broad field of x-ray and ?-ray spectroscopy and imaging. Semiconductor detectors, originally developed for particle physics applications, are now widely used for x/?-ray spectroscopy and imaging in a wide variety of fields, including, for example, x-ray fluorescence, ?-ray monitoring and localization, noninvasive inspection and analysis, astronomy, and diagnostic medicine. The success of semiconductor detectors is due to several unique characteristics, such as excellent energy resolution, high detection efficiency, and the possibility of development of compact and highly segmented detection systems. Among semiconductor devices, silicon (Si) detectors are the key detectors in the soft x-ray band (15 keV) and will continue to be the first choice for laboratory-based high-performance spectrometers [3]. © 2015 by Taylor & Francis Group, LLC

Progress in the Development of CdTe and CdZnTe Semiconductor Radiation Detectors for Astrophysical and Medical Applications

Over the last decade, cadmium telluride (CdTe) and cadmium zinc telluride (CdZnTe) wide band gap semiconductors have attracted increasing interest as X-ray and gamma ray detectors. Among the traditional high performance spectrometers based on silicon (Si) and germanium (Ge), CdTe and CdZnTe detectors show high detection efficiency and good room temperature performance and are well suited for the development of compact and reliable detection systems. In this paper, we review the current status of research in the development of CdTe and CdZnTe detectors by a comprehensive survey on the material properties, the device characteristics, the different techniques for improving the overall detector performance and some major applications. Astrophysical and medical applications are discussed, pointing out the ongoing Italian research activities on the development of these detectors

Cyclotron lines in X-ray pulsars as a probe of relativistic plasmas in superstrong magnetic fields

The systematic search for the presence of cyclotron lines in the spectra of accreting X-ray pulsars is being carried on with the BeppoSAX satellite since the beginning of the mission. These highly successful observations allowed the detection of cyclotron lines in many of the accreting X-ray pulsars observed. Some correlations between the different measured parameters were found. We present these correlations and discuss them in the framework of the current theoretical scenario for the X-ray emission from these sources.Comment: 5 pages, 2 figures, uses aipproc.sty, to appear in Proceeding of Fifth Compton Symposiu

Charge Transport Properties in CZT Detectors Grown by the Vertical Bridgman Technique

Great efforts are being presently devoted to the development of CdTe and CdZnTe detectors for a large variety of applications, such as medical, industrial, and space research. We present the spectroscopic properties of some CZT crystals grown by the standard vertical Bridgman method and by the boron oxide encapsulated vertical Bridgman method, which has been recently implemented at IMEM-CNR. By this technique the crystal is grown in an open quartz crucible fully encapsulated by a thin layer of liquid boron oxide. This technique prevent the crystal-crucible contact allowing larger single grains with lower dislocation density to be obtained. Several mono-electrode detectors were realized with two planar gold contacts. The samples are characterized by an active area of ≈4x4 mm2 or ≈7x7 mm2 and with thickness ranging from 1 to 2 mm. The charge transport properties of the detectors have been studied by mobility-lifetime (μτ) product measurements, carried out at the European Synchrotron Radiation Facility (Grenoble) in PTF configuration, where the impinging beam direction is orthogonal to the collecting electric field. We have performed several fine scans between the electrodes with a beam spot of 10x10 μm2 at different energies from 60 keV to 400 keV. In this work we present the test results in terms of μτ product of both charge carriers and an evaluation of the spectroscopic response uniformity across the sensitive volume of tested samples

Cadmium (zinc) telluride 2D/3D spectrometers for scattering polarimetry

he semiconductor detectors technology has dramatically changed the broad field of x- and γ-rays spectroscopy and imaging. Semiconductor detectors, originally developed for particle physics applications, are now widely used for x/γ-rays spectroscopy and imaging in a large variety of fields, among which, for example, x-ray fluorescence, γ-ray monitoring and localization, noninvasive inspection and analysis, astronomy, and diagnostic medicine. The success of semiconductor detectors is due to several unique 242characteristics as the excellent energy resolution, the high detection efficiency, and the possibility of development of compact and highly segmented detection systems (i.e., spectroscopic imager). Among the semiconductor devices, silicon (Si) detectors are the key detectors in the soft x-ray band (15 keV) and will continue to be the first choice for laboratory-based high-performance spectrometers system (Eberth and Simpson 2006)

Study of the spectral response of CZT multiple-electrode detectors

Cadmium zinc telluride (CZT) is a promising material for room temperature X-ray and gamma-ray detectors. The high atomic number and the wide band-gap give high quantum efficiency and good room temperature performances. Due to hole trapping, particular electrode structures have been developed to provide single-charge carrier collection (electrons), exploiting the excellent charge transport properties of the electrons. In this work, the spectroscopic performances of two CZT detectors (CZT1: 5 mm times 5 mm times 0.90 mm; CZT2: 4.8 mm times 5 mm times 0.55 mm) with five electrodes (cathode, anode and three steering electrodes) were studied. The anode-collecting electrode, surrounded by three steering electrodes (biased for optimum charge collection), is mostly sensitive to electron carriers, overcoming the effects of hole trapping in the measured spectra (hole tailing). We investigated on the spectroscopic response (241Am source; 59.5 keV) of the detectors at different bias voltages of the electrodes. The detectors exhibit excellent energy resolution (CZT1: 2.0% FWHM at 59.5 keV; CZT2: 1.7% FWHM at 59.5 keV; working temperature -10degC) and low tailing (CZT1: FW.1M to FWHM ratio of 1.93 at 59.5 keV; CZT2: 2.35 at 59.5 keV). This study stresses on the excellent spectroscopic properties of the CZT detectors equipped with a custom anode layout, making them very attractive candidates as x-ray spectrometers mainly for medical applications

Polarisation measurements with a CdTe pixel array detector for Laue hard X-ray focusing telescopes

Polarimetry is an area of high energy astrophysics which is still relatively unexplored, even though it is recognized that this type of measurement could drastically increase our knowledge of the physics and geometry of high energy sources. For this reason, in the context of the design of a Gamma-Ray Imager based on new hard-X and soft gamma ray focusing optics for the next ESA Cosmic Vision call for proposals (Cosmic Vision 2015-2025), it is important that this capability should be implemented in the principal on-board instrumentation. For the particular case of wide band-pass Laue optics we propose a focal plane based on a thick pixelated CdTe detector operating with high efficiency between 60-600 keV. The high segmentation of this type of detector (1-2 mm pixel size) and the good energy resolution (a few keV FWHM at 500 keV) will allow high sensitivity polarisation measurements (a few % for a 10 mCrab source in 106s) to be performed. We have evaluated the modulation Q factors and minimum detectable polarisation through the use of Monte Carlo simulations (based on the GEANT 4 toolkit) for on and off-axis sources with power law emission spectra using the point spread function of a Laue lens in a feasible configuration.Comment: 10 pages, 6 pages. Accepted for publication in Experimental Astronom

The TRILL project: increasing the technological readiness of Laue lenses

Hard X-/soft Gamma-ray astronomy (> 100 keV) is a crucial field for the study of important astrophysical phenomena such as the 511 keV positron annihilation line in the Galactic center region and its origin, gamma-ray bursts, soft gamma-ray repeaters, nuclear lines from SN explosions and more. However, several key questions in this field require sensitivity and angular resolution that are hardly achievable with present technology. A new generation of instruments suitable to focus hard X-/soft Gamma-rays is necessary to overcome the technological limitations of current direct-viewing telescopes. One solution is using Laue lenses based on Bragg's diffraction in a transmission configuration. To date, this technology is in an advanced stage of development and further efforts are being made in order to significantly increase its technology readiness level (TRL). To this end, massive production of suitable crystals is required, as well as an improvement of the capability of their alignment. Such a technological improvement could be exploited in stratospheric balloon experiments and, ultimately, in space missions with a telescope of about 20 m focal length, capable of focusing over a broad energy pass-band. We present the latest technological developments of the TRILL (Technological Readiness Increase for Laue Lenses) project, supported by ASI, devoted to the advancement of the technological readiness of Laue lenses. We show the method we developed for preparing suitable bent Germanium and Silicon crystals and the latest advancements in crystals alignment technology.Comment: arXiv admin note: text overlap with arXiv:2211.1688

Focussing crystals for use in broad band hard X/soft gamma-ray Laue lenses

Hard X-/soft gamma-ray astronomy is a crucial window for the study of the most energetic and violent events in the Universe. To fulfil the scientific requirements in this regime, a new generation of telescopes with a broad operational band extending from tens up to several hundreds of keV and exploiting unprecedented sensitivity (50-100 times better that current instruments) is required. We report on diffractive bent crystals made of Gallium Arsenide (GaAs) that are suitable for the construction of high sensitivity X-/gamma-ray Laue lens space telescopes. Laue lenses, made of sets of diffractive crystals working in transmission, offer one possibility, albeit technically challenging, to build a new generation of focusing telescopes that can extend the energy band far beyond the 80 keV limit for current multilayer concentrators. In particular, we present the results obtained from the characterization of crystals that will be used to realise a broad band Laue demonstrator. They have been studied in terms of focusing capability and diffraction efficiency by using a flat X-ray panel imager and an HPGe spectrometer as focal plane detectors. The GaAs tiles, bent via a surface lapping procedure, have been developed at the IMEM/CNR in Parma (Italy) in the framework of the LAUE project funded by the Italian Space Agency. The main goal of the project was to build a broad band Laue lens demonstrator for hard X-/soft gamma-rays (80-300 keV