CORE
🇺🇦Â
 make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Filters
1 research outputs found
Si1-x Ge x /Si Interface Profiles Measured to Sub-Nanometer Precision Using uleSIMS Energy Sequencing
Author
C Huyghebaert
DJ Paul
+23Â more
EJ Kirkland
G Gillen
HH Anderson
IG Hughes
JB Clegg
JB Clegg
K Wittmaack
MG Dowsett
MG Dowsett
MG Dowsett
MG Dowsett
MG Dowsett
MG Dowsett
PC Zalm
PM Voyles
RC Sobers Jr
RJH Morris
RJH Morris
RJH Morris
VR Deline
W Reuter
W Vandervorst
ZX Jiang
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
Full text link
Crossref