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Human herpesvirus infections of the central nervous system: laboratory diagnosis based on Dna detection by nested Pcr in plasma and cerebrospinal fluid samples

Infections of the central nervous systems (CNS) present a diagnostic problem for which an accurate laboratory diagnosis is essential. Invasive practices, such as cerebral biopsy, have been replaced by obtaining a polymerase chain reaction (PCR) diagnosis using cerebral spinal fluid (CSF) as a reference method. Tests on DNA extracted from plasma are noninvasive, thus avoiding all of the collateral effects and patient risks associated with CSF collection. This study aimed to determine whether plasma can replace CSF in nested PCR analysis for the detection of CNS human herpesvirus (HHV) diseases by analysing the proportion of patients whose CSF nested PCR results were positive for CNS HHV who also had the same organism identified by plasma nested PCR. In this study, CSF DNA was used as the "gold standard," and nested PCR was performed on both types of samples. Fifty-two patients with symptoms of nervous system infection were submitted to CSF and blood collection. For the eight HHV, one positive DNA result-in plasma and/or CSF nested PCR-was considered an active HHV infection, whereas the occurrence of two or more HHVs in the same sample was considered a coinfection. HHV infections were positively detected in 27/52 (51.9%) of the CSF and in 32/52 (61.5%) of the plasma, difference not significant, thus nested PCR can be performed on plasma instead of CSF. In conclusion, this findings suggest that plasma as a useful material for the diagnosis of cases where there is any difficulty to perform a CSF puncture.Infections of the central nervous systems (CNS) present a diagnostic problem for which an accurate laboratory diagnosis is essential. 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Silicato de potasio como elicitor de resistencia en las características de rendimiento de maíz dulce bajo estrés hídrico

Plant water stress is a major problem in the Cerrado biome of Brazil. Dry periods and random climatic events cause quality and yield losses in sweet corn plants. Compounds, such as silicon (Si), are being studied to reduce the negative impacts of water stress on agricultural crops. Further tests may allow farmers to increase the use of silicon-based compounds. The objective of this study was to evaluate the production parameters of the sweet corn (Zea mays var. saccharata) (Poaceae) Tropical Plus® hybrid with water stress and potassium silicate doses applied with foliar spraying. A randomized block design with four soil water tensions (15, 30, 45 and 60 kPa) and four potassium silicate doses (0, 6, 12 and 24 L ha-1) was used in a greenhouse. The studied factors, alone or in interaction with each other, did not affect most of the sweet corn yield parameters. The hypothesis that these results may have been partially affected by the presence of silicon are discussed. The sweet corn plant yield was affected mainly by the soil water tension of 60 kPa.El estrés hídrico en la planta es un problema importante en el bioma Cerrado de Brasil. Los períodos secos y los eventos climáticos aleatorios causan pérdidas de calidad y productividad en las plantas de maíz dulce. Compuestos como el silicio (Si), pueden ser estudiados para reducir los impactos negativos del estrés hídrico en los cultivos agrícolas. Pruebas adicionales pueden permitir a los agricultores aumentar el uso de compuestos a base de silicio. El objetivo de este trabajo fue evaluar los parámetros de producción de maíz dulce (Zea mays var. Saccharata, híbrido Tropical Plus®) con niveles de estrés hídrico y dosis de silicato de potasio aplicadas por pulverización foliar. El diseño experimental fue un diseño de bloques al azar con cuatro tensiones hídricas en el suelo (15, 30, 45 y 60 kPa) y cuatro dosis de silicato de potasio (0, 6, 12 y 24 L ha-1) en invernadero. Los factores estudiados solos o en interacción no afectaron la mayoría de los parámetros de producción de maíz dulce. Se discute la hipótesis de que estos resultados pueden haber sido parcialmente afectados por la presencia de silicio. El rendimiento de la planta de maíz dulce se vio afectado principalmente por el estrés hídrico del suelo a 60 kPa