Wavelet phase evaluation extended to digital speckle patterninterferometry

A wavelet algorithm developed to improve metrology based on electronic speckle pattern intérferometry (ESPI) is presented. The wavelet algorithm is based on the calculation of the continuous wavelet transform of a modulated speckle correlation fringes .The Paul wavelet is used , the extraction of the maximum scales of the modulus of the wavelet transform leads simply to the phase gradient distribution. The advantage of the method is to provide phase distribution, with a high accuracy, from a single interferogram without unwrapping step.A wavelet algorithm developed to improve metrology based on electronic speckle pattern intérferometry (ESPI) is presented. The wavelet algorithm is based on the calculation of the continuous wavelet transform of a modulated speckle correlation fringes .The Paul wavelet is used , the extraction of the maximum scales of the modulus of the wavelet transform leads simply to the phase gradient distribution. The advantage of the method is to provide phase distribution, with a high accuracy, from a single interferogram without unwrapping step