Measurements of the amplitude-dependent microwave surface resistance of an Au/Nb bilayer

Surface properties are critical to the capabilities of superconducting microwave devices. The native oxide of niobium-based devices is thought to consist of a thin normal conducting layer. To improve understanding on the importance of this layer, an attempt was made to replace it with a more easily controlled gold film. A niobium sample host microwave cavity was used to measure the surface resistance in continuous wave operation at 4.0 GHz and 5.2 GHz. Sample conditions studied include temperatures ranging from 1.6 K to 4.2 K with RF magnetic fields on the sample surface ranging from 1 mT to the maximum field before the superconducting properties were lost (quench field). The nominal film thickness of the gold layer was increased from 0.1 nm to 2.0 nm in five steps to study the impact of the normal layer thickness on surface resistance on a single niobium substrate. The 0.1 nm film was found to reduce the surface resistance of the sample and to enhance the quench field. With the exception of the final step from a 1.5 nm gold film to 2.0 nm, the magnitude of the surface resistance increased substantially with gold film thickness. The nature of the surface resistance field-dependence appeared to be roughly independent from the gold layer thickness. This initial study provides new perspectives and suggests avenues for optimizing and designing surfaces for resonant cavities in particle accelerators and quantum information applications.Comment: Submitted to: Superconductor Science and Technolog

Shielding superconductors with thin films

Determining the optimal arrangement of superconducting layers to withstand large amplitude AC magnetic fields is important for certain applications such as superconducting radiofrequency cavities. In this paper, we evaluate the shielding potential of the superconducting film/insulating film/superconductor (SIS') structure, a configuration that could provide benefits in screening large AC magnetic fields. After establishing that for high frequency magnetic fields, flux penetration must be avoided, the superheating field of the structure is calculated in the London limit both numerically and, for thin films, analytically. For intermediate film thicknesses and realistic material parameters we also solve numerically the Ginzburg-Landau equations. It is shown that a small enhancement of the superheating field is possible, on the order of a few percent, for the SIS' structure relative to a bulk superconductor of the film material, if the materials and thicknesses are chosen appropriately.Comment: 7 pages, 5 figure

On superconducting niobium accelerating cavities fired under N2-gas exposure

The dependence of the Q-value on the RF field (Q-slope) is actively studied in various accelerator laboratories. Although remedies against this dependence have been found, the physical cause still remains obscure. A rather straightforward two-fluid model description of the Q-slope in the low and high field domains is presented with emphasis on the recently experimentally identified improvement of the Q-value by so-called "N-doping"

Electrochemical Polishing of Chemical Vapor Deposited Niobium Thin Films

Combining chemical vapor deposition (CVD) with electrochemical polish (EP) operations is a promising route to producing performance-capable superconducting films for use in the fabrication of cost-effective components for superconducting radiofrequency (SRF) particle accelerators and superconducting quantum computers. The post-deposition EP process enables a critically necessary reduction in surface roughness of niobium thin films to promote optimal superconducting surface conditions. In this work, surface morphology, roughness, and crystal orientation of the CVD-grown and EP-polished niobium films were investigated. The grain growth and polishing mechanisms were analyzed. The CVD films were found to comprise steps, kinks, and pyramidal features, resulting in undesirable large peak-to-valley distances. The electrochemical polish was demonstrated to significantly diminish the height of pyramids and effectively minimize the overall surface roughness. In contrast to buffered chemical polishing (BCP), EP results showed a probable dependence on crystal orientation, suggesting this process was influenced by locally enhanced current density and thickness variations of oxide dielectrics. These understandings identify the EP principles tied to CVD-grown Nb films that allow further refinement of surface profiles for film-based SRF application