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6 research outputs found
Prediction of the Number of Defectives in a Production Batch of Semiconductor Devices
Author
Ahmed Ibrahim
and Horst Lewitschnig
Enrico Zio
Piero Baraldi
Publication venue
Publication date
01/01/2023
Field of study
Get PDF
Archivio istituzionale della ricerca - Politecnico di Milano
Round table MATHMET
Author
Arrhen Fredrik
Bich Walter
+11Â more
Boss Harald
Campos Acosta JoaquÃn
Gunn Robert
Lewitschnig Horst
Mohns Enrico
Ogheard Lorestan
Pievatolo Antonio
Schneider Philipp
Timan Tjerk
Toroi Paula
Zeier Markus
Publication venue
Publication date
30/11/2022
Field of study
Get PDF
5th edition of the Mathmet international conference, Paris, France, 2-4 November 2022.Contribution to the Strategic Research Agenda of MATHMET from the point of view of Technical Committee for Photometry and Radiometry of EURAME
Digital.CSIC
Advances on the Stress Interaction Model
Author
Horst Lewitschnig
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study
No full text
Crossref
Fractional Failures Sampling—An Alternative to Zero Failures Sampling Plans
Author
Armin Fanzott
Horst Lewitschnig
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study
No full text
Crossref
A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices
Author
Ahmed Ibrahim
Baraldi Piero
+3Â more
Lewitschnig Horst
Medici Stefano
Zio Enrico
Publication venue
Publication date
01/01/2021
Field of study
No full text
Archivio istituzionale della ricerca - Politecnico di Milano
An Unsupervised Method for Anomaly Detection in Multi-Stage Production Systems Based on LSTM Autoencoders
Author
Ahmed Ibrahim
Baraldi Piero
+4Â more
Behzad Mehdi
Hosseinpour Fatemeh
Lewitschnig Horst
Zio Enrico
Publication venue
Publication date
01/01/2022
Field of study
No full text
Archivio istituzionale della ricerca - Politecnico di Milano