55 research outputs found
Observation of proportionality between friction and contact area at the nanometer scale
The nanotribological properties of a hydrogen-terminated diamond(111)/tungsten-carbide interface have been studied using ultra-high vacuum atomic force microscopy. Both friction and local contact conductance were measured as a function of applied load. The contact conductance experiments provide a direct and independent way of determining the contact area between the conductive tungsten-carbide AFM tip and the doped diamond sample. We demonstrate that the friction force is directly proportional to the real area of contact at the nanometer-scale. Furthermore, the relation between the contact area and load for this extremely hard heterocontact is found to be in excellent agreement with the Derjaguin–Müller–Toporov continuum mechanics model
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Electronic contribution to friction on GaAs
The electronic contribution to friction at semiconductor surfaces was investigated by using a Pt-coated tip with 50nm radius in an atomic force microscope sliding against an n-type GaAs(100) substrate. The GaAs surface was covered by an approximately 1 nm thick oxide layer. Charge accumulation or depletion was induced by the application of forward or reverse bias voltages. We observed a substantial increase in friction force in accumulation (forward bias) with respect to depletion (reverse bias). We propose a model based on the force exerted by the trapped charges that quantitatively explains the experimental observations of excess friction
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EXTENDING THE RANGE OF LOW ENERGY ELECTRON DIFFRACTION (LEED) SURFACE STRUCTURE DETERMINATION: CO-ADSORBED MOLECULES, INCOMMENSURATE OVERIAYERS AND ALLOY ALLOY SURFACE ORDER STUDIED BY NEW VIDEO AND ELECTRON COUNTING LEED TECHNIQUES
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Extending the range of low energy electron diffraction (LEED) surface structure determination: Co-adsorbed molecules, incommensurate overlayers and alloy surface order studied by new video and electron counting LEED techniques
LEED multiple scattering theory is briefly summarized, and aspects of electron scattering with particular significance to experimental measurements such as electron beam coherence, instrument response and phonon scattering are analyzed. Diffuse LEED experiments are discussed. New techniques that enhance the power of LEED are described, including a real-time video image digitizer applied to LEED intensity measurements, along with computer programs to generate I-V curves. The first electron counting LEED detector using a ''wedge and strip'' position sensitive anode and digital electronics is described. This instrument uses picoampere incident beam currents, and its sensitivity is limited only by statistics and counting times. Structural results on new classes of surface systems are presented. The structure of the c(4 x 2) phase of carbon monoxide adsorbed on Pt(111) has been determined, showing that carbon monoxide molecules adsorb in both top and bridge sites, 1.85 +- 0.10 A and 1.55 +- 0.10 A above the metal surface, respectively. The structure of an incommensurate graphite overlayer on Pt(111) is analyzed. The graphite layer is 3.70 +- 0.05 A above the metal surface, with intercalated carbon atoms located 1.25 +- 0.10 A above hollow sites supporting it. The (2..sqrt..3 x 4)-rectangular phase of benzene and carbon monoxide coadsorbed on Pt(111) is analyzed. Benzene molecules adsorb in bridge sites parallel to and 2.10 +- 0.10 A above the surface. The carbon ring is expanded, with an average C-C bond length of 1.72 +- 0.15 A. The carbon monoxide molecules also adsorb in bridge sites. The structure of the (..sqrt..3 x ..sqrt..3) reconstruction on the (111) face of the ..cap alpha..-CuAl alloy has been determined
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DIRECT OBSERVATION OF NATIVE DNA STRUCTURES WITH THE SCANNING TUNNELING MICROSCOPE
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A NEW SYSTEM FOR LEED INTENSITY MEASUREMENTS USING A REAL-TIME DIGITAL VIDEO PROCESSOR
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MIX OF MOLECULAR ADSORPTION SITES DETECTED FOR DISORDERED CO ON PT(lll) BY DIFFUSE LOW-ENERGY ELECTRON DIFFRACTION
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Atomic Force Microscopy Imaging of T4 Bacteriophages on Silicon Substrates
A new atomic force microscope incorporating microfabricated cantilevers and employing laser beam deflection for force detection has been constructed and is being applied to studied of biological material. In this study, T4 bacteriophage virus particles were deposited from solution onto electronic grade flat silicon wafers and imaged in air with the microscope. Microliter droplets of the solution were deposited and either allowed to dry or removed with blotting paper. The images show both isolated viruses and aggregates of various sizes. The external structure as well as strands believed to be DNA streaming out of the virus could be observed. The construction of the microscope and its performance are also described. 19 refs., 4 figs
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A NEW SYSTEM FOR LEED INTENSITY MEASUREMENTS USING A REAL-TIME DIGITAL VIDEO PROCESSOR
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