113 research outputs found
ΠΠ½Π°Π»ΠΈΠ· ΡΠΊΡΠΏΠ΅ΡΠΈΠΌΠ΅Π½ΡΠ°Π»ΡΠ½ΡΡ Π΄Π°Π½Π½ΡΡ ΠΏΠΎ ΡΠΎΡΠΎΠΎΠ±ΡΠ°Π·ΠΎΠ²Π°Π½ΠΈΡ ?+-ΠΌΠ΅Π·ΠΎΠ½ΠΎΠ² Π΄Π»Ρ ΡΠ½Π΅ΡΠ³ΠΈΠΈ ΡΠΎΡΠΎΠ½ΠΎΠ² 230 ΠΡΠ
ΠΠ° ΠΎΡΠ½ΠΎΠ²Π΅ ΠΈΠ·ΠΌΠ΅ΡΠ΅Π½Π½ΡΡ
ΡΠ°Π½Π΅Π΅ Π½Π° ΡΠ»Π΅ΠΊΡΡΠΎΠ½Π½ΠΎΠΌ ΡΠΈΠ½Ρ
ΡΠΎΡΡΠΎΠ½Π΅ "Π‘ΠΈΡΠΈΡΡ" Π·Π½Π°ΡΠ΅Π½ΠΈΠΉ Π°ΡΠΈΠΌΠΌΠ΅ΡΡΠΈΠΈ ΡΠΎΡΠΎΠΎΠ±ΡΠ°Π·ΠΎΠ²Π°Π½ΠΈΡ ?+-ΠΌΠ΅Π·ΠΎΠ½ΠΎΠ² Π½Π° ΠΏΡΠΎΡΠΎΠ½Π΅, Π° ΡΠ°ΠΊΠΆΠ΅ Π΄Π°Π½Π½ΡΡ
Π΄ΡΡΠ³ΠΈΡ
Π»Π°Π±ΠΎΡΠ°ΡΠΎΡΠΈΠΉ, Π±ΡΠ» ΠΏΡΠΎΠ²Π΅Π΄Π΅Π½ ΡΠ΅Π½ΠΎΠΌΠ΅Π½ΠΎΠ»ΠΎΠ³ΠΈΡΠ΅ΡΠΊΠΈΠΉ Π°Π½Π°Π»ΠΈΠ· Π΄Π»Ρ =230 ΠΡΠ. Π ΡΠ΅Π·ΡΠ»ΡΡΠ°ΡΠ΅ Π±ΡΠ»ΠΈ ΠΏΠΎΠ»ΡΡΠ΅Π½Ρ 5 Π½Π΅Π·Π°Π²ΠΈΡΠΈΠΌΡΡ
Π²Π΅Π»ΠΈΡΠΈΠ½ Π1, Π2, Π3, ?, ?, Π½Π΅ΠΎΠ±Ρ
ΠΎΠ΄ΠΈΠΌΡΡ
Π΄Π»Ρ Π²ΡΡΠΈΡΠ»Π΅Π½ΠΈΡ ΠΌΡΠ»ΡΡΠΈΠΏΠΎΠ»ΡΠ½ΡΡ
Π°ΠΌΠΏΠ»ΠΈΡΡΠ΄
Instability phenomena in microcrystalline silicon films
Microcrystalline silicon (ΞΌc-Si:H) for solar cell applications is investigated with respect to the material stability upon treatment of the material in various environments, followed by annealing. The material can be separated into two groups: (i) material with high crystalline volume fractions and pronounced porosity which is susceptible to in-diffusion of atmospheric gases, which, through adsorption or oxidation affect the electronic properties and (ii) compact material with high or low crystalline volume fractions which show considerably less or no influence of treatment in atmospheric gases. We report the investigation of such effects on the stability of ΞΌc-Si:H films prepared by plasma enhanced chemical vapour deposition and hot wire chemical vapour deposition
Defects in amorphous phase-change materials
Understanding the physical origin of threshold switching and resistance drift phenomena is necessary for making a breakthrough in the performance of low-cost nanoscale technologies related to nonvolatile phase-change memories. Even though both phenomena of threshold switching and resistance drift are often attributed to localized states in the band gap, the distribution of defect states in amorphous phase-change materials (PCMs) has not received so far, the level of attention that it merits. This work presents an experimental study of defects in amorphous PCMs using modulated photocurrent experiments and photothermal deflection spectroscopy. This study of electrically switching alloys involving germanium (Ge), antimony (Sb) and tellurium (Te) such as amorphous germanium telluride (a-GeTe), a-Ge15Te85 and a-Ge2Sb2Te5 demonstrates that those compositions showing a high electrical threshold field also show a high defect density. This result supports a mechanism of recombination and field-induced generation driving threshold switching in amorphous chalcogenides. Furthermore, this work provides strong experimental evidence for complex trap kinetics during resistance drift. This work reports annihilation of deep states and an increase in shallow defect density accompanied by band gap widening in aged a-GeTe thin film
ΠΡΠΎΠ±Π΅Π½Π½ΠΎΡΡΠΈ ΡΠ°Π·ΡΠ°Π±ΠΎΡΠΊΠΈ ΠΈ ΡΡΠ½ΠΊΡΠΈΠΎΠ½Π°Π»Π° ΡΠ½ΠΈΠ²Π΅ΡΡΠ°Π»ΡΠ½ΠΎΠΉ ΠΏΠ°ΡΠΊΠΎΠ²ΠΎΡΠ½ΠΎΠΉ ΡΡΠ°Π½ΡΠΈΠΈ Π΄Π»Ρ ΠΏΠ΅ΡΡΠΎΠ½Π°Π»ΡΠ½ΠΎΠ³ΠΎ ΡΠ»Π΅ΠΊΡΡΠΎΡΡΠ°Π½ΡΠΏΠΎΡΡΠ°
N-type microcrystalline silicon carbide layers prepared by hot-wire chemical vapor deposition were used as window layers for microcrystalline silicon n-i-p solar cells. The microcrystalline silicon intrinsic and p-layers of the solar cells were prepared with plasma-enhanced chemical vapor deposition at a very high frequency. Amorphous silicon incubation layers were observed at the initial stages of the growth of the microcrystalline silicon intrinsic layer under conditions close to the transition from microcrystalline to amorphous silicon growth. 'Seed layers' were developed to improve the nucleation and growth of microcrystalline silicon on the microcrystalline silicon carbide layers. Raman scattering measurement demonstrates that an incorporation of a 'seed layer' can drastically increase the crystalline volume fraction of the total absorber layer. Accordingly, the solar cell performance is improved. The correlation between the cell performance and the structural property of the absorber layer is discussed. By optimizing the deposition process, a high short-circuit current density of 26.7 mA/cm(2) was achieved with an absorber layer thickness of 1 pm, which led to a cell efficiency of 9.2%. (C) 2007 Elsevier B.V. All rights reserved
Highly Reflective Dielectric Back Reflector for Improved Efficiency of Tandem Thin-Film Solar Cells
We report on the prototyping and development of a highly reflective dielectric back reflector for application in thin-film solar cells. The back reflector is fabricated by Snow Globe Coating (SGC), an innovative, simple, and cheap process to deposit a uniform layer of TiO2 particles which shows remarkably high reflectance over a broad spectrum (average reflectance of 99% from 500βnm to 1100βnm). We apply the highly reflective back reflector to tandem thin-film silicon solar cells and compare its performance with conventional ZnO:Al/Ag reflector. By using SGC back reflector, an enhancement of 0.5βmA/cm2 in external quantum efficiency of the bottom solar cell and an absolute value of 0.2% enhancement in overall power conversion efficiency are achieved. We also show that the increase in power conversion efficiency is due to the reduction of parasitic absorption at the back contact; that is, the use of the dielectric reflector avoids plasmonic losses at the reference ZnO:Al/Ag back reflector. The Snow Globe Coating process is compatible with other types of solar cells such as crystalline silicon, IIIβV, and organic photovoltaics. Due to its cost effectiveness, stability, and excellent reflectivity above a wavelength of 400βnm, it has high potential to be applied in industry
ΠΠΎΠ²ΡΡΠ΅Π½ΠΈΠ΅ ΡΡΡΠ΅ΠΊΡΠΈΠ²Π½ΠΎΡΡΠΈ ΠΊΠΎΡΡΠΎΠ·ΠΈΠΎΠ½Π½ΠΎΠΉ Π·Π°ΡΠΈΡΡ ΠΌΠ°Π³ΠΈΡΡΡΠ°Π»ΡΠ½ΡΡ ΡΡΡΠ±ΠΎΠΏΡΠΎΠ²ΠΎΠ΄ΠΎΠ² Π² Π³ΡΡΠ½ΡΠ°Ρ Ρ Π²ΡΡΠΎΠΊΠΎΠΉ ΠΊΠΎΡΡΠΎΠ·ΠΈΠΎΠ½Π½ΠΎΠΉ Π°ΠΊΡΠΈΠ²Π½ΠΎΡΡΡΡ
Π ΡΠ°Π±ΠΎΡΠ΅ ΠΈΠ·Π»ΠΎΠΆΠ΅Π½ Π°Π½Π°Π»ΠΈΠ· ΡΡΡΠ΅ΡΡΠ²ΡΡΡΠΈΡ
ΠΌΠ΅ΡΠΎΠ΄ΠΎΠ² Π±ΠΎΡΡΠ±Ρ Ρ ΠΊΠΎΡΡΠΎΠ·ΠΈΠΎΠ½Π½ΡΠΌΠΈ ΡΠ°Π·ΡΡΡΠ΅Π½ΠΈΡΠΌΠΈ ΡΡΡΠ±ΠΎΠΏΡΠΎΠ²ΠΎΠ΄ΠΎΠ² Π² Π³ΡΡΠ½ΡΠ°Ρ
Ρ Π²ΡΡΠΎΠΊΠΎΠΉ ΠΊΠΎΡΡΠΎΠ·ΠΈΠΎΠ½Π½ΠΎΠΉ Π°ΠΊΡΠΈΠ²Π½ΠΎΡΡΡΡ. Π ΠΏΡΠΎΡΠ΅ΡΡΠ΅ ΠΈΡΡΠ»Π΅Π΄ΠΎΠ²Π°Π½ΠΈΡ ΠΏΡΠΎΠ²ΠΎΠ΄ΠΈΠ»ΠΈΡΡ: ΠΈΠ·ΡΡΠ΅Π½ΠΈΠ΅ ΡΠ΅ΠΎΡΠ΅ΡΠΈΡΠ΅ΡΠΊΠΈΡ
ΠΎΡΠ½ΠΎΠ² ΠΏΡΠΎΡΠ΅ΡΡΠΎΠ² ΠΊΠΎΡΡΠΎΠ·ΠΈΠΎΠ½Π½ΡΡ
ΡΠ°Π·ΡΡΡΠ΅Π½ΠΈΠΉ; Π²ΡΡΠ²Π»Π΅Π½ΠΈΠ΅ ΡΠ°ΠΊΡΠΎΡΠΎΠ², ΠΎΠΊΠ°Π·ΡΠ²Π°ΡΡΠΈΡ
Π½Π°ΠΈΠ±ΠΎΠ»ΡΡΠ΅Π΅ Π²Π»ΠΈΡΠ½ΠΈΠ΅ Π½Π° Π²ΠΎΠ·Π½ΠΈΠΊΠ½ΠΎΠ²Π΅Π½ΠΈΠ΅ ΠΊΠΎΡΡΠΎΠ·ΠΈΠΎΠ½Π½ΡΡ
ΠΏΡΠΎΡΠ΅ΡΡΠΎΠ²; ΡΠ°ΡΡΠΌΠΎΡΡΠ΅Π½ΠΈΠ΅ ΠΌΠ΅ΡΠΎΠ΄ΠΎΠ² ΠΏΠ°ΡΡΠΈΠ²Π½ΠΎΠΉ ΠΈ Π°ΠΊΡΠΈΠ²Π½ΠΎΠΉ Π·Π°ΡΠΈΡΡ ΡΡΡΠ±ΠΎΠΏΡΠΎΠ²ΠΎΠ΄ΠΎΠ² ΠΎΡ ΠΊΠΎΡΡΠΎΠ·ΠΈΠΈ.
Π ΡΠ΅Π·ΡΠ»ΡΡΠ°ΡΠ΅ ΠΈΡΡΠ»Π΅Π΄ΠΎΠ²Π°Π½ΠΈΡ: ΠΏΡΠΎΠΈΠ·Π²Π΅Π΄Π΅Π½ ΡΠ°ΡΡΠ΅Ρ ΡΠ»Π΅ΠΊΡΡΠΎΡ
ΠΈΠΌΠΈΡΠ΅ΡΠΊΠΎΠΉ Π·Π°ΡΠΈΡΡ.
ΠΠ±Π»Π°ΡΡΡ ΠΏΡΠΈΠΌΠ΅Π½Π΅Π½ΠΈΡ: Π»ΠΈΠ½Π΅ΠΉΠ½Π°Ρ ΡΠ°ΡΡΡ ΠΌΠ°Π³ΠΈΡΡΡΠ°Π»ΡΠ½ΠΎΠ³ΠΎ ΡΡΡΠ±ΠΎΠΏΡΠΎΠ²ΠΎΠ΄Π°.The article presents an analysis of existing methods for combating corrosion damage to pipelines in soils with increased corrosive activity. In the course of the research, the following were carried out: study of the theoretical foundations of corrosion destruction processes; identification of factors that have the greatest impact on the occurrence of corrosion processes; consideration of methods of passive and active protection of pipelines from corrosion. As a result of the research: the calculation of the electrochemical protection was made. Scope: linear part of the main pipeline
Analysis of light propagation in thin-film solar cells by dual-probe scanning near-field optical microscopy
In this study, light propagation in textured hydrogenated microcrystalline silicon (ΞΌc-Si:H) thin-film solar cells is investigated on a sub-micron-scale by means of dual-probe scanning near-field optical microscopy (SNOM). Applying advanced modes of operation - exclusively available at dual probe SNOMs - light propagation is analyzed with subwavelength resolution. Measurements at ΞΌc-Si:H thin-film solar cells layer are presented visualizing the influence of local surface features on light propagation. Furthermore, the intensity decay of light guided inside the solar cell is mapped. The observed intensity decay agrees well with theory, verifying the validity of the method
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