113 research outputs found

    Анализ ΡΠΊΡΠΏΠ΅Ρ€ΠΈΠΌΠ΅Π½Ρ‚Π°Π»ΡŒΠ½Ρ‹Ρ… Π΄Π°Π½Π½Ρ‹Ρ… ΠΏΠΎ Ρ„ΠΎΡ‚ΠΎΠΎΠ±Ρ€Π°Π·ΠΎΠ²Π°Π½ΠΈΡŽ ?+-ΠΌΠ΅Π·ΠΎΠ½ΠΎΠ² для энСргии Ρ„ΠΎΡ‚ΠΎΠ½ΠΎΠ² 230 ΠœΡΠ’

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    На основС ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½Π½Ρ‹Ρ… Ρ€Π°Π½Π΅Π΅ Π½Π° элСктронном синхротронС "Бириус" Π·Π½Π°Ρ‡Π΅Π½ΠΈΠΉ асиммСтрии фотообразования ?+-ΠΌΠ΅Π·ΠΎΠ½ΠΎΠ² Π½Π° ΠΏΡ€ΠΎΡ‚ΠΎΠ½Π΅, Π° Ρ‚Π°ΠΊΠΆΠ΅ Π΄Π°Π½Π½Ρ‹Ρ… Π΄Ρ€ΡƒΠ³ΠΈΡ… Π»Π°Π±ΠΎΡ€Π°Ρ‚ΠΎΡ€ΠΈΠΉ, Π±Ρ‹Π» ΠΏΡ€ΠΎΠ²Π΅Π΄Π΅Π½ фСномСнологичСский Π°Π½Π°Π»ΠΈΠ· для =230 ΠœΡΠ’. Π’ Ρ€Π΅Π·ΡƒΠ»ΡŒΡ‚Π°Ρ‚Π΅ Π±Ρ‹Π»ΠΈ ΠΏΠΎΠ»ΡƒΡ‡Π΅Π½Ρ‹ 5 нСзависимых Π²Π΅Π»ΠΈΡ‡ΠΈΠ½ А1, А2, А3, ?, ?, Π½Π΅ΠΎΠ±Ρ…ΠΎΠ΄ΠΈΠΌΡ‹Ρ… для вычислСния ΠΌΡƒΠ»ΡŒΡ‚ΠΈΠΏΠΎΠ»ΡŒΠ½Ρ‹Ρ… Π°ΠΌΠΏΠ»ΠΈΡ‚ΡƒΠ΄

    Instability phenomena in microcrystalline silicon films

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    Microcrystalline silicon (ΞΌc-Si:H) for solar cell applications is investigated with respect to the material stability upon treatment of the material in various environments, followed by annealing. The material can be separated into two groups: (i) material with high crystalline volume fractions and pronounced porosity which is susceptible to in-diffusion of atmospheric gases, which, through adsorption or oxidation affect the electronic properties and (ii) compact material with high or low crystalline volume fractions which show considerably less or no influence of treatment in atmospheric gases. We report the investigation of such effects on the stability of ΞΌc-Si:H films prepared by plasma enhanced chemical vapour deposition and hot wire chemical vapour deposition

    Defects in amorphous phase-change materials

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    Understanding the physical origin of threshold switching and resistance drift phenomena is necessary for making a breakthrough in the performance of low-cost nanoscale technologies related to nonvolatile phase-change memories. Even though both phenomena of threshold switching and resistance drift are often attributed to localized states in the band gap, the distribution of defect states in amorphous phase-change materials (PCMs) has not received so far, the level of attention that it merits. This work presents an experimental study of defects in amorphous PCMs using modulated photocurrent experiments and photothermal deflection spectroscopy. This study of electrically switching alloys involving germanium (Ge), antimony (Sb) and tellurium (Te) such as amorphous germanium telluride (a-GeTe), a-Ge15Te85 and a-Ge2Sb2Te5 demonstrates that those compositions showing a high electrical threshold field also show a high defect density. This result supports a mechanism of recombination and field-induced generation driving threshold switching in amorphous chalcogenides. Furthermore, this work provides strong experimental evidence for complex trap kinetics during resistance drift. This work reports annihilation of deep states and an increase in shallow defect density accompanied by band gap widening in aged a-GeTe thin film

    ΠžΡΠΎΠ±Π΅Π½Π½ΠΎΡΡ‚ΠΈ Ρ€Π°Π·Ρ€Π°Π±ΠΎΡ‚ΠΊΠΈ ΠΈ Ρ„ΡƒΠ½ΠΊΡ†ΠΈΠΎΠ½Π°Π»Π° ΡƒΠ½ΠΈΠ²Π΅Ρ€ΡΠ°Π»ΡŒΠ½ΠΎΠΉ ΠΏΠ°Ρ€ΠΊΠΎΠ²ΠΎΡ‡Π½ΠΎΠΉ станции для ΠΏΠ΅Ρ€ΡΠΎΠ½Π°Π»ΡŒΠ½ΠΎΠ³ΠΎ элСктротранспорта

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    N-type microcrystalline silicon carbide layers prepared by hot-wire chemical vapor deposition were used as window layers for microcrystalline silicon n-i-p solar cells. The microcrystalline silicon intrinsic and p-layers of the solar cells were prepared with plasma-enhanced chemical vapor deposition at a very high frequency. Amorphous silicon incubation layers were observed at the initial stages of the growth of the microcrystalline silicon intrinsic layer under conditions close to the transition from microcrystalline to amorphous silicon growth. 'Seed layers' were developed to improve the nucleation and growth of microcrystalline silicon on the microcrystalline silicon carbide layers. Raman scattering measurement demonstrates that an incorporation of a 'seed layer' can drastically increase the crystalline volume fraction of the total absorber layer. Accordingly, the solar cell performance is improved. The correlation between the cell performance and the structural property of the absorber layer is discussed. By optimizing the deposition process, a high short-circuit current density of 26.7 mA/cm(2) was achieved with an absorber layer thickness of 1 pm, which led to a cell efficiency of 9.2%. (C) 2007 Elsevier B.V. All rights reserved

    Highly Reflective Dielectric Back Reflector for Improved Efficiency of Tandem Thin-Film Solar Cells

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    We report on the prototyping and development of a highly reflective dielectric back reflector for application in thin-film solar cells. The back reflector is fabricated by Snow Globe Coating (SGC), an innovative, simple, and cheap process to deposit a uniform layer of TiO2 particles which shows remarkably high reflectance over a broad spectrum (average reflectance of 99% from 500 nm to 1100 nm). We apply the highly reflective back reflector to tandem thin-film silicon solar cells and compare its performance with conventional ZnO:Al/Ag reflector. By using SGC back reflector, an enhancement of 0.5 mA/cm2 in external quantum efficiency of the bottom solar cell and an absolute value of 0.2% enhancement in overall power conversion efficiency are achieved. We also show that the increase in power conversion efficiency is due to the reduction of parasitic absorption at the back contact; that is, the use of the dielectric reflector avoids plasmonic losses at the reference ZnO:Al/Ag back reflector. The Snow Globe Coating process is compatible with other types of solar cells such as crystalline silicon, III–V, and organic photovoltaics. Due to its cost effectiveness, stability, and excellent reflectivity above a wavelength of 400 nm, it has high potential to be applied in industry

    ΠŸΠΎΠ²Ρ‹ΡˆΠ΅Π½ΠΈΠ΅ эффСктивности ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΎΠ½Π½ΠΎΠΉ Π·Π°Ρ‰ΠΈΡ‚Ρ‹ ΠΌΠ°Π³ΠΈΡΡ‚Ρ€Π°Π»ΡŒΠ½Ρ‹Ρ… Ρ‚Ρ€ΡƒΠ±ΠΎΠΏΡ€ΠΎΠ²ΠΎΠ΄ΠΎΠ² Π² Π³Ρ€ΡƒΠ½Ρ‚Π°Ρ… с высокой ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΎΠ½Π½ΠΎΠΉ Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΡΡ‚ΡŒΡŽ

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    Π’ Ρ€Π°Π±ΠΎΡ‚Π΅ ΠΈΠ·Π»ΠΎΠΆΠ΅Π½ Π°Π½Π°Π»ΠΈΠ· ΡΡƒΡ‰Π΅ΡΡ‚Π²ΡƒΡŽΡ‰ΠΈΡ… ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠ² Π±ΠΎΡ€ΡŒΠ±Ρ‹ с ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΎΠ½Π½Ρ‹ΠΌΠΈ Ρ€Π°Π·Ρ€ΡƒΡˆΠ΅Π½ΠΈΡΠΌΠΈ Ρ‚Ρ€ΡƒΠ±ΠΎΠΏΡ€ΠΎΠ²ΠΎΠ΄ΠΎΠ² Π² Π³Ρ€ΡƒΠ½Ρ‚Π°Ρ… с высокой ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΎΠ½Π½ΠΎΠΉ Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΡΡ‚ΡŒΡŽ. Π’ процСссС исслСдования ΠΏΡ€ΠΎΠ²ΠΎΠ΄ΠΈΠ»ΠΈΡΡŒ: ΠΈΠ·ΡƒΡ‡Π΅Π½ΠΈΠ΅ тСорСтичСских основ процСссов ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΎΠ½Π½Ρ‹Ρ… Ρ€Π°Π·Ρ€ΡƒΡˆΠ΅Π½ΠΈΠΉ; выявлСниС Ρ„Π°ΠΊΡ‚ΠΎΡ€ΠΎΠ², ΠΎΠΊΠ°Π·Ρ‹Π²Π°ΡŽΡ‰ΠΈΡ… наибольшСС влияниС Π½Π° Π²ΠΎΠ·Π½ΠΈΠΊΠ½ΠΎΠ²Π΅Π½ΠΈΠ΅ ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΎΠ½Π½Ρ‹Ρ… процСссов; рассмотрСниС ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠ² пассивной ΠΈ Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠΉ Π·Π°Ρ‰ΠΈΡ‚Ρ‹ Ρ‚Ρ€ΡƒΠ±ΠΎΠΏΡ€ΠΎΠ²ΠΎΠ΄ΠΎΠ² ΠΎΡ‚ ΠΊΠΎΡ€Ρ€ΠΎΠ·ΠΈΠΈ. Π’ Ρ€Π΅Π·ΡƒΠ»ΡŒΡ‚Π°Ρ‚Π΅ исслСдования: ΠΏΡ€ΠΎΠΈΠ·Π²Π΅Π΄Π΅Π½ расчСт элСктрохимичСской Π·Π°Ρ‰ΠΈΡ‚Ρ‹. ΠžΠ±Π»Π°ΡΡ‚ΡŒ примСнСния: линСйная Ρ‡Π°ΡΡ‚ΡŒ ΠΌΠ°Π³ΠΈΡΡ‚Ρ€Π°Π»ΡŒΠ½ΠΎΠ³ΠΎ Ρ‚Ρ€ΡƒΠ±ΠΎΠΏΡ€ΠΎΠ²ΠΎΠ΄Π°.The article presents an analysis of existing methods for combating corrosion damage to pipelines in soils with increased corrosive activity. In the course of the research, the following were carried out: study of the theoretical foundations of corrosion destruction processes; identification of factors that have the greatest impact on the occurrence of corrosion processes; consideration of methods of passive and active protection of pipelines from corrosion. As a result of the research: the calculation of the electrochemical protection was made. Scope: linear part of the main pipeline

    Analysis of light propagation in thin-film solar cells by dual-probe scanning near-field optical microscopy

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    In this study, light propagation in textured hydrogenated microcrystalline silicon (ΞΌc-Si:H) thin-film solar cells is investigated on a sub-micron-scale by means of dual-probe scanning near-field optical microscopy (SNOM). Applying advanced modes of operation - exclusively available at dual probe SNOMs - light propagation is analyzed with subwavelength resolution. Measurements at ΞΌc-Si:H thin-film solar cells layer are presented visualizing the influence of local surface features on light propagation. Furthermore, the intensity decay of light guided inside the solar cell is mapped. The observed intensity decay agrees well with theory, verifying the validity of the method
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