Full Paper Total re¯ection X-ray¯uorescence analysis of laser-deposited solid sample material

Laser ablation (LA) was applied as a sampling technique for the analysis of solids by total re¯ection X-raȳ uorescence (TXRF). The sample material ablated by a pulsed Nd : YAG laser was collected directly on a quartz glass or Plexiglas1 disc commonly used as a sample carrier for TXRF. The analytical capabilities of the combined method were investigated using an improved arrangement of solid sample and TXRF carrier. The technique was applied to the analysis of metallic samples, i.e. Fe±Cr binaries and high-alloy steel, and non-metallic samples, i.e. Al±Ti ceramics, native mineral rocks and gallstones. The nanogram amounts of material deposited on the carrier were always suf®cient for TXRF analysis. Quanti®cation was performed by addition of an internal standard. Absolute detection limits for Fe and Cr in binary samples were 50±60 pg, corresponding to a mass fraction of 5±6 mg g 21 assuming a 10 ng deposit. Sampling from preselected spots of mineral rocks made possible the identi®cation of different components in granite by means of their major and minor constituents. The combined method of LA and TXRF can be used for the rapid characterization of solids on the 10 mm scale without laborious steps of sample preparation

Total reflection X-ray fluorescence in the ultramicro analysis of artists' pigments

The analytical characterization of artists' pigments is very important for art history and for restoration and conservation. Total reflection X-ray fluorescence analysis makes possible the non-destructive analysis of pigments. This new approach complements existing techniques and is unique in being at the same time accurate, fast, inexpensive, and well suited to the screening of pigments used in historical works of art

Application of TXRF for the ultra micro-analysis of artists' pigments

The identification of artists' pigments used for artifacts is required in art historical research and for restoration and conservation purposes. The analysis of materials from valuable works of art requires non-destructive methods or at least methods applicable to very small samples. The extreme sensitivity of TXRF and its experimental simplicity make this technique well suited for pigment analysis. When using an ultra micro method to take samples of less than 1 mu g in weight, TXRF can be applied in a practically non-destructive way. For elements with Z> 11, concentration ratio's can be determined accurately and precisely in paint samples of 10-100 ng (standard deviation on 14 replicate analyses 4%). Applied to oil paintings, ancient manuscripts, polychrome sculptures, painted leather, etc., TXRF allows most old inorganic pigments to be identified based on the presence of one to three key-elements in the pigment. Applications aiming at describing, dating and authenticating artifacts are discussed. It is shown that TXRF is a useful addition to the wide range of scientific methods of analysis available for the study of artists' pigments

Analytical characterization of artists' pigments used in old and modern paintings by total-reflection X-ray fluorescence

The analytical characterization of artists' pigments is a most helpful tool for art history, conservation and restoration of paintings. A very gentle method of ultra-microsampling was developed that is especially applicable to paintings under restoration. It provides a sample mass of about 1 mug and is virtually non-destructive. This minute amount is sufficient for total-reflection X-ray fluorescence (TXRF) to determine most of those elements building inorganic pigments. The convenient and fast method was applied to oil paintings. Various pigments were identified and their mixing proportion was determined even quantitatively