6,244 research outputs found

    Interconnect research influenced

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    This article shows that Rent's rule can be viewed as a fundamental law of nature with respect to electronic circuits. As there are many interpretations of the rule, this article will shed some light on the core of Rent's rule and the research that has been built on it

    Nickel-hydrogen component development

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    Light weight energy storage systems for future space missions are investigated. One of the systems being studied is the nickel hydrogen battery. This battery is designed to achieve longer life, improve performance, and higher energy densities for space applications. The nickel hydrogen component development is discussed. Test data from polarization measurements of the hydrogen electrode component is presented

    Measurement of kinematic and nuclear dependence of R = σ_L/σ_T in deep inelastic electron scattering

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    We report results on a precision measurement of the ratio R=σ_L/σ_T in deep inelastic electron-nucleon scattering in the kinematic range 0.2≤x≤0.5 and 1≤Q^2≤10 (GeV/c)^2. Our results show, for the first time, a clear falloff of R with increasing Q^2. Our R results are in agreement with QCD predictions only when corrections for target mass effects and some additional higher twist effects are included. At small x, the data on R favor structure functions with a large gluon contribution. We also report results on the differences R_A-R_D and the cross section ratio σ^A/σ^D between Fe and Au nuclei and the deuteron. Our results for R_A-R_D are consistent with zero for all x, Q^2 indicating that possible contributions to R from nuclear higher twist effects and spin-0 constituents in nuclei are not different from those in nucleons. The ratios σ^A/σ^D from all recent experiments, at all x, Q^2 values, are now in agreement

    Design, processing and testing of LSI arrays, hybrid microelectronics task

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    Mathematical cost models previously developed for hybrid microelectronic subsystems were refined and expanded. Rework terms related to substrate fabrication, nonrecurring developmental and manufacturing operations, and prototype production are included. Sample computer programs were written to demonstrate hybrid microelectric applications of these cost models. Computer programs were generated to calculate and analyze values for the total microelectronics costs. Large scale integrated (LST) chips utilizing tape chip carrier technology were studied. The feasibility of interconnecting arrays of LSU chips utilizing tape chip carrier and semiautomatic wire bonding technology was demonstrated

    An Experimental Investigation of the Air-Side Convective Heat Transfer Coefficient on Wire and Tube Refrigerator Condenser Coils

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    This thesis presents the results of an experimental investigation of the convective airside heat transfer from wire and tube condensers. The ftrst law of thermodynamics is applied to the "refrigerant", water in this investigation, flowing through the tubes in order to determine the total heat loss from the condenser. The test section is 910 mm (36 in) wide by 300 mm (12 in) tall; thus the coil is tested in an essentially inftnite stream. During the course of the experiments, the influence of the free stream air velocity ranging from 0.15 rn/s to 2.0 rn/s (0.49 ftls to 6.56 ftls) is established. The angle of attack, n, was varied from - 40 degrees to 40 degrees with the air flow always normal to the tubes ('11= 1t/2) and varied from -20 degrees to 20 degrees with the air flow normal to the wires ('II = 0). A method for , calculating view factors and the radiation heat transfer for wire and tube condensers is derived. The effect of the length of the coil is measered at 0 and -5??angle of attack. In addition, the influence of the ftn efftciency on the heat transfer is investigated and accounted for in the deftnition of the heat transfer coefftcient. The heat transfer data in the inertia dominated regime (Richardson number less than 0.0013) are correlated assuming NUcoil = t(Re, n, 'II)' g( S: ) with the Reynolds number based on the wire diameter. The range of Reynolds numbers covered is 15.7 < Rew < 207.5. The ranges of coil geometric parameters (nondimensionlized by dividing by the wire diameter) covered in this study are: 3.022 < nondimensional tube diameter < 5.134, 18.84 < nondimensional tube spacing < 40.94,2.819 < nondimensional wire spacing < 4.427,53.80 < nondimensional tube length< 143.6, and 207.2 < nondimensional wire length < 500.2. The function is represented by tl(a)??Reh (a) for 'II = 0 and h(a).Rei4 (a) for'll=1t/2. Approximately 1700 tests were performed in this investigation using seven different coils. The ftnal correlation is capable of predicting the data with 2cr equal to 16.7% for Ri < 0.0013. A limited natural convection study is also presented.Air Conditioning and Refrigeration Center Project 4

    Fully automated urban traffic system

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    The replacement of the driver with an automatic system which could perform the functions of guiding and routing a vehicle with a human's capability of responding to changing traffic demands was discussed. The problem was divided into four technological areas; guidance, routing, computing, and communications. It was determined that the latter three areas being developed independent of any need for fully automated urban traffic. A guidance system that would meet system requirements was not being developed but was technically feasible

    Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

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    Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis
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