Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

Using machine learning to forecast long-term equity price movement : an empirical study of the Finnish financial markets

Predicting equity price movement is one of the fundamental challenges in finance, and even small improvements in prediction performance can be highly profitable for investors. Long-term investment is one of the popular investment strategies that investors follow. However, evaluating which companies are going to perform well in the future is difficult. This research presents machine learning aided approach to forecast long-term price movement of the stocks listed on the Helsinki Stock Exchange. The purpose of the research is to find out which machine learning model performs the best in the Finnish financial markets and to understand what the key variables are, which have a major effect on the prediction accuracy of the models. The research is also testing whether the macroeconomic variables of Finland increase the accuracy of the machine learning models when forecasting long-term equity price movement. The following machine learning models are used in the research: logistic regression, support vector machine, decision tree, random forest, and k-nearest neighbors. This research produced a number of key findings: the results from the models indicated that the best performance was achieved by the random forest model, which obtained classification accuracy of 65.3% and F1 score of 60.8%; the random forest model is able to give over 60% chance for an investor to pick a stock, which will have a 10% or higher return over the period of one year; the macroeconomic variables increased the prediction performance of every machine learning model used in the research. The main conclusions drawn from this research are that the macroeconomic variables can provide new information, which is not explained by only using financial ratios in the models. Also, the equity prices in the Finnish financial markets are not equally random, meaning that they do not always follow a random walk process. Therefore, this research argues that the Finnish financial market is not highly efficient, thus stock prices are on some level predictable. These findings contribute to the financial theory of market efficiency

Testing from a stochastic timed system with a fault model

In this paper we present a method for testing a system against a non-deterministic stochastic finite state machine. As usual, we assume that the functional behaviour of the system under test (SUT) is deterministic but we allow the timing to be non-deterministic. We extend the state counting method of deriving tests, adapting it to the presence of temporal requirements represented by means of random variables. The notion of conformance is introduced using an implementation relation considering temporal aspects and the limitations imposed by a black-box framework. We propose an algorithm for generating a test suite that determines the conformance of a deterministic SUT with respect to a non-deterministic specification. We show how previous work on testing from stochastic systems can be encoded into the framework presented in this paper as an instantiation of our parameterized implementation relation. In this setting, we use a notion of conformance up to a given confidence level

Evaluating testing methods by delivered reliability

There are two main goals in testing software: (1) to achieve adequate quality (debug testing), where the objective is to probe the software for defects so that these can be removed, and (2) to assess existing quality (operational testing), where the objective is to gain confidence that the software is reliable. Debug methods tend to ignore random selection of test data from an operational profile, while for operational methods this selection is all-important. Debug methods are thought to be good at uncovering defects so that these can be repaired, but having done so they do not provide a technically defensible assessment of the reliability that results. On the other hand, operational methods provide accurate assessment, but may not be as useful for achieving reliability. This paper examines the relationship between the two testing goals, using a probabilistic analysis. We define simple models of programs and their testing, and try to answer the question of how to attain program reliability: is it better to test by probing for defects as in debug testing, or to assess reliability directly as in operational testing? Testing methods are compared in a model where program failures are detected and the software changed to eliminate them. The “better” method delivers higher reliability after all test failures have been eliminated. Special cases are exhibited in which each kind of testing is superior. An analysis of the distribution of the delivered reliability indicates that even simple models have unusual statistical properties, suggesting caution in interpreting theoretical comparisons

Test Set Diameter: Quantifying the Diversity of Sets of Test Cases

A common and natural intuition among software testers is that test cases need to differ if a software system is to be tested properly and its quality ensured. Consequently, much research has gone into formulating distance measures for how test cases, their inputs and/or their outputs differ. However, common to these proposals is that they are data type specific and/or calculate the diversity only between pairs of test inputs, traces or outputs. We propose a new metric to measure the diversity of sets of tests: the test set diameter (TSDm). It extends our earlier, pairwise test diversity metrics based on recent advances in information theory regarding the calculation of the normalized compression distance (NCD) for multisets. An advantage is that TSDm can be applied regardless of data type and on any test-related information, not only the test inputs. A downside is the increased computational time compared to competing approaches. Our experiments on four different systems show that the test set diameter can help select test sets with higher structural and fault coverage than random selection even when only applied to test inputs. This can enable early test design and selection, prior to even having a software system to test, and complement other types of test automation and analysis. We argue that this quantification of test set diversity creates a number of opportunities to better understand software quality and provides practical ways to increase it.Comment: In submissio