Voltage island-driven floorplanning.

Ma, Qiang.Thesis (M.Phil.)--Chinese University of Hong Kong, 2008.Includes bibliographical references (leaves 78-80).Abstracts in English and Chinese.Abstract --- p.iAcknowledgement --- p.ivChapter 1 --- Introduction --- p.1Chapter 1.1 --- Background --- p.1Chapter 1.2 --- Floorplanning --- p.2Chapter 1.3 --- Motivations --- p.4Chapter 1.4 --- Design Implementation of Voltage Islands --- p.5Chapter 1.5 --- Problem Formulation --- p.8Chapter 1.6 --- Progress on the Problem --- p.10Chapter 1.7 --- Contributions --- p.12Chapter 1.8 --- Thesis Organization --- p.14Chapter 2 --- Literature Review on MSV --- p.15Chapter 2.1 --- Introduction --- p.15Chapter 2.2 --- MSV at Post-floorplan/Post Placement Stage --- p.16Chapter 2.2.1 --- """Post-Placement Voltage Island Generation under Performance Requirement""" --- p.16Chapter 2.2.2 --- """Post-Placement Voltage Island Generation""" --- p.18Chapter 2.2.3 --- """Timing-Constrained and Voltage-Island-Aware Voltage Assignment""" --- p.19Chapter 2.2.4 --- """Voltage Island Generation under Performance Requirement for SoC Designs""" --- p.20Chapter 2.2.5 --- """An ILP Algorithm for Post-Floorplanning Voltage-Island Generation Considering Power-Network Planning""" --- p.21Chapter 2.3 --- MSV at Floorplan/Placement Stage --- p.22Chapter 2.3.1 --- """Architecting Voltage Islands in Core-based System-on-a- Chip Designs""" --- p.22Chapter 2.3.2 --- """Voltage Island Aware Floorplanning for Power and Timing Optimization""" --- p.23Chapter 2.4 --- Summary --- p.27Chapter 3 --- MSV Driven Floorplanning --- p.29Chapter 3.1 --- Introduction --- p.29Chapter 3.2 --- Problem Formulation --- p.32Chapter 3.3 --- Algorithm Overview --- p.33Chapter 3.4 --- Optimal Island Partitioning and Voltage Assignment --- p.33Chapter 3.4.1 --- Voltage Islands in Non-subtrees --- p.35Chapter 3.4.2 --- Proof of Optimality --- p.36Chapter 3.4.3 --- Handling Island with Power Down Mode --- p.37Chapter 3.4.4 --- Speedup in Implementation and Complexity --- p.38Chapter 3.4.5 --- Varying Background Chip-level Voltage --- p.39Chapter 3.5 --- Simulated Annealing --- p.39Chapter 3.5.1 --- Moves --- p.39Chapter 3.5.2 --- Cost Function --- p.40Chapter 3.6 --- Experimental Results --- p.40Chapter 3.6.1 --- Extension to Minimize Level Shifters --- p.45Chapter 3.6.2 --- Extension to Consider Power Network Routing --- p.46Chapter 3.7 --- Summary --- p.46Chapter 4 --- MSV Driven Floorplanning with Timing --- p.49Chapter 4.1 --- Introduction --- p.49Chapter 4.2 --- Problem Formulation --- p.52Chapter 4.3 --- Algorithm Overview --- p.56Chapter 4.4 --- Voltage Assignment Problem --- p.56Chapter 4.4.1 --- Lagrangian Relaxation --- p.58Chapter 4.4.2 --- Transformation into the Primal Minimum Cost Flow Problem --- p.60Chapter 4.4.3 --- Cost-Scaling Algorithm --- p.64Chapter 4.4.4 --- Solution Transformation --- p.66Chapter 4.5 --- Simulated Annealing --- p.69Chapter 4.5.1 --- Moves --- p.69Chapter 4.5.2 --- Speeding up heuristic --- p.69Chapter 4.5.3 --- Cost Function --- p.70Chapter 4.5.4 --- Annealing Schedule --- p.71Chapter 4.6 --- Experimental Results --- p.71Chapter 4.7 --- Summary --- p.72Chapter 5 --- Conclusion --- p.76Bibliography --- p.8

VoltageIsland Driven Floorplanning Considering Level-Shifter Positions. GLSVLSI

ABSTRACT Power optimization has become a significant issue when the CMOS technology entered the nanometer era. MultipleSupply Voltage (MSV) is a popular and effective method for power reduction. Level shifters may cause area and Interconnect Length Overhead(ILO), and should be considered during floorplanning and post-floorplanning stages. In this paper, we propose a two phases framework VLSAF to solve voltage and level shifter assignment problem. At floorplanning phase, we use: a convex cost network flow algorithm to assign voltage; a minimum cost flow algorithm to assign level shifter. At post-floorplanning phase, a heuristic method is adopted to redistribute white spaces and calculate the positions and shapes of level shifters. Experimental results show VLSAF is effective

Clustering-Based Simultaneous Task and Voltage Scheduling for NoC Systems

Network-on-Chip (NoC) is emerging as a promising communication structure, which is scalable with respect to chip complexity. Meanwhile, latest chip designs are increasingly leveraging multiple voltage-frequency domains for energy-efficiency improvement. In this work, we propose a simultaneous task and voltage scheduling algorithm for energy minimization in NoC based designs. The energy-latency tradeoff is handled by Lagrangian relaxation. The core algorithm is a clustering based approach which not only assigns voltage levels and starting time to each task (or Processing Element) but also naturally finds voltage-frequency clusters. Compared to a recent previous work, which performs task scheduling and voltage assignment sequentially, our method leads to an average of 20 percent energy reduction

Voltage island based heterogeneous NoC design through constraint programming

This paper discusses heterogeneous Network-on-Chip (NoC) design from a Constraint Programming (CP) perspective and extends the formulation to solving Voltage-Frequency Island (VFI) problem. In general, VFI is a superior design alternative in terms of thermal constraints, power consumption as well as performance considerations. Given a Communication Task Graph (CTG) and subsequent task assignments for cores, cores are allocated to the best possible places on the chip in the first stage to minimize the overall communication cost among cores. We then solve the application scheduling problem to determine the optimum core types from a list of technological alternatives and to minimize the makespan. Moreover, an elegant CP model is proposed to solve VFI problem by mapping and grouping cores at the same time with scheduling the computation tasks as a limited capacity resource allocation model. The paper reports results based on real benchmark datasets from the literature. © 2014 Elsevier Ltd. All rights reserved

Heurísticas bioinspiradas para el problema de Floorplanning 3D térmico de dispositivos MPSoCs

Tesis inédita de la Universidad Complutense de Madrid, Facultad de Informática, Departamento de Arquitectura de Computadores y Automática, leída el 20-06-2013Depto. de Arquitectura de Computadores y AutomáticaFac. de InformáticaTRUEunpu

Interconnect Planning for Physical Design of 3D Integrated Circuits

Vertical stacking—based on modern manufacturing and integration technologies—of multiple 2D chips enables three-dimensional integrated circuits (3D ICs). This exploitation of the third dimension is generally accepted for aiming at higher packing densities, heterogeneous integration, shorter interconnects, reduced power consumption, increased data bandwidth, and realizing highly-parallel systems in one device. However, the commercial acceptance of 3D ICs is currently behind its expectations, mainly due to challenges regarding manufacturing and integration technologies as well as design automation. This work addresses three selected, practically relevant design challenges: (i) increasing the constrained reusability of proven, reliable 2D intellectual property blocks, (ii) planning different types of (comparatively large) through-silicon vias with focus on their impact on design quality, as well as (iii) structural planning of massively-parallel, 3D-IC-specific interconnect structures during 3D floorplanning. A key concept of this work is to account for interconnect structures and their properties during early design phases in order to support effective and high-quality 3D-IC-design flows. To tackle the above listed challenges, modular design-flow extensions and methodologies have been developed. Experimental investigations reveal the effectiveness and efficiency of the proposed techniques, and provide findings on 3D integration with particular focus on interconnect structures. We suggest consideration of these findings when formulating guidelines for successful 3D-IC design automation.:1 Introduction 1.1 The 3D Integration Approach for Electronic Circuits 1.2 Technologies for 3D Integrated Circuits 1.3 Design Approaches for 3D Integrated Circuits 2 State of the Art in Design Automation for 3D Integrated Circuits 2.1 Thermal Management 2.2 Partitioning and Floorplanning 2.3 Placement and Routing 2.4 Power and Clock Delivery 2.5 Design Challenges 3 Research Objectives 4 Planning Through-Silicon Via Islands for Block-Level Design Reuse 4.1 Problems for Design Reuse in 3D Integrated Circuits 4.2 Connecting Blocks Using Through-Silicon Via Islands 4.2.1 Problem Formulation and Methodology Overview 4.2.2 Net Clustering 4.2.3 Insertion of Through-Silicon Via Islands 4.2.4 Deadspace Insertion and Redistribution 4.3 Experimental Investigation 4.3.1 Wirelength Estimation 4.3.2 Configuration 4.3.3 Results and Discussion 4.4 Summary and Conclusions 5 Planning Through-Silicon Vias for Design Optimization 5.1 Deadspace Requirements for Optimized Planning of Through-Silicon Vias 5.2 Multiobjective Design Optimization of 3D Integrated Circuits 5.2.1 Methodology Overview and Configuration 5.2.2 Techniques for Deadspace Optimization 5.2.3 Design-Quality Analysis 5.2.4 Planning Different Types of Through-Silicon Vias 5.3 Experimental Investigation 5.3.1 Configuration 5.3.2 Results and Discussion 5.4 Summary and Conclusions 6 3D Floorplanning for Structural Planning of Massive Interconnects 6.1 Block Alignment for Interconnects Planning in 3D Integrated Circuits 6.2 Corner Block List Extended for Block Alignment 6.2.1 Alignment Encoding 6.2.2 Layout Generation: Block Placement and Alignment 6.3 3D Floorplanning Methodology 6.3.1 Optimization Criteria and Phases and Related Cost Models 6.3.2 Fast Thermal Analysis 6.3.3 Layout Operations 6.3.4 Adaptive Optimization Schedule 6.4 Experimental Investigation 6.4.1 Configuration 6.4.2 Results and Discussion 6.5 Summary and Conclusions 7 Research Summary, Conclusions, and Outlook Dissertation Theses Notation Glossary BibliographyDreidimensional integrierte Schaltkreise (3D-ICs) beruhen auf neuartigen Herstellungs- und Integrationstechnologien, wobei vor allem “klassische” 2D-ICs vertikal zu einem neuartigen 3D-System gestapelt werden. Dieser Ansatz zur Erschließung der dritten Dimension im Schaltkreisentwurf ist nach Expertenmeinung dazu geeignet, höhere Integrationsdichten zu erreichen, heterogene Integration zu realisieren, kürzere Verdrahtungswege zu ermöglichen, Leistungsaufnahmen zu reduzieren, Datenübertragungsraten zu erhöhen, sowie hoch-parallele Systeme in einer Baugruppe umzusetzen. Aufgrund von technologischen und entwurfsmethodischen Schwierigkeiten bleibt jedoch bisher die kommerzielle Anwendung von 3D-ICs deutlich hinter den Erwartungen zurück. In dieser Arbeit werden drei ausgewählte, praktisch relevante Problemstellungen der Entwurfsautomatisierung von 3D-ICs bearbeitet: (i) die Verbesserung der (eingeschränkten) Wiederverwendbarkeit von zuverlässigen 2D-Intellectual-Property-Blöcken, (ii) die komplexe Planung von verschiedenartigen, verhältnismäßig großen Through-Silicion Vias unter Beachtung ihres Einflusses auf die Entwurfsqualität, und (iii) die strukturelle Einbindung von massiv-parallelen, 3D-IC-spezifischen Verbindungsstrukturen während der Floorplanning-Phase. Das Ziel dieser Arbeit besteht darin, Verbindungsstrukturen mit deren wesentlichen Eigenschaften bereits in den frühen Phasen des Entwurfsprozesses zu berücksichtigen. Dies begünstigt einen qualitativ hochwertigen Entwurf von 3D-ICs. Die in dieser Arbeit vorgestellten modularen Entwurfsprozess-Erweiterungen bzw. -Methodiken dienen zur effizienten Lösung der oben genannten Problemstellungen. Experimentelle Untersuchungen bestätigen die Wirksamkeit sowie die Effektivität der erarbeiten Methoden. Darüber hinaus liefern sie praktische Erkenntnisse bezüglich der Anwendung von 3D-ICs und der Planung deren Verbindungsstrukturen. Diese Erkenntnisse sind zur Ableitung von Richtlinien für den erfolgreichen Entwurf von 3D-ICs dienlich.:1 Introduction 1.1 The 3D Integration Approach for Electronic Circuits 1.2 Technologies for 3D Integrated Circuits 1.3 Design Approaches for 3D Integrated Circuits 2 State of the Art in Design Automation for 3D Integrated Circuits 2.1 Thermal Management 2.2 Partitioning and Floorplanning 2.3 Placement and Routing 2.4 Power and Clock Delivery 2.5 Design Challenges 3 Research Objectives 4 Planning Through-Silicon Via Islands for Block-Level Design Reuse 4.1 Problems for Design Reuse in 3D Integrated Circuits 4.2 Connecting Blocks Using Through-Silicon Via Islands 4.2.1 Problem Formulation and Methodology Overview 4.2.2 Net Clustering 4.2.3 Insertion of Through-Silicon Via Islands 4.2.4 Deadspace Insertion and Redistribution 4.3 Experimental Investigation 4.3.1 Wirelength Estimation 4.3.2 Configuration 4.3.3 Results and Discussion 4.4 Summary and Conclusions 5 Planning Through-Silicon Vias for Design Optimization 5.1 Deadspace Requirements for Optimized Planning of Through-Silicon Vias 5.2 Multiobjective Design Optimization of 3D Integrated Circuits 5.2.1 Methodology Overview and Configuration 5.2.2 Techniques for Deadspace Optimization 5.2.3 Design-Quality Analysis 5.2.4 Planning Different Types of Through-Silicon Vias 5.3 Experimental Investigation 5.3.1 Configuration 5.3.2 Results and Discussion 5.4 Summary and Conclusions 6 3D Floorplanning for Structural Planning of Massive Interconnects 6.1 Block Alignment for Interconnects Planning in 3D Integrated Circuits 6.2 Corner Block List Extended for Block Alignment 6.2.1 Alignment Encoding 6.2.2 Layout Generation: Block Placement and Alignment 6.3 3D Floorplanning Methodology 6.3.1 Optimization Criteria and Phases and Related Cost Models 6.3.2 Fast Thermal Analysis 6.3.3 Layout Operations 6.3.4 Adaptive Optimization Schedule 6.4 Experimental Investigation 6.4.1 Configuration 6.4.2 Results and Discussion 6.5 Summary and Conclusions 7 Research Summary, Conclusions, and Outlook Dissertation Theses Notation Glossary Bibliograph

Radiation safety based on the sky shine effect in reactor

In the reactor operation, neutrons and gamma rays are the most dominant radiation. As protection, lead and concrete shields are built around the reactor. However, the radiation can penetrate the water shielding inside the reactor pool. This incident leads to the occurrence of sky shine where a physical phenomenon of nuclear radiation sources was transmitted panoramic that extends to the environment. The effect of this phenomenon is caused by the fallout radiation into the surrounding area which causes the radiation dose to increase. High doses of exposure cause a person to have stochastic effects or deterministic effects. Therefore, this study was conducted to measure the radiation dose from sky shine effect that scattered around the reactor at different distances and different height above the reactor platform. In this paper, the analysis of the radiation dose of sky shine effect was measured using the experimental metho

Investigation into yield and reliability enhancement of TSV-based three-dimensional integration circuits

Three dimensional integrated circuits (3D ICs) have been acknowledged as a promising technology to overcome the interconnect delay bottleneck brought by continuous CMOS scaling. Recent research shows that through-silicon-vias (TSVs), which act as vertical links between layers, pose yield and reliability challenges for 3D design. This thesis presents three original contributions.The first contribution presents a grouping-based technique to improve the yield of 3D ICs under manufacturing TSV defects, where regular and redundant TSVs are partitioned into groups. In each group, signals can select good TSVs using rerouting multiplexers avoiding defective TSVs. Grouping ratio (regular to redundant TSVs in one group) has an impact on yield and hardware overhead. Mathematical probabilistic models are presented for yield analysis under the influence of independent and clustering defect distributions. Simulation results using MATLAB show that for a given number of TSVs and TSV failure rate, careful selection of grouping ratio results in achieving 100% yield at minimal hardware cost (number of multiplexers and redundant TSVs) in comparison to a design that does not exploit TSV grouping ratios. The second contribution presents an efficient online fault tolerance technique based on redundant TSVs, to detect TSV manufacturing defects and address thermal-induced reliability issue. The proposed technique accounts for both fault detection and recovery in the presence of three TSV defects: voids, delamination between TSV and landing pad, and TSV short-to-substrate. Simulations using HSPICE and ModelSim are carried out to validate fault detection and recovery. Results show that regular and redundant TSVs can be divided into groups to minimise area overhead without affecting the fault tolerance capability of the technique. Synthesis results using 130-nm design library show that 100% repair capability can be achieved with low area overhead (4% for the best case). The last contribution proposes a technique with joint consideration of temperature mitigation and fault tolerance without introducing additional redundant TSVs. This is achieved by reusing spare TSVs that are frequently deployed for improving yield and reliability in 3D ICs. The proposed technique consists of two steps: TSV determination step, which is for achieving optimal partition between regular and spare TSVs into groups; The second step is TSV placement, where temperature mitigation is targeted while optimizing total wirelength and routing difference. Simulation results show that using the proposed technique, 100% repair capability is achieved across all (five) benchmarks with an average temperature reduction of 75.2? (34.1%) (best case is 99.8? (58.5%)), while increasing wirelength by a small amount

PeF: Poisson's Equation Based Large-Scale Fixed-Outline Floorplanning

Floorplanning is the first stage of VLSI physical design. An effective floorplanning engine definitely has positive impact on chip design speed, quality and performance. In this paper, we present a novel mathematical model to characterize non-overlapping of modules, and propose a flat fixed-outline floorplanning algorithm based on the VLSI global placement approach using Poisson's equation. The algorithm consists of global floorplanning and legalization phases. In global floorplanning, we redefine the potential energy of each module based on the novel mathematical model for characterizing non-overlapping of modules and an analytical solution of Poisson's equation. In this scheme, the widths of soft modules appear as variables in the energy function and can be optimized. Moreover, we design a fast approximate computation scheme for partial derivatives of the potential energy. In legalization, based on the defined horizontal and vertical constraint graphs, we eliminate overlaps between modules remained after global floorplanning, by modifying relative positions of modules. Experiments on the MCNC, GSRC, HB+ and ami49\_x benchmarks show that, our algorithm improves the average wirelength by at least 2\% and 5\% on small and large scale benchmarks with certain whitespace, respectively, compared to state-of-the-art floorplanners