Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

Analog‐to‐Digital Conversion for Cognitive Radio: Subsampling, Interleaving, and Compressive Sensing

This chapter explores different analog-to-digital conversion techniques that are suitable to be implemented in cognitive radio receivers. This chapter details the fundamentals, advantages, and drawbacks of three promising techniques: subsampling, interleaving, and compressive sensing. Due to their major maturity, subsampling- and interleaving-based systems are described in further detail, whereas compressive sensing-based systems are described as a complement of the previous techniques for underutilized spectrum applications. The feasibility of these techniques as part of software-defined radio, multistandard, and spectrum sensing receivers is demonstrated by proposing different architectures with reduced complexity at circuit level, depending on the application requirements. Additionally, the chapter proposes different solutions to integrate the advantages of these techniques in a unique analog-to-digital conversion process

Design of Energy-Efficient A/D Converters with Partial Embedded Equalization for High-Speed Wireline Receiver Applications

As the data rates of wireline communication links increases, channel impairments such as skin effect, dielectric loss, fiber dispersion, reflections and cross-talk become more pronounced. This warrants more interest in analog-to-digital converter (ADC)-based serial link receivers, as they allow for more complex and flexible back-end digital signal processing (DSP) relative to binary or mixed-signal receivers. Utilizing this back-end DSP allows for complex digital equalization and more bandwidth-efficient modulation schemes, while also displaying reduced process/voltage/temperature (PVT) sensitivity. Furthermore, these architectures offer straightforward design translation and can directly leverage the area and power scaling offered by new CMOS technology nodes. However, the power consumption of the ADC front-end and subsequent digital signal processing is a major issue. Embedding partial equalization inside the front-end ADC can potentially result in lowering the complexity of back-end DSP and/or decreasing the ADC resolution requirement, which results in a more energy-effcient receiver. This dissertation presents efficient implementations for multi-GS/s time-interleaved ADCs with partial embedded equalization. First prototype details a 6b 1.6GS/s ADC with a novel embedded redundant-cycle 1-tap DFE structure in 90nm CMOS. The other two prototypes explain more complex 6b 10GS/s ADCs with efficiently embedded feed-forward equalization (FFE) and decision feedback equalization (DFE) in 65nm CMOS. Leveraging a time-interleaved successive approximation ADC architecture, new structures for embedded DFE and FFE are proposed with low power/area overhead. Measurement results over FR4 channels verify the effectiveness of proposed embedded equalization schemes. The comparison of fabricated prototypes against state-of-the-art general-purpose ADCs at similar speed/resolution range shows comparable performances, while the proposed architectures include embedded equalization as well

A jittered-sampling correction technique for ADCs

In Analogue to Digital Converters (ADCs) jittered sampling raises the noise floor; this leads to a decrease in its Signal to Noise ratio (SNR) and its effective number of bits (ENOB). This research studies a technique that compensate for the effects of sampling with a jittered clock. A thorough understanding of sampling in various data converters is complied

A 16-b 10Msample/s Split-Interleaved Analog to Digital Converter

This work describes the integrated circuit design of a 16-bit, 10Msample/sec, combination ‘split’ interleaved analog to digital converter. Time interleaving of analog to digital converters has been used successfully for many years as a technique to achieve faster speeds using multiple identical converters. However, efforts to achieve higher resolutions with this technique have been difficult due to the precise matching required of the converter channels. The most troublesome errors in these types of converters are gain, offset and timing differences between channels. The ‘split ADC’ is a new concept that allows the use of a deterministic, digital, self calibrating algorithm. In this approach, an ADC is split into two paths, producing two output codes from the same input sample. The difference of these two codes is used as the calibration signal for an LMS error estimation algorithm that drives the difference error to zero. The ADC is calibrated when the codes are equal and the output is taken as the average of the two codes. The ‘split’ ADC concept and interleaved architecture are combined in this IC design to form the core of a high speed, high resolution, and self-calibrating ADC system. The dual outputs are used to drive a digital calibration engine to correct for the channel mismatch errors. This system has the speed benefits of interleaving while maintaining high resolution. The hardware for the algorithm as well as the ADC can be implemented in a standard 0.25um CMOS process, resulting in a relatively inexpensive solution. This work is supported by grants from Analog Devices Incorporated (ADI) and the National Science Foundation (NSF)

Concepts for smart AD and DA converters

This thesis studies the `smart' concept for application to analog-to-digital and digital-to-analog converters. The smart concept aims at improving performance - in a wide sense - of AD/DA converters by adding on-chip intelligence to extract imperfections and to correct for them. As the smart concept can correct for certain imperfections, it can also enable the use of more efficient architectures, thus yielding an additional performance boost. Chapter 2 studies trends and expectations in converter design with respect to applications, circuit design and technology evolution. Problems and opportunities are identfied, and an overview of performance criteria is given. Chapter 3 introduces the smart concept that takes advantage of the expected opportunities (described in chapter 2) in order to solve the anticipated problems. Chapter 4 applies the smart concept to digital-to-analog converters. In the discussed example, the concept is applied to reduce the area of the analog core of a current-steering DAC. It is shown that a sub-binary variable-radix approach reduces the area of the current-source elements substantially (10x compared to state-of-the-art), while maintaining accuracy by a self-measurement and digital pre-correction scheme. Chapter 5 describes the chip implementation of the sub-binary variable-radix DAC and discusses the experimental results. The results confirm that the sub-binary variable-radix design can achieve the smallest published current-source-array area for the given accuracy (12bit). Chapter 6 applies the smart concept to analog-to-digital converters, with as main goal the improvement of the overall performance in terms of a widely used figure-of-merit. Open-loop circuitry and time interleaving are shown to be key to achieve high-speed low-power solutions. It is suggested to apply a smart approach to reduce the effect of the imperfections, unintentionally caused by these key factors. On high-level, a global picture of the smart solution is proposed that can solve the problems while still maintaining power-efficiency. Chapter 7 deals with the design of a 500MSps open-loop track-and-hold circuit. This circuit is used as a test case to demonstrate the proposed smart approaches. Experimental results are presented and compared against prior art. Though there are several limitations in the design and the measurement setup, the measured performance is comparable to existing state-of-the-art. Chapter 8 introduces the first calibration method that counteracts the accuracy issues of the open-loop track-and-hold. A description of the method is given, and the implementation of the detection algorithm and correction circuitry is discussed. The chapter concludes with experimental measurement results. Chapter 9 introduces the second calibration method that targets the accuracy issues of time-interleaved circuits, in this case a 2-channel version of the implemented track-and-hold. The detection method, processing algorithm and correction circuitry are analyzed and their implementation is explained. Experimental results verify the usefulness of the method

Compensation numérique pour convertisseur large bande hautement parallélisé.

Time-interleaved analog-to-digital converters (TIADC) seem to be the holy grail of analog-to-digital conversion. Theoretically, their sampling speed can be increased, very simply, by duplicating the sub-converters. The real world is different because mismatches between the converters strongly reduce the TIADC performance, especially when trying to push forward the sampling speed, or the resolution of the converter. Using background digital mismatch calibration can alleviate this limitation. The first part of the thesis is dedicated to studying the sources and effects of mismatches in a TIADC. Performance metrics such as the SNDR and the SFDR are derived as a function of the mismatch levels. In the second part, new background digital mismatch calibration techniques are presented. They are able to reduce the offset, gain, skew and bandwidth mismatch errors. The mismatches are estimated by using the statistical properties of the input signal and digital filters are used to reconstruct the correct output samples. In the third part, a 1.6 GS/s TIADC circuit, implementing offset, gain and skew mismatch calibration, demonstrates a reduction of the mismatch spurs down to a level of -70 dBFS, up to an input frequency of 750 MHz. The circuit achieves the lowest level of mismatches among TIADCs in the same frequency range, with a reasonable power and area, in spite of the overhead caused by the calibration.Les convertisseurs analogique-numérique à entrelacement temporel (TIADC) semblent être une solution prometteuse dans le monde de la conversion analogique-numérique. Leur fréquence d’échantillonnage peut théoriquement être augmentée en augmentant le nombre de convertisseurs en parallèle. En réalité, des désappariements entre les convertisseurs peuvent fortement dégrader les performances, particulièrement à haute fréquence d’échantillonnage ou à haute résolution. Ces défauts d’appariement peuvent être réduits en utilisant des techniques de calibration en arrière-plan. La première partie de cette thèse est consacrée à l’étude des sources et effets des différents types de désappariements dans un TIADC. Des indicateurs de performance tels que le SNDR ou la SFDR sont exprimés en fonction du niveau des désappariements. Dans la deuxième partie, des nouvelles techniques de calibration sont proposées. Ces techniques permettent de réduire les effets des désappariements d’offset, de gain, d’instant d’échantillonnage et de bande passante. Les désappariements sont estimés en se basant sur des propriétés statistiques du signal et la reconstruction des échantillons de sortie se fait en utilisant des filtres numériques. La troisième partie démontre les performance d’un TIADC fonctionnant a une fréquence d’échantillonnage de 1.6 GE/s et comprenant les calibration d’offset, de gain et d’instant d’échantillonnage proposées. Les raies fréquentielles dues aux désappariements sont réduites à un niveau de -70dBc jusqu’à une fréquence d’entrée de 750 MHz. Ce circuit démontre une meilleure correction de désappariements que des circuits similaires récemment publiés, et ce avec une augmentation de puissance consommée et de surface relativement faible