8 research outputs found
Circuit-level modelling and simulation of carbon nanotube devices
The growing academic interest in carbon nanotubes (CNTs) as a promising novel class of electronic materials has led to significant progress in the understanding of CNT physics including ballistic and non-ballistic electron transport characteristics. Together with the increasing amount of theoretical analysis and experimental studies into the properties of CNT transistors, the need for corresponding modelling techniques has also grown rapidly. This research is focused on the electron transport characteristics of CNT transistors, with the aim to develop efficient techniquesto model and simulate CNT devices for logic circuit analysis.The contributions of this research can be summarised as follows. Firstly, to accelerate the evaluation of the equations that model a CNT transistor, while maintaining high modelling accuracy, three efficient numerical techniques based on piece-wise linear, quadratic polynomial and cubic spline approximation have been developed. The numerical approximation simplifies the solution of the CNT transistor’s self-consistent voltage such that the calculation of the drain-source current is accelerated by at least two orders of magnitude. The numerical approach eliminates complicated calculations in the modelling process and facilitates the development of fast and efficient CNT transistor models for circuit simulation.Secondly, non-ballistic CNT transistors have been considered, and extended circuit-level models which can capture both ballistic and non-ballistic electron transport phenomena, including elastic scattering, phonon scattering, strain and tunnelling effects, have been developed. A salient feature of the developed models is their ability to incorporate both ballistic and non-ballistic transport mechanisms without a significant computational cost. The developed models have been extensively validated against reported transport theories of CNT transistors and experimental results.Thirdly, the proposed carbon nanotube transistor models have been implemented on several platforms. The underlying algorithms have been developed and tested in MATLAB, behaviourallevel models in VHDL-AMS, and improved circuit-level models have been implemented in two versions of the SPICE simulator. As the final contribution of this work, parameter variation analysis has been carried out in SPICE3 to study the performance of the proposed circuit-level CNT transistor models in logic circuit analysis. Typical circuits, including inverters and adders, have been analysed to determine the dependence of the circuit’s correct operation on CNT parameter variation
HSPICE implementation of a numerically efficient model of CNT transistor
This paper presents the algorithms of an implementation of a numerically efficient carbon nanotube transistor (CNT) model in HSPICE. The model is derived from cubic spline non-linear approximation of the non-equilibrium mobile charge density. The spline algorithm exploits a rapid and accurate solution of the numerical relationship between the charge density and the self-consistent voltage, which results in the acceleration of deriving the current through the channel without losing much accuracy. The output I-V characteristics of the proposed model have been compared with those of a recent HSPICE implementation of the Stanford CNT model and published experimental I-V curves. The results show superior accuracy of the proposed model while maintaining similar CPU time performance. Two versions of the HSPICE macromodel implementation have been developed and validated, one to reflect ballistic transport only and another with non-ballistic effects. To further validate the model a complementary logic inverter has also been implemented using the proposed technique and simulated in HSPICE
Recommended from our members
Device and circuit-level models for carbon nanotube and graphene nanoribbon transistors
Metal-oxide semiconductor field-effect transistor (MOSFET) scaling throughout the years has enabled us to pack million of MOS transistors on a single chip to keep in pace with Moore’s Law. After forty years of advances in integrated circuit (IC) technology, the scaling of silicon (Si) MOSFET has entered the nanometer dimension with the introduction of 90 nm high volume manufacturing in 2004. The latest technological advancement has led to a low power, high-density and high-speed generation of processor. Nevertheless, the scaling of the Si MOSFET below 22 nm may soon meet its’ fundamental physical limitations. This threshold makes the possible use of novel devices and structures such as carbon nanotube field-effect transistors (CNTFETs) and graphene nanoribbon field-effect transistors (GNRFETs) for future nanoelectronics. The investigation explores the potential of these amazing carbon structures that exceed MOSFET capabilities in term of speed, scalability and power consumption. The research findings demonstrate the potential integration of carbon based technology into existing ICs. In particular, a simulation program with integrated circuit emphasis (SPICE) model for CNTFET and GNRFET in digital logic applications is presented. The device performance of these circuit models and their design layout are then compared to 45 nm and 90 nm MOSFET for benchmarking. It is revealed through the investigation that CNT and GNR channels can overcome the limitations imposed by Si channel length scaling and associated short channel effects while consuming smaller channel area at higher current density
Recommended from our members
Layout-accurate Ultra-fast System-level Design Exploration Through Verilog-ams
This research addresses problems in designing analog and mixed-signal (AMS) systems by bridging the gap between system-level and circuit-level simulation by making simulations fast like system-level and accurate like circuit-level. The tools proposed include metamodel integrated Verilog-AMS based design exploration flows. The research involves design centering, metamodel generation flows for creating efficient behavioral models, and Verilog-AMS integration techniques for model realization. The core of the proposed solution is transistor-level and layout-level metamodeling and their incorporation in Verilog-AMS. Metamodeling is used to construct efficient and layout-accurate surrogate models for AMS system building blocks. Verilog-AMS, an AMS hardware description language, is employed to build surrogate model implementations that can be simulated with industrial standard simulators. The case-study circuits and systems include an operational amplifier (OP-AMP), a voltage-controlled oscillator (VCO), a charge-pump phase-locked loop (PLL), and a continuous-time delta-sigma modulator (DSM). The minimum and maximum error rates of the proposed OP-AMP model are 0.11 % and 2.86 %, respectively. The error rates for the PLL lock time and power estimation are 0.7 % and 3.0 %, respectively. The OP-AMP optimization using the proposed approach is ~17000× faster than the transistor-level model based approach. The optimization achieves a ~4× power reduction for the OP-AMP design. The PLL parasitic-aware optimization achieves a 10× speedup and a 147 µW power reduction. Thus the experimental results validate the effectiveness of the proposed solution
VLSI Design
This book provides some recent advances in design nanometer VLSI chips. The selected topics try to present some open problems and challenges with important topics ranging from design tools, new post-silicon devices, GPU-based parallel computing, emerging 3D integration, and antenna design. The book consists of two parts, with chapters such as: VLSI design for multi-sensor smart systems on a chip, Three-dimensional integrated circuits design for thousand-core processors, Parallel symbolic analysis of large analog circuits on GPU platforms, Algorithms for CAD tools VLSI design, A multilevel memetic algorithm for large SAT-encoded problems, etc
Opportunities for radio frequency nanoelectronic integrated circuits using carbon-based technologies
This thesis presents a body of work on the modeling of and performance predictions for carbon nanotube field-effect transistors (CNFET) and graphene field-effect transistors (GFET). While conventional silicon-based CMOS is expected to reach its ultimate scaling limits during the next decade, these two novel technologies are promising candidates for future high-performance electronics. The main goal of this work is to investigate
on the opportunities of using such carbon-based electronics for RF integrated circuits.
This thesis addresses 1) the modeling of noise and process variability in CNFETs, 2) RF performance predictions for CNFETs, and 3) an accurate GFET compact model. This work proposes the first CNFET noise compact model. Noise is of primary importance for RF applications and its description significantly increases the insight gained from simulation studies. Furthermore, a CNFET variability model is presented, which handles tube synthesis and metal tube removal imperfections. These two model extensions have been added to the Stanford CNFET compact model and allow for the variability-aware RF performance assessment of the CNFET technology.
In continuation, comprehensive RF performance projections for CNFETs are provided both on the device and circuit level. The overall set of ITRS RF-CMOS technology requirement FoMs is determined and shows that the CNFET performs excellently in terms of speed, gain, and minimum noise figure. Furthermore, for the first time FoMs are reported for the basic RF building blocks low-noise amplifier and oscillator. In addition, it is shown that CNFET downscaling yields significant performance improvements. Based on these analyses it is confirmed that the CNFET has the potential to outperform Si-CMOS in RF applications.
A third key contribution of this thesis is the development of an accurate GFET compact model. Previous compact models simplify several physical aspects, which can cause erroneous simulation results. Here, an accurate yet simple mathematical description of the GFET’s current-voltage relation is proposed and implemented in Verilog-A. Comprehensive error analyses are done in order to highlight the advantages of the new approach.
Furthermore, the model is verified against measurement results. The developed GFET model is an important step towards better understanding the characteristics and opportunities of graphene-based analog circuitry
Air Force Institute of Technology Contributions to Air Force Research and Development, Calendar Year 1986
This report highlights AFIT\u27s contributions to Air Force research and development activities in 1986