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1 research outputs found
VDMOSFET HEF degradation modelling considering turn-around phenomenon
Author
Alwan
Alwan
+20Â more
C. Chen
Chen
Dankovic
Davidovic
G.F. Zhai
L. Wang
McPherson
Ogawa
Ristic
Saha
Schluender
Stahlbush
Stojadinovic
Stojadinovic
Stojadinovic
Weinberg
X.R. Ye
Y.X. Wang
Ye
Zhang
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
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