14,679 research outputs found

    Developing a distributed electronic health-record store for India

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    The DIGHT project is addressing the problem of building a scalable and highly available information store for the Electronic Health Records (EHRs) of the over one billion citizens of India

    Development of a Design for Manufacturing Tool for Automated Fiber Placement Structures

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    Existing design processes for laminates constructed with automated fiber placement lack significant integration between the various software tools that compose the process. Tools for finite element analysis, computer aided drafting, stress analysis, tool path simulation, and manufacturing defect prediction are all critical parts of the design process. With traditional hand-layup laminates, the analysis performed with each of these tools could be fairly well decoupled from one another. However, for laminates generated by automated fiber placement, the disciplines can become significantly coupled, especially on structures with curvature. This gives rise to a need for integrated design for manufacturing software tools that are able to balance the competing objectives from each discipline. This paper describes the preliminary development of such a tool

    APPLICATION AND REFINEMENTS OF THE REPS THEORY FOR SAFETY CRITICAL SOFTWARE

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    With the replacement of old analog control systems with software-based digital control systems, there is an urgent need for developing a method to quantitatively and accurately assess the reliability of safety critical software systems. This research focuses on proposing a systematic software metric-based reliability prediction method. The method starts with the measurement of a metric. Measurement results are then either directly linked to software defects through inspections and peer reviews or indirectly linked to software defects through empirical software engineering models. Three types of defect characteristics can be obtained, namely, 1) the number of defects remaining, 2) the number and the exact location of the defects found, and 3) the number and the exact location of defects found in an earlier version. Three models, Musa's exponential model, the PIE model and a mixed Musa-PIE model, are then used to link each of the three categories of defect characteristics with reliability respectively. In addition, the use of the PIE model requires mapping defects identified to an Extended Finite State Machine (EFSM) model. A procedure that can assist in the construction of the EFSM model and increase its repeatability is also provided. This metric-based software reliability prediction method is then applied to a safety-critical software used in the nuclear industry using eleven software metrics. Reliability prediction results are compared with the real reliability assessed by using operational failure data. Experiences and lessons learned from the application are discussed. Based on the results and findings, four software metrics are recommended. This dissertation then focuses on one of the four recommended metrics, Test Coverage. A reliability prediction model based on Test Coverage is discussed in detail and this model is further refined to be able to take into consideration more realistic conditions, such as imperfect debugging and the use of multiple testing phases

    Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

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    Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field. Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions

    FAUSTA: Scaling Dynamic Analysis with Traffic Generation at WhatsApp

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    We introduce Fausta, an algorithmic traffic gener-ation platform that enables analysis and testing at scale. Fausta has been deployed at Meta to analyze and test the WhatsApp plat-form infrastructure since September 2020, enabling WhatsApp developers to deploy reliable code changes to a code base of millions of lines of code, supporting over 2 billion users who rely on WhatsApp for their daily communications. Fausta covers expected and unexpected program behaviors in a privacy-safe controlled environment to support multiple use cases such as reliability testing, privacy analysis and performance regression detection. It currently supports three different algorithmic input generation strategies, each of which construct realistic backend server traffic that closely simulates production data, without replaying any real user data. Fausta has been deployed and closely integrated into the WhatsApp continuous integration process, catching bugs in development before they hit production. We report on the development and deployment of Fausta's reliability use case between September 2020 and August 2021. During this period it has found 1,876 unique reliability issues, with a fix rate of 74%, indicating a high degree of true positive fault revelation. We also report on the distribution of fault types revealed by Fausta, and the correlation between coverage and faults found. Overall, we do find evidence that higher coverage is correlated with fault revelation

    Empirical Evaluation of Test Coverage for Functional Programs

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    The correlation between test coverage and test effectiveness is important to justify the use of coverage in practice. Existing results on imperative programs mostly show that test coverage predicates effectiveness. However, since functional programs are usually structurally different from imperative ones, it is unclear whether the same result may be derived and coverage can be used as a prediction of effectiveness on functional programs. In this paper we report the first empirical study on the correlation between test coverage and test effectiveness on functional programs. We consider four types of coverage: as input coverages, statement/branch coverage and expression coverage, and as oracle coverages, count of assertions and checked coverage. We also consider two types of effectiveness: raw effectiveness and normalized effectiveness. Our results are twofold. (1) In general the findings on imperative programs still hold on functional programs, warranting the use of coverage in practice. (2) On specific coverage criteria, the results may be unexpected or different from the imperative ones, calling for further studies on functional programs

    Recent Trends and Perspectives on Defect-Oriented Testing

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    Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test

    Assessing the effectiveness of different test approaches for power devices in a PCB

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    Power electronic systems employing Printed Circuit Boards (PCBs) are broadly used in many applications, including some safety-critical ones. Several standards (e.g., ISO26262 for the automotive sector and DO-178 for avionics) mandate the adoption of effective test procedures for all electronic systems. However, the metrics to be used to compute the effectiveness of the adopted test procedures are not so clearly defined for power devices and systems. In the last years, some commercial fault simulation tools (e.g., DefectSim by Mentor Graphics and TestMAX by Synopsys) for analog circuits have been introduced, together with some new fault models. With these new tools, systematic analog fault simulation finally became practically feasible. The aim of this paper is twofold: first, we propose a method to extend the usage of the new analog fault models to power devices, thus allowing to compute a Fault Coverage figure for a given test. Secondly, we adopt the method on a case study, for which we quantitatively evaluate the effectiveness of some test procedures commonly used at the PCB level for the detection of faults inside power devices. A typical Power Supply Unit (PSU) used in industrial products, including power transistors and power diodes, is considered. The analysis of the gathered results shows that using the new method we can identify the main points of strength / weakness of the different test solutions in a quantitative and deterministic manner, and pinpoint the faults escaping to each one

    Reliability in Power Electronics and Power Systems

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    L'abstract è presente nell'allegato / the abstract is in the attachmen
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