MIDAS, prototype Multivariate Interactive Digital Analysis System for large area earth resources surveys. Volume 1: System description

A third-generation, fast, low cost, multispectral recognition system (MIDAS) able to keep pace with the large quantity and high rates of data acquisition from large regions with present and projected sensots is described. The program can process a complete ERTS frame in forty seconds and provide a color map of sixteen constituent categories in a few minutes. A principle objective of the MIDAS program is to provide a system well interfaced with the human operator and thus to obtain large overall reductions in turn-around time and significant gains in throughput. The hardware and software generated in the overall program is described. The system contains a midi-computer to control the various high speed processing elements in the data path, a preprocessor to condition data, and a classifier which implements an all digital prototype multivariate Gaussian maximum likelihood or a Bayesian decision algorithm. Sufficient software was developed to perform signature extraction, control the preprocessor, compute classifier coefficients, control the classifier operation, operate the color display and printer, and diagnose operation

Experimental analysis of computer system dependability

This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

NASA Tech Briefs, August 2013

Topics covered include: Radial Internal Material Handling System (RIMS) for Circular Habitat Volumes; Conical Seat Shut-Off Valve; Impact-Actuated Digging Tool for Lunar Excavation; Flexible Mechanical Conveyors for Regolith Extraction and Transport; Remote Memory Access Protocol Target Node Intellectual Property; Soft Decision Analyzer; Distributed Prognostics and Health Management with a Wireless Network Architecture; Minimal Power Latch for Single-Slope ADCs; Bismuth Passivation Technique for High-Resolution X-Ray Detectors; High-Strength, Super-elastic Compounds; Cu-Cr-Nb-Zr Alloy for Rocket Engines and Other High-Heat- Flux Applications; Microgravity Storage Vessels and Conveying-Line Feeders for Cohesive Regolith; CRUQS: A Miniature Fine Sun Sensor for Nanosatellites; On-Chip Microfluidic Components for In Situ Analysis, Separation, and Detection of Amino Acids; Spectroscopic Determination of Trace Contaminants in High-Purity Oxygen; Method of Separating Oxygen From Spacecraft Cabin Air to Enable Extravehicular Activities; Atomic Force Microscope Mediated Chromatography; Sample Analysis at Mars Instrument Simulator; Access Control of Web- and Java-Based Applications; Tool for Automated Retrieval of Generic Event Tracks (TARGET); Bilayer Protograph Codes for Half-Duplex Relay Channels; Influence of Computational Drop Representation in LES of a Droplet-Laden Mixing Layer

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Automated biowaste sampling system improved feces collection, mass measurement and sampling

The capability of the basic automated Biowaste Sampling System (ABSS) hardware was extended and improved through the design, fabrication and test of breadboard hardware. A preliminary system design effort established the feasibility of integrating the breadboard concepts into the ABSS

ESD related soft error detection and root cause analysis

In this article, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software. After the soft errors are found, circuit modeling techniques are used to characterize the DUT. By running the circuit model, the soft error threshold can be predicted and the circuit model can be used to evaluate the performance of other ESD protection methods. In the end several methods are used to separate local soft-failures from distant errors related to noise on the power distribution network (PDN) is demonstrated. Two approaches are used, one passive and one active, which duplicate the noise on a system PDN caused by some intentional injection onto a second system where the intentional injection is not present --Abstract, page iii

A Simulator for the IBM 3705 Communications Controller

This paper describes a computer program which was developed to simulate the IBM 3705 Communications Controller, using the IBM System/360 and System/370 computers. The architecture of the 3705 is discussed in some detail, and the structure of the simulator is described. Future enhancements to the present program are suggested, along with possible applications

Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing

The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands on the abbreviated test data presented as part of Refs. (1) and (3) by including figures of Single Event Upset (SEU) cross sections as a function of beam Linear Energy Transfer (LET) when available. It also includes some of the data complied in the JPL computer in RADATA and the SPACERAD data bank. This volume encompasses bipolar and MOS (CMOS and MHNOS) device data as two broad categories for both upsets (bit-flips) and latchup. It also includes comments on less well known phenomena, such as transient upsets and permanent damage modes