Improving timing verification and delay testing methodologies for IC designs

textThe task of ensuring the correct temporal behavior of IC designs, both before and after fabrication, is extremely important. It is becoming even more imperative as the demand for performance increases and process technology advances into the deep sub-micron region. This dissertation tackles the key issues in the timing verification and delay testing methodologies. An efficient methodology is presented to identify false timing paths in the timing verification methodology which utilizes ATPG technique and timing information from an ordered list of timing paths according to the delay information. This dissertation also presents a speed binning methodology which utilizes structural delay tests successfully instead of functional tests. In addition, it establishes a methodology which quantifies the correlation between the timing verification prediction and actual silicon measurement of timing paths. This quantification methodology lays the foundation for further research to study the impact of deep submicron effects on design performanceElectrical and Computer Engineerin

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks

The current demands for autonomous driving generated momentum for an increase in research in the different technologies required for these applications. Nonetheless, the limited access to representative designs and industrial methodologies poses a challenge to the research community. Considering this scenario, there is a high demand for an open-source solution that could support development of research targeting automotive applications. This paper presents the current status of AutoSoC, an automotive SoC benchmark suite that includes hardware and software elements and is entirely open-source. The objective is to provide researchers with an industrial-grade automotive SoC that includes all essential components, is fully customizable, and enables analysis of functional safety solutions and automotive SoC configurations. This paper describes the available configurations of the benchmark including an initial assessment for ASIL B to D configurations

Fault simulation and test generation for small delay faults

Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has been developed which models delay faults caused by the combination of spot defects and parametric process variation. According to the new model, a realistic delay fault coverage metric has been developed. Traditional path delay fault coverage metrics result in unrealistically low fault coverage, and the real test quality is not reflected. The new metric uses a statistical approach and the simulation based fault coverage is consistent with silicon data. Fast simulation algorithms are also included in this dissertation. The new metric suggests that testing the K longest paths per gate (KLPG) has high detection probability for small delay faults under process variation. In this dissertation, a novel automatic test pattern generation (ATPG) methodology to find the K longest testable paths through each gate for both combinational and sequential circuits is presented. Many techniques are used to reduce search space and CPU time significantly. Experimental results show that this methodology is efficient and able to handle circuits with an exponential number of paths, such as ISCAS85 benchmark circuit c6288. The ATPG methodology has been implemented on industrial designs. Speed binning has been done on many devices and silicon data has shown significant benefit of the KLPG test, compared to several traditional delay test approaches

Embedded System Optimization of Radar Post-processing in an ARM CPU Core

Algorithms executed on the radar processor system contributes to a significant performance bottleneck of the overall radar system. One key performance concern is the latency in target detection when dealing with hard deadline systems. Research has shown software optimization as one major contributor to radar system performance improvements. This thesis aims at software optimizations using a manual and automatic approach and analyzing the results to make informed future decisions while working with an ARM processor system. In order to ascertain an optimized implementation, a question put forward was whether the algorithms on the ARM processor could work with a 6-antenna implementation without a decline in the performance. However, an answer would also help project how many additional algorithms can still be added without performance decline. The manual optimization was done based on the quantitative analysis of the software execution time. The manual optimization approach looked at the vectorization strategy using the NEON vector register on the ARM CPU to reimplement the initial Constant False Alarm Rate(CFAR) Detection algorithm. An additional optimization approach was eliminating redundant loops while going through the Range Gates and Doppler filters. In order to determine the best compiler for automatic code optimization for the radar algorithms on the ARM processor, the GCC and Clang compilers were used to compile the initial algorithms and the optimized implementation on the radar post-processing stage. Analysis of the optimization results showed that it is possible to run the radar post-processing algorithms on the ARM processor at the 6-antenna implementation without system load stress. In addition, the results show an excellent headroom margin based on the defined scenario. The result analysis further revealed that the effect of dynamic memory allocation could not be underrated in situations where performance is a significant concern. Additional statements from the result demonstrated that the GCC and Clang compiler has their strength and weaknesses when used in the compilation. One limiting factor to note on the optimization using the NEON register is the sample size’s effect on the optimization implementation. Although it fits into the test samples used based on the defined scenario, there might be varying results in varying window cell size situations that might not necessarily improve the time constraints

Social Insect-Inspired Adaptive Hardware

Modern VLSI transistor densities allow large systems to be implemented within a single chip. As technologies get smaller, fundamental limits of silicon devices are reached resulting in lower design yields and post-deployment failures. Many-core systems provide a platform for leveraging the computing resource on offer by deep sub-micron technologies and also offer high-level capabilities for mitigating the issues with small feature sizes. However, designing for many-core systems that can adapt to in-field failures and operation variability requires an extremely large multi-objective optimisation space. When a many-core reaches the size supported by the densities of modern technologies (thousands of processing cores), finding design solutions in this problem space becomes extremely difficult. Many biological systems show properties that are adaptive and scalable. This thesis proposes a self-optimising and adaptive, yet scalable, design approach for many-core based on the emergent behaviours of social-insect colonies. In these colonies there are many thousands of individuals with low intelligence who contribute, without any centralised control, to complete a wide range of tasks to build and maintain the colony. The experiments presented translate biological models of social-insect intelligence into simple embedded intelligence circuits. These circuits sense low-level system events and use this manage the parameters of the many-core's Network-on-Chip (NoC) during runtime. Centurion, a 128-node many-core, was created to investigate these models at large scale in hardware. The results show that, by monitoring a small number of signals within each NoC router, task allocation emerges from the social-insect intelligence models that can self-configure to support representative applications. It is demonstrated that emergent task allocation supports fault tolerance with no extra hardware overhead. The response-threshold decision making circuitry uses a negligible amount of hardware resources relative to the size of the many-core and is an ideal technology for implementing embedded intelligence for system runtime management of large-complexity single-chip systems

Understanding Quantum Technologies 2022

Understanding Quantum Technologies 2022 is a creative-commons ebook that provides a unique 360 degrees overview of quantum technologies from science and technology to geopolitical and societal issues. It covers quantum physics history, quantum physics 101, gate-based quantum computing, quantum computing engineering (including quantum error corrections and quantum computing energetics), quantum computing hardware (all qubit types, including quantum annealing and quantum simulation paradigms, history, science, research, implementation and vendors), quantum enabling technologies (cryogenics, control electronics, photonics, components fabs, raw materials), quantum computing algorithms, software development tools and use cases, unconventional computing (potential alternatives to quantum and classical computing), quantum telecommunications and cryptography, quantum sensing, quantum technologies around the world, quantum technologies societal impact and even quantum fake sciences. The main audience are computer science engineers, developers and IT specialists as well as quantum scientists and students who want to acquire a global view of how quantum technologies work, and particularly quantum computing. This version is an extensive update to the 2021 edition published in October 2021.Comment: 1132 pages, 920 figures, Letter forma

Optoelectronics – Devices and Applications

Optoelectronics - Devices and Applications is the second part of an edited anthology on the multifaced areas of optoelectronics by a selected group of authors including promising novices to experts in the field. Photonics and optoelectronics are making an impact multiple times as the semiconductor revolution made on the quality of our life. In telecommunication, entertainment devices, computational techniques, clean energy harvesting, medical instrumentation, materials and device characterization and scores of other areas of R&D the science of optics and electronics get coupled by fine technology advances to make incredibly large strides. The technology of light has advanced to a stage where disciplines sans boundaries are finding it indispensable. New design concepts are fast emerging and being tested and applications developed in an unimaginable pace and speed. The wide spectrum of topics related to optoelectronics and photonics presented here is sure to make this collection of essays extremely useful to students and other stake holders in the field such as researchers and device designers

College of Engineering

Cornell University Courses of Study Vol. 102 2010/201