FPGA based Novel High Speed DAQ System Design with Error Correction

Present state of the art applications in the area of high energy physics experiments (HEP), radar communication, satellite communication and bio medical instrumentation require fault resilient data acquisition (DAQ) system with the data rate in the order of Gbps. In order to keep the high speed DAQ system functional in such radiation environment where direct intervention of human is not possible, a robust and error free communication system is necessary. In this work we present an efficient DAQ design and its implementation on field programmable gate array (FPGA). The proposed DAQ system supports high speed data communication (~4.8 Gbps) and achieves multi-bit error correction capabilities. BCH code (named after Raj Bose and D. K. RayChaudhuri) has been used for multi-bit error correction. The design has been implemented on Xilinx Kintex-7 board and is tested for board to board communication as well as for board to PC using PCIe (Peripheral Component Interconnect express) interface. To the best of our knowledge, the proposed FPGA based high speed DAQ system utilizing optical link and multi-bit error resiliency can be considered first of its kind. Performance estimation of the implemented DAQ system is done based on resource utilization, critical path delay, efficiency and bit error rate (BER).Comment: ISVLSI 2015. arXiv admin note: substantial text overlap with arXiv:1505.04569, arXiv:1503.0881

Error control for reliable digital data transmission and storage systems

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. In this paper we present some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative alorithm to find the error locator polynomial. Two codes are considered: (1) a d sub min = 4 single-byte-error-correcting (SBEC), double-byte-error-detecting (DBED) RS code; and (2) a d sub min = 6 double-byte-error-correcting (DBEC), triple-byte-error-detecting (TBED) RS code

The coset weight distributions of certain BCH codes and a family of curves

We study the distribution of the number of rational points in a family of curves over a finite field of characteristic 2. This distribution determines the coset weight distribution of a certain BCH code.Comment: Plain Tex, 15 pages; some numerical data adde

Fault-tolerance techniques for hybrid CMOS/nanoarchitecture

The authors propose two fault-tolerance techniques for hybrid CMOS/nanoarchitecture implementing logic functions as look-up tables. The authors compare the efficiency of the proposed techniques with recently reported methods that use single coding schemes in tolerating high fault rates in nanoscale fabrics. Both proposed techniques are based on error correcting codes to tackle different fault rates. In the first technique, the authors implement a combined two-dimensional coding scheme using Hamming and Bose-Chaudhuri-Hocquenghem (BCH) codes to address fault rates greater than 5. In the second technique, Hamming coding is complemented with bad line exclusion technique to tolerate fault rates higher than the first proposed technique (up to 20). The authors have also estimated the improvement that can be achieved in the circuit reliability in the presence of Don-t Care Conditions. The area, latency and energy costs of the proposed techniques were also estimated in the CMOS domain