Dynamic FTSS in Asynchronous Systems: the Case of Unison

Distributed fault-tolerance can mask the effect of a limited number of permanent faults, while self-stabilization provides forward recovery after an arbitrary number of transient fault hit the system. FTSS protocols combine the best of both worlds since they are simultaneously fault-tolerant and self-stabilizing. To date, FTSS solutions either consider static (i.e. fixed point) tasks, or assume synchronous scheduling of the system components. In this paper, we present the first study of dynamic tasks in asynchronous systems, considering the unison problem as a benchmark. Unison can be seen as a local clock synchronization problem as neighbors must maintain digital clocks at most one time unit away from each other, and increment their own clock value infinitely often. We present many impossibility results for this difficult problem and propose a FTSS solution when the problem is solvable that exhibits optimal fault containment

DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

Modeling and Analysis of Fault Tolerant Multistage Interconnection Networks

Performance and reliability are two of the most crucial issues in today\u27s high-performance instrumentation and measurement systems. High speed and compact density multistage interconnection networks (MINs) are widely-used subsystems in different applications. New performance models are proposed to evaluate a novel fault tolerant MIN arrangement, thereby assuring performance and reliability with high confidence level. A concurrent fault detection and recovery scheme for MINs is considered by rerouting over redundant interconnection links under stringent real-time constraints for digital instrumentation as sensor networks. A switch architecture for concurrent testing and diagnosis is proposed. New performance models are developed and used to evaluate the compound effect of fault tolerant operation (inclusive of testing, diagnosis, and recovery) on the overall throughput and delay. Results are shown for single transient and permanent stuck-at faults on links and storage units in the switching elements. It is shown that performance degradation due to fault tolerance is graceful while performance degradation without fault recovery is unacceptable

Development of generic testing strategies for mixed-signal integrated circuits

Describes work at the Polytechnic of Huddersfield SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in these devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described

Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems

Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient-fault tolerance. While the time redundancy technique exploits the available slack time to increase the fault-tolerance by performing recovery executions, DVS exploits slack time to save energy. Therefore we believe there is a resource conflict between the time-redundancy technique and DVS. The first aim of this paper is to propose the usage of information redundancy to solve this problem. We demonstrate through analytical and experimental studies that it is possible to achieve both higher transient fault-tolerance (tolerance to single event upsets (SEU)) and less energy using a combination of information and time redundancy when compared with using time redundancy alone. The second aim of this paper is to analyze the interplay of transient-fault tolerance (SEU-tolerance) and adaptive body biasing (ABB) used to reduce static leakage energy, which has not been addressed in previous studies. We show that the same technique (i.e. the combination of time and information redundancy) is applicable to ABB-enabled systems and provides more advantages than time redundancy alone

Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

This paper presents a novel method to identify and insert redundant logic into a combinational circuit to improve its fault tolerance without having to replicate the entire circuit as is the case with conventional redundancy techniques. In this context, it is discussed how to estimate the fault masking capability of a combinational circuit using the truth-cum-fault enumeration table, and then it is shown how to identify the logic that can introduced to add redundancy into the original circuit without affecting its native functionality and with the aim of improving its fault tolerance though this would involve some trade-off in the design metrics. However, care should be taken while introducing redundant logic since redundant logic insertion may give rise to new internal nodes and faults on those may impact the fault tolerance of the resulting circuit. The combinational circuit that is considered and its redundant counterparts are all implemented in semi-custom design style using a 32/28nm CMOS digital cell library and their respective design metrics and fault tolerances are compared

Toward the assessment of the susceptibility of a digital system to lightning upset

Accomplishments and directions for further research aimed at developing methods for assessing a candidate design of an avionic computer with respect to susceptability to lightning upset are reported. Emphasis is on fault tolerant computers. Both lightning stress and shielding are covered in a review of the electromagnetic environment. Stress characterization, system characterization, upset detection, and positive and negative design features are considered. A first cut theory of comparing candidate designs is presented including tests of comparative susceptability as well as its analysis and simulation. An approach to lightning induced transient fault effects is included

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real tim

Reliable Linear, Sesquilinear and Bijective Operations On Integer Data Streams Via Numerical Entanglement

A new technique is proposed for fault-tolerant linear, sesquilinear and bijective (LSB) operations on $M$ integer data streams ($M\geq3$), such as: scaling, additions/subtractions, inner or outer vector products, permutations and convolutions. In the proposed method, the $M$ input integer data streams are linearly superimposed to form $M$ numerically-entangled integer data streams that are stored in-place of the original inputs. A series of LSB operations can then be performed directly using these entangled data streams. The results are extracted from the $M$ entangled output streams by additions and arithmetic shifts. Any soft errors affecting any single disentangled output stream are guaranteed to be detectable via a specific post-computation reliability check. In addition, when utilizing a separate processor core for each of the $M$ streams, the proposed approach can recover all outputs after any single fail-stop failure. Importantly, unlike algorithm-based fault tolerance (ABFT) methods, the number of operations required for the entanglement, extraction and validation of the results is linearly related to the number of the inputs and does not depend on the complexity of the performed LSB operations. We have validated our proposal in an Intel processor (Haswell architecture with AVX2 support) via fast Fourier transforms, circular convolutions, and matrix multiplication operations. Our analysis and experiments reveal that the proposed approach incurs between $0.03\%$ to $7\%$ reduction in processing throughput for a wide variety of LSB operations. This overhead is 5 to 1000 times smaller than that of the equivalent ABFT method that uses a checksum stream. Thus, our proposal can be used in fault-generating processor hardware or safety-critical applications, where high reliability is required without the cost of ABFT or modular redundancy.Comment: to appear in IEEE Trans. on Signal Processing, 201