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Automatic synthesis of analog layout : a survey
A review of recent research in the automatic synthesis of physical geometry for analog integrated circuits is presented. On introduction, an explanation of the difficulties involved in analog layout as opposed to digital layout is covered. Review of the literature then follows. Emphasis is placed on the exposition of general methods for addressing problems specific to analog layout, with the details of specific systems only being given when they surve to illustrate these methods well. The conclusion discusses problems remaining and offers a prediction as to how technology will evolve to solve them. It is argued that although progress has been and will continue to be made in the automation of analog IC layout, due to fundamental differences in the nature of analog IC design as opposed to digital design, it should not be expected that the level of automation of the former will reach that of the latter any time soon
Digital Offset Calibration of an OPAMP Towards Improving Static Parameters of 90 nm CMOS DAC
In this paper, an on-chip self-calibrated 8-bit R-2R digital-to-analog converter (DAC) based on digitally compensated input offset of the operational amplifier (OPAMP) is presented. To improve the overall DAC performance, a digital offset cancellation method was used to compensate deviations in the input offset voltage of the OPAMP caused by process variations. The whole DAC as well as offset compensation circuitry were designed in a standard 90 nm CMOS process. The achieved results show that after the self-calibration process, the improvement of 48% in the value of DAC offset error is achieved
Open-ended evolution to discover analogue circuits for beyond conventional applications
This is the author's accepted manuscript. The final publication is available at Springer via http://dx.doi.org/10.1007/s10710-012-9163-8. Copyright @ Springer 2012.Analogue circuits synthesised by means of open-ended evolutionary algorithms often have unconventional designs. However, these circuits are typically highly compact, and the general nature of the evolutionary search methodology allows such designs to be used in many applications. Previous work on the evolutionary design of analogue circuits has focused on circuits that lie well within analogue application domain. In contrast, our paper considers the evolution of analogue circuits that are usually synthesised in digital logic. We have developed four computational circuits, two voltage distributor circuits and a time interval metre circuit. The approach, despite its simplicity, succeeds over the design tasks owing to the employment of substructure reuse and incremental evolution. Our findings expand the range of applications that are considered suitable for evolutionary electronics
Challenging the evolutionary strategy for synthesis of analogue computational circuits
There are very few reports in the past on applications of Evolutionary Strategy (ES) towards the synthesis of analogue circuits. Moreover, even fewer reports are on the synthesis of computational circuits. Last fact is mainly due to the dif-ficulty in designing of the complex nonlinear functions that these circuits perform. In this paper, the evolving power of the ES is challenged to design four computational circuits: cube root, cubing, square root and squaring functions. The synthesis succeeded due to the usage of oscillating length genotype strategy and the substructure reuse. The approach is characterized by its simplicity and represents one of the first attempts of application of ES towards the synthesis of âQRâ circuits. The obtained experimental results significantly exceed the results published before in terms of the circuit quality, economy in components and computing resources utilized, revealing the great potential of the technique pro-posed to design large scale analog circuits
Generalized disjunction decomposition for evolvable hardware
Evolvable hardware (EHW) refers to self-reconfiguration hardware design, where the configuration is under the control of an evolutionary algorithm (EA). One of the main difficulties in using EHW to solve real-world problems is scalability, which limits the size of the circuit that may be evolved. This paper outlines a new type of decomposition strategy for EHW, the âgeneralized disjunction decompositionâ (GDD), which allows the evolution of large circuits. The proposed method has been extensively tested, not only with multipliers and parity bit problems traditionally used in the EHW community, but also with logic circuits taken from the Microelectronics Center of North Carolina (MCNC) benchmark library and randomly generated circuits. In order to achieve statistically relevant results, each analyzed logic circuit has been evolved 100 times, and the average of these results is presented and compared with other EHW techniques. This approach is necessary because of the probabilistic nature of EA; the same logic circuit may not be solved in the same way if tested several times. The proposed method has been examined in an extrinsic EHW system using theevolution strategy. The results obtained demonstrate that GDD significantly improves the evolution of logic circuits in terms of the number of generations, reduces computational time as it is able to reduce the required time for a single iteration of the EA, and enables the evolution of larger circuits never before evolved. In addition to the proposed method, a short overview of EHW systems together with the most recent applications in electrical circuit design is provided
A design for testability study on a high performance automatic gain control circuit.
A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente
Mixed-Signal Testability Analysis for Data-Converter IPs
In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC
Towards Structural Testing of Superconductor Electronics
Many of the semiconductor technologies are already\ud
facing limitations while new-generation data and\ud
telecommunication systems are implemented. Although in\ud
its infancy, superconductor electronics (SCE) is capable of\ud
handling some of these high-end tasks. We have started a\ud
defect-oriented test methodology for SCE, so that reliable\ud
systems can be implemented in this technology. In this\ud
paper, the details of the study on the Rapid Single-Flux\ud
Quantum (RSFQ) process are presented. We present\ud
common defects in the SCE processes and corresponding\ud
test methodologies to detect them. The (measurement)\ud
results prove that we are able to detect possible random\ud
defects for statistical purposes in yield analysis. This\ud
paper also presents possible test methodologies for RSFQ\ud
circuits based on defect oriented testing (DOT)
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