Towards a Theoretical Understanding of the Robustness of Variational Autoencoders

We make inroads into understanding the robustness of Variational Autoencoders (VAEs) to adversarial attacks and other input perturbations. While previous work has developed algorithmic approaches to attacking and defending VAEs, there remains a lack of formalization for what it means for a VAE to be robust. To address this, we develop a novel criterion for robustness in probabilistic models: $r$-robustness. We then use this to construct the first theoretical results for the robustness of VAEs, deriving margins in the input space for which we can provide guarantees about the resulting reconstruction. Informally, we are able to define a region within which any perturbation will produce a reconstruction that is similar to the original reconstruction. To support our analysis, we show that VAEs trained using disentangling methods not only score well under our robustness metrics, but that the reasons for this can be interpreted through our theoretical results.Comment: 8 page

Variance Loss in Variational Autoencoders

In this article, we highlight what appears to be major issue of Variational Autoencoders, evinced from an extensive experimentation with different network architectures and datasets: the variance of generated data is significantly lower than that of training data. Since generative models are usually evaluated with metrics such as the Frechet Inception Distance (FID) that compare the distributions of (features of) real versus generated images, the variance loss typically results in degraded scores. This problem is particularly relevant in a two stage setting, where we use a second VAE to sample in the latent space of the first VAE. The minor variance creates a mismatch between the actual distribution of latent variables and those generated by the second VAE, that hinders the beneficial effects of the second stage. Renormalizing the output of the second VAE towards the expected normal spherical distribution, we obtain a sudden burst in the quality of generated samples, as also testified in terms of FID.Comment: Article accepted at the Sixth International Conference on Machine Learning, Optimization, and Data Science. July 19-23, 2020 - Certosa di Pontignano, Siena, Ital