15,233 research outputs found

    Impact of parameter variations on circuits and microarchitecture

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    Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches.Peer ReviewedPostprint (published version

    Focused laser Doppler velocimeter

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    A system for remotely measuring velocities present in discrete volumes of air is described. A CO2 laser beam is focused by a telescope at such a volume, a focal volume, and within the focusable range, near field, of the telescope. The back scatter, or reflected light, principally from the focal volume, passes back through the telescope and is frequency compared with the original frequency of the laser, and the difference frequency or frequencies represent particle velocities in that focal volume

    Automatic closed circuit television arc guidance control Patent

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    Automatic closed circuit television arc guidance control for welding joint

    Solid state, CCD-buried channel, television camera study and design

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    An investigation of an all solid state television camera design, which uses a buried channel charge-coupled device (CCD) as the image sensor, was undertaken. A 380 x 488 element CCD array was utilized to ensure compatibility with 525 line transmission and display monitor equipment. Specific camera design approaches selected for study and analysis included (a) optional clocking modes for either fast (1/60 second) or normal (1/30 second) frame readout, (b) techniques for the elimination or suppression of CCD blemish effects, and (c) automatic light control and video gain control techniques to eliminate or minimize sensor overload due to bright objects in the scene. Preferred approaches were determined and integrated into a design which addresses the program requirements for a deliverable solid state TV camera

    Revisiting Underapproximate Reachability for Multipushdown Systems

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    Boolean programs with multiple recursive threads can be captured as pushdown automata with multiple stacks. This model is Turing complete, and hence, one is often interested in analyzing a restricted class that still captures useful behaviors. In this paper, we propose a new class of bounded under approximations for multi-pushdown systems, which subsumes most existing classes. We develop an efficient algorithm for solving the under-approximate reachability problem, which is based on efficient fix-point computations. We implement it in our tool BHIM and illustrate its applicability by generating a set of relevant benchmarks and examining its performance. As an additional takeaway, BHIM solves the binary reachability problem in pushdown automata. To show the versatility of our approach, we then extend our algorithm to the timed setting and provide the first implementation that can handle timed multi-pushdown automata with closed guards.Comment: 52 pages, Conference TACAS 202

    Development of an image converter of radical design

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    A long term investigation of thin film sensors, monolithic photo-field effect transistors, and epitaxially diffused phototransistors and photodiodes to meet requirements to produce acceptable all solid state, electronically scanned imaging system, led to the production of an advanced engineering model camera which employs a 200,000 element phototransistor array (organized in a matrix of 400 rows by 500 columns) to secure resolution comparable to commercial television. The full investigation is described for the period July 1962 through July 1972, and covers the following broad topics in detail: (1) sensor monoliths; (2) fabrication technology; (3) functional theory; (4) system methodology; and (5) deployment profile. A summary of the work and conclusions are given, along with extensive schematic diagrams of the final solid state imaging system product
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