Thermal-Safe Test Scheduling for Core-Based System-on-a-Chip Integrated Circuits

Overheating has been acknowledged as a major problem during the testing of complex system-on-chip (SOC) integrated circuits. Several power-constrained test scheduling solutions have been recently proposed to tackle this problem during system integration. However, we show that these approaches cannot guarantee hot-spot-free test schedules because they do not take into account the non-uniform distribution of heat dissipation across the die and the physical adjacency of simultaneously active cores. This paper proposes a new test scheduling approach that is able to produce short test schedules and guarantee thermal-safety at the same time. Two thermal-safe test scheduling algorithms are proposed. The first algorithm computes an exact (shortest) test schedule that is guaranteed to satisfy a given maximum temperature constraint. The second algorithm is a heuristic intended for complex systems with a large number of embedded cores, for which the exact thermal-safe test scheduling algorithm may not be feasible. Based on a low-complexity test session thermal cost model, this algorithm produces near-optimal length test schedules with significantly less computational effort compared to the optimal algorithm

Test Scheduling of SoC by using Dynamic Voltage Frequency Scaling (DVFS) Technique

High temperature gradients in System on Chip (SoC) lowered the performances, reliability and leakage power. In addition, temperature during testing gain more compared to normal operation. Therefore, the investigation of the impact dynamic voltage frequency scaling (DVFS) on the thermal aware test scheduling performance will be the main contribution of this work. The test scheduling algorithm which embeds frequency scaling effect with dynamic voltage supply is tested on ITC’02 benchmark. The formulation of ILP is to minimize the group of the test session in SoC and continued with DVFS formulation. Compared to the conventional thermal-aware scheduling approach based purely on a frequency scaling, this technique provides shorter overall test times and greatly improved flexibility to satisfy strict thermal constraints. The proposed DVFS with thermal aware task scheduling allows to minimize test time more than 46%

Thermal aware task assignment for multicore processors using genetic algorithm

Microprocessor power and thermal density are increasing exponentially. The reliability of the processor declined, cooling costs rose, and the processor's lifespan was shortened due to an overheated processor and poor thermal management like thermally unbalanced processors. Thus, the thermal management and balancing of multi-core processors are extremely crucial. This work mostly focuses on a compact temperature model of multicore processors. In this paper, a novel task assignment is proposed using a genetic algorithm to maintain the thermal balance of the cores, by considering the energy expended by each task that the core performs. And expecting the cores’ temperature using the hotspot simulator. The algorithm assigns tasks to the processors depending on the task parameters and current cores’ temperature in such a way that none of the tasks’ deadlines are lost for the earliest deadline first (EDF) scheduling algorithm. The mathematical model was derived, and the simulation results showed that the highest temperature difference between the cores is 8 °C for approximately 14 seconds of simulation. These results validate the effectiveness of the proposed algorithm in managing the hotspot and reducing both temperature and energy consumption in multicore processors

Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC

[[abstract]]Testing is regarded as one of the most difficult challenges for three-dimensional integrated circuits (3D ICs). In this paper, we want to optimize the cost of TAM (test access mechanism) and the test time for 3D IC. We used both greedy and simulated annealing algorithms to solve this optimization problem. We compare the results of two assumptions: soft-die mode and hard-die mode. The former assumes that the DfT of dies cannot be changed, while the latter assumes that the DfT of dies can be adjusted. The results show that thermal-aware cooptimization is essential to decide the optimal TAM and test schedule. Blindly adding TAM cannot reduce the total test cost due to temperature constraints. Another conclusion is that soft-die mode is more effective than hard-die mode to reduce the total test cost for 3D IC.[[notice]]補正完畢[[booktype]]電子

Enhancing Power Efficient Design Techniques in Deep Submicron Era

Excessive power dissipation has been one of the major bottlenecks for design and manufacture in the past couple of decades. Power efficient design has become more and more challenging when technology scales down to the deep submicron era that features the dominance of leakage, the manufacture variation, the on-chip temperature variation and higher reliability requirements, among others. Most of the computer aided design (CAD) tools and algorithms currently used in industry were developed in the pre deep submicron era and did not consider the new features explicitly and adequately. Recent research advances in deep submicron design, such as the mechanisms of leakage, the source and characterization of manufacture variation, the cause and models of on-chip temperature variation, provide us the opportunity to incorporate these important issues in power efficient design. We explore this opportunity in this dissertation by demonstrating that significant power reduction can be achieved with only minor modification to the existing CAD tools and algorithms. First, we consider peak current, which has become critical for circuit's reliability in deep submicron design. Traditional low power design techniques focus on the reduction of average power. We propose to reduce peak current while keeping the overhead on average power as small as possible. Second, dual Vt technique and gate sizing have been used simultaneously for leakage savings. However, this approach becomes less effective in deep submicron design. We propose to use the newly developed process-induced mechanical stress to enhance its performance. Finally, in deep submicron design, the impact of on-chip temperature variation on leakage and performance becomes more and more significant. We propose a temperature-aware dual Vt approach to alleviate hot spots and achieve further leakage reduction. We also consider this leakage-temperature dependency in the dynamic voltage scaling approach and discover that a commonly accepted result is incorrect for the current technology. We conduct extensive experiments with popular design benchmarks, using the latest industry CAD tools and design libraries. The results show that our proposed enhancements are promising in power saving and are practical to solve the low power design challenges in deep submicron era

On thermal sensor calibration and software techniques for many-core thermal management

The high power density of a many-core processor results in increased temperature which negatively impacts system reliability and performance. Dynamic thermal management applies thermal-aware techniques at run time to avoid overheating using temperature information collected from on-chip thermal sensors. Temperature sensing and thermal control schemes are two critical technologies for successfully maintaining thermal safety. In this dissertation, on-line thermal sensor calibration schemes are developed to provide accurate temperature information. Software-based dynamic thermal management techniques are proposed using calibrated thermal sensors. Due to process variation and silicon aging, on-chip thermal sensors require periodic calibration before use in DTM. However, the calibration cost for thermal sensors can be prohibitively high as the number of on-chip sensors increases. Linear models which are suitable for on-line calculation are employed to estimate temperatures at multiple sensor locations using performance counters. The estimated temperature and the actual sensor thermal profile show a very high similarity with correlation coefficient ~0.9 for SPLASH2 and SPEC2000 benchmarks. A calibration approach is proposed to combine potentially inaccurate temperature values obtained from two sources: thermal sensor readings and temperature estimations. A data fusion strategy based on Bayesian inference, which combines information from these two sources, is demonstrated. The result shows the strategy can effectively recalibrate sensor readings in response to inaccuracies caused by process variation and environmental noise. The average absolute error of the corrected sensor temperature readings is A dynamic task allocation strategy is proposed to address localized overheating in many-core systems. Our approach employs reinforcement learning, a dynamic machine learning algorithm that performs task allocation based on current temperatures and a prediction regarding which assignment will minimize the peak temperature. Our results show that the proposed technique is fast (scheduling performed in \u3c1 \u3ems) and can efficiently reduce peak temperature by up to 8 degree C in a 49-core processor (6% on average) versus a leading competing task allocation approach for a series of SPLASH-2 benchmarks. Reinforcement learning has also been applied to 3D integrated circuits to allocate tasks with thermal awareness