Reliability of CGA/LGA/HDI Package Board/Assembly (Final Report)

Package manufacturers are now offering commercial-off-the-shelf column grid array (COTS CGA) packaging technologies in high-reliability versions. Understanding the process and quality assurance (QA) indicators for reliability are important for low-risk insertion of these advanced electronics packages. The previous reports, released in January of 2012 and January of 2013, presented package test data, assembly information, and reliability evaluation by thermal cycling for CGA packages with 1752, 1517, 1509, and 1272 inputs/outputs (I/Os) and 1-mm pitch. It presented the thermal cycling (-55C either 100C or 125C) test results for up to 200 cycles. This report presents up to 500 thermal cycles with quality assurance and failure analysis evaluation represented by optical photomicrographs, 2D real time X-ray images, dye-and-pry photomicrographs, and optical/scanning electron Microscopy (SEM) cross-sectional images. The report also presents assembly challenge using reflowing by either vapor phase or rework station of CGA and land grid array (LGA) versions of three high I/O packages both ceramic and plastic configuration. A new test vehicle was designed having high density interconnect (HDI) printed circuit board (PCB) with microvia-in-pad to accommodate both LGA packages as well as a large number of fine pitch ball grid arrays (BGAs). The LGAs either were assembled onto HDI PCB as an LGA or were solder paste print and reflow first to form solder dome on pads before assembly. Both plastic BGAs with 1156 I/O and ceramic LGAs were assembled. It also presented the X-ray inspection results as well as failures due to 200 thermal cycles. Lessons learned on assembly of ceramic LGAs are also presented

Modeling Solder Ball Array Interconnects for Power Module Optimization

PowerSynth is a software platform that can co-optimize power modules utilizing a 2D topology and wire bond interconnects. The novel 3D architectures being proposed at the University of Arkansas utilize solder ball interconnects instead of wire bonds. Therefore, they currently cannot be optimized using PowerSynth. This paper examines methods to accurately model the parasitic inductance of solder balls and ball grid arrays so they may be implemented into software for optimization. Proposed mathematical models are validated against ANSYS Electromagnetics Suite simulations. A comparison of the simulated data shows that mathematical models are well suited for implementation into optimization software platforms. Experimental measurements proved to be inconclusive and necessitate future work

A THERMOMECHANICAL FATIGUE LIFE PREDICTION METHODOLOGY FOR BALL GRID ARRAY COMPONENTS WITH REWORKABLE UNDERFILL

Underfill materials were originally developed to improve the thermo-mechanical reliability of flip-chip devices due to the large coefficient of thermal expansion (CTE) mismatch between the silicon die and substrate. More recently, underfill materials, specifically reworkable underfills, have been used to improve reliability of second level interconnects in ball grid array (BGA) packages in harsh end-use environments such as automotive, military and aerospace. In these environments, electronic components are exposed to mechanical shock, vibration, and large fluctuations in temperatures. Although reworkable underfills improve the reliability of BGA components under mechanical shock and vibration, some reworkable underfills have been shown to reduce reliability during thermal cycling environments. Consequently, this research employs experimental and numerical approaches to investigate the impact of reworkable underfill materials on thermomechanical fatigue life of solder joints in BGA packages. In the first section of the analysis, material characterization of a reworkable underfill is performed to determine appropriate material models for reworkable underfills. In the second analysis section, a variety of underfill materials with different properties are exposed to harsh and benign thermal cycles to determine the stress state responsible for reducing fatigue life of solder joints in BGA packages. In the final analysis section, simulations are performed on the BGAs with reworkable underfill to develop a fatigue life predication methodology that implements a modified mode separation scheme. The model developed in this work provides a working fatigue life approach for BGA packages with reworkable underfills exposed to thermal loading. The results of this study can be utilized by the automotive, military, and aerospace industries to optimize underfill material selection process and provide reliability assessment of BGA components in real world environments

Thermal Investigations Of Flip Chip Microelectronic Package With Non-Uniform Power Distribution [TK7874. G614 2004 f rb] [Microfiche 7607].

Arah aliran pempakejan sistem-sistem dan subsistem mikroelektronik adalah kearah pengurangan saiz dan peningkatan prestasi, di mana kedua-duanya menyumbang kepada peningkatan kadar penjanaan haba. The trend in packaging microelectronic systems and subsystems has been to reduce size and increase performance, both of which contribute to increase heat generation

TEMPERATURE CYCLING RELIABILITY OF REBALLED AND REWORKED BALL GRID ARRAY PACKAGES IN SNPB AND SAC ASSEMBLY

In recent years, many countries banned the use of lead in select high volume electronic equipment. However, exemptions from lead-free legislation have been granted for certain products, especially those intended for high-reliability applications. Manufacturers with exemption are facing dwindling supply of lead-based components for their products. This change has left many high-reliability electronic equipment manufacturers with the choices of, mixing lead-free components in tin-lead assembly process, converting products to lead-free, or reprocessing lead-free components to comply with the tin-lead assembly process. Reballing has been used for component reclamation, but right now it offers a way to reprocess the ball grid array packages. The reliability of reballed BGA assembly needs to be determined before the implementation. Mixing lead-free ball grid array packages with eutectic tin-lead solder paste bring new challenges to the current electronic industry. The mixed assemblies with long-term reliability need to be investigated. Although rework has been implemented for decades, the impact of multiple rework process on the reliability of lead-free and mixed assemblies is still unknown. Lead-free ball grid array packages with Sn3.0Ag0.5Cu solder balls were subjected to the reballing process. Ball shear test and cold bump pull test were used to investigate the solder ball attachment strength of the reballed BGAs. Temperature cycling test was used to evaluate the temperature cycling reliability of reballed tin-lead, lead-free and mixed assemblies. The solder ball strength and the temperature cycling reliability of reballed components were independent of the reballing method. The temperature cycling reliability of mixed assemblies was equivalent to that of lead-free assemblies. Microstructure differences in lead-free, mixed and reballed tin-lead assemblies were investigated to explain the temperature cycling reliability results. Lead-free and mixed assemblies were subjected to the rework process. Temperature cycling test was used to evaluate the temperature cycling reliability of reworked assemblies. Cu over-consumption, Cu pad dissolution and thick interfacial intermetallic layer were found in the reworked assemblies. Microstructural investigation and geometry analysis were used to analyze the temperature cycling reliability degradation in the reworked assemblies after multiples rework processes

Enabling More than Moore: Accelerated Reliability Testing and Risk Analysis for Advanced Electronics Packaging

For five decades, the semiconductor industry has distinguished itself by the rapid pace of improvement in miniaturization of electronics products-Moore's Law. Now, scaling hits a brick wall, a paradigm shift. The industry roadmaps recognized the scaling limitation and project that packaging technologies will meet further miniaturization needs or ak.a "More than Moore". This paper presents packaging technology trends and accelerated reliability testing methods currently being practiced. Then, it presents industry status on key advanced electronic packages, factors affecting accelerated solder joint reliability of area array packages, and IPC/JEDEC/Mil specifications for characterizations of assemblies under accelerated thermal and mechanical loading. Finally, it presents an examples demonstrating how Accelerated Testing and Analysis have been effectively employed in the development of complex spacecraft thereby reducing risk. Quantitative assessments necessarily involve the mathematics of probability and statistics. In addition, accelerated tests need to be designed which consider the desired risk posture and schedule for particular project. Such assessments relieve risks without imposing additional costs. and constraints that are not value added for a particular mission. Furthermore, in the course of development of complex systems, variances and defects will inevitably present themselves and require a decision concerning their disposition, necessitating quantitative assessments. In summary, this paper presents a comprehensive view point, from technology to systems, including the benefits and impact of accelerated testing in offsetting risk

Influence of Underfill on Ball Grid Array (BGA) Package Fatigue Life

The influence of underfill material properties on the fatigue life of Ball Grid Array (BGA) packages that are subjected to thermal cycling is investigated in this study. A finite element model is created using Ansys by assuming the existence of an infinite array of solder interconnects, cylindrical in shape, surrounded by underfill material. Axial stresses in the interconnects are determined as a temperature loading is applied. The results show that these normal stresses are on the same order of magnitude as the hydrostatic compressive stresses induced in the solder upon underfill curing. Therefore it is concluded that for the range of underfill properties tested, these Mode I cyclic stresses need to be considered in the development of a fracture-based fatigue life model. In addition, a guideline is provided to aide researchers in designing experiments that will replicate loads on fractured specimens that are consistent with those seen in aerospace applications

Thermal And Mechanical Analysis of High-power Light-emitting Diodes with Ceramic Packages

In this paper we present the thermal and mechanical analysis of high-power light-emitting diodes (LEDs) with ceramic packages. Transient thermal measurements and thermo-mechanical simulation were performed to study the thermal and mechanical characteristics of ceramic packages. Thermal resistance from the junction to the ambient was decreased from 76.1 oC/W to 45.3 oC/W by replacing plastic mould to ceramic mould for LED packages. Higher level of thermo-mechanical stresses in the chip were found for LEDs with ceramic packages despite of less mismatching coefficients of thermal expansion comparing with plastic packages. The results suggest that the thermal performance of LEDs can be improved by using ceramic packages, but the mounting process of the high power LEDs with ceramic packages is critically important and should be in charge of delaminating interface layers in the packages.Comment: Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions