404 research outputs found
Efficient protection of the pipeline core for safety-critical processor-based systems
The increasing number of safety-critical commercial
applications has generated a need for components with high
levels of reliability. As CMOS process sizes continue to shrink,
the reliability of ICs is negatively affected since they become
more sensitive to transient faults. New circuit designs must take
this fact into consideration, and incorporate adequate protection
against the effects of transient faults. This paper presents a
novel method for protecting the pipelined execution unit of an
embedded processor. It is based on a self-configured architecture
with hybrid redundancy that can mask single and multiple
errors, which can occur on storage elements due to transient
or permanent faults. This concept can be easily applied to any
processing architecture of this nature with a high safety integrity
level. Results from error-injection experiments are also reported
that show that this design can maintain a non-interrupted and
failure-free operation under single and double errors with a
probability that exceeds 99.4%
SafeDE: A low-cost hardware solution to enforce diverse redundancy in multicores
Failure risk must be tiny in high-integrity systems, such as those in cars, satellites and aircraft. Hence, safety measures must be deployed to avoid a single fault leading to a failure. Redundancy has been often used to address this concern, but it has been proven insufficient if a single fault can cause the same error in all redundant elements, which defeats the purpose of redundancy for error detection. Hence, to avoid this scenario, diversity is implemented along with redundancy, being lockstep execution the most popular diverse redundancy solution for computing cores. However, classic lockstep solutions have non-negligible limitations if implemented in hardware (e.g., half of the cores can only be used for redundant execution and are not even visible at user level), or in software (e.g., the software loop to enforce staggering is long and costs performance). This paper tackles the limitations of classic lockstep solutions by providing an extended analysis and evaluation of SafeDE, a Diversity Enforcement hardware module combining the short loop to enforce diversity of hardware solutions, and the nonintrusiveness of software solutions. Hence, cores can operate in lockstep mode efficiently or run independent tasks. In this paper, we present SafeDE and its rationale, its application to N-modular systems, its hardware and software integration, and an evaluation showing its performance and area efficiency, and its behavior in the presence of faults.This work was supported in part by the European Union’s Horizon 2020 Research and Innovation Programme under Grant 871467, and in part by the Spanish Ministry of Science and Innovation under Grant PID2019-107255GB-C21/AEI/10.13039/501100011033.Peer ReviewedPostprint (author's final draft
X-Rel: Energy-Efficient and Low-Overhead Approximate Reliability Framework for Error-Tolerant Applications Deployed in Critical Systems
Triple Modular Redundancy (TMR) is one of the most common techniques in
fault-tolerant systems, in which the output is determined by a majority voter.
However, the design diversity of replicated modules and/or soft errors that are
more likely to happen in the nanoscale era may affect the majority voting
scheme. Besides, the significant overheads of the TMR scheme may limit its
usage in energy consumption and area-constrained critical systems. However, for
most inherently error-resilient applications such as image processing and
vision deployed in critical systems (like autonomous vehicles and robotics),
achieving a given level of reliability has more priority than precise results.
Therefore, these applications can benefit from the approximate computing
paradigm to achieve higher energy efficiency and a lower area. This paper
proposes an energy-efficient approximate reliability (X-Rel) framework to
overcome the aforementioned challenges of the TMR systems and get the full
potential of approximate computing without sacrificing the desired reliability
constraint and output quality. The X-Rel framework relies on relaxing the
precision of the voter based on a systematical error bounding method that
leverages user-defined quality and reliability constraints. Afterward, the size
of the achieved voter is used to approximate the TMR modules such that the
overall area and energy consumption are minimized. The effectiveness of
employing the proposed X-Rel technique in a TMR structure, for different
quality constraints as well as with various reliability bounds are evaluated in
a 15-nm FinFET technology. The results of the X-Rel voter show delay, area, and
energy consumption reductions of up to 86%, 87%, and 98%, respectively, when
compared to those of the state-of-the-art approximate TMR voters.Comment: This paper has been published in IEEE Transactions on Very Large
Scale Integration (VLSI) System
C-MOS array design techniques: SUMC multiprocessor system study
The current capabilities of LSI techniques for speed and reliability, plus the possibilities of assembling large configurations of LSI logic and storage elements, have demanded the study of multiprocessors and multiprocessing techniques, problems, and potentialities. Evaluated are three previous systems studies for a space ultrareliable modular computer multiprocessing system, and a new multiprocessing system is proposed that is flexibly configured with up to four central processors, four 1/0 processors, and 16 main memory units, plus auxiliary memory and peripheral devices. This multiprocessor system features a multilevel interrupt, qualified S/360 compatibility for ground-based generation of programs, virtual memory management of a storage hierarchy through 1/0 processors, and multiport access to multiple and shared memory units
Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture
Desde el punto de vista de seguridad, la certificación aeronáutica de
aplicaciones críticas de vuelo requiere diferentes técnicas que son usadas
para prevenir fallos en los equipos electrónicos. Los fallos de tipo hardware
debido a la radiación solar que existe a las alturas standard de vuelo, como
SEU (Single Event Upset) y MCU (Multiple Bit Upset), provocan un cambio
de estado de los bits que soportan la información almacenada en memoria.
Estos fallos se producen, por ejemplo, en la memoria de configuración de
una FPGA, que es donde se definen todas las funcionalidades. Las técnicas
de protección requieren normalmente de redundancias que incrementan el
coste, número de componentes, tamaño de la memoria y peso.
En la fase de desarrollo de aplicaciones críticas de vuelo, generalmente
se utilizan una serie de estándares o recomendaciones de diseño como
ABD100, RTCA DO-160, IEC62395, etc, y diferentes técnicas de protección
para evitar fallos del tipo SEU o MCU. Estas técnicas están basadas en
procesos tecnológicos específicos como memorias robustas, codificaciones
para detección y corrección de errores (EDAC), redundancias software,
redundancia modular triple (TMR) o soluciones a nivel sistema.
Esta tesis está enfocada a minimizar e incluso suprimir los efectos de los
SEUs y MCUs que particularmente ocurren en la electrónica de avión como
consecuencia de la exposición a radiación de partículas no cargadas (como
son los neutrones) que se encuentra potenciada a las típicas alturas de
vuelo. La criticidad en vuelo que tienen determinados sistemas obligan a que
dichos sistemas sean tolerantes a fallos, es decir, que garanticen un
correcto funcionamiento aún cuando se produzca un fallo en ellos. Es por
ello que soluciones como las presentadas en esta tesis tienen interés en el
sector industrial.
La Tesis incluye una descripción inicial de la física de la radiación
incidente sobre aeronaves, y el análisis de sus efectos en los componentes
electrónicos aeronaúticos basados en semiconductor, que desembocan en
la generación de SEUs y MCUs. Este análisis permite dimensionar
adecuadamente y optimizar los procedimientos de corrección que se
propongan posteriormente.
La Tesis propone un sistema de corrección de fallos SEUs y MCUs que
permita cumplir la condición de Sistema Tolerante a Fallos, a la vez que
minimiza los niveles de redundancia y de complejidad de los códigos de
corrección. El nivel de redundancia es minimizado con la introducción del
concepto propuesto HSB (Hardwired Seed Bits), en la que se reduce la
información esencial a unos pocos bits semilla, neutros frente a radiación.
Los códigos de corrección requeridos se reducen a la corrección de un único
error, gracias al uso del concepto de Distancia Virtual entre Bits, a partir del
cual será posible corregir múltiples errores simultáneos (MCUs) a partir de
códigos simples de corrección.
Un ejemplo de aplicación de la Tesis es la implementación de una
Protección Tolerante a Fallos sobre la memoria SRAM de una FPGA. Esto
significa que queda protegida no sólo la información contenida en la
memoria sino que también queda auto-protegida la función de protección
misma almacenada en la propia SRAM. De esta forma, el sistema es capaz
de auto-regenerarse ante un SEU o incluso un MCU, independientemente
de la zona de la SRAM sobre la que impacte la radiación. Adicionalmente,
esto se consigue con códigos simples tales como corrección por bit de
paridad y Hamming, minimizando la dedicación de recursos de computación
hacia tareas de supervisión del sistema.For airborne safety critical applications certification, different techniques
are implemented to prevent failures in electronic equipments. The HW
failures at flying heights of aircrafts related to solar radiation such as SEU
(Single-Event-Upset) and MCU (Multiple Bit Upset), causes bits alterations
that corrupt the information at memories. These HW failures cause errors, for
example, in the Configuration-Code of an FPGA that defines the
functionalities. The protection techniques require classically redundant
functionalities that increases the cost, components, memory space and
weight.
During the development phase for airborne safety critical applications,
different aerospace standards are generally recommended as ABD100,
RTCA-DO160, IEC62395, etc, and different techniques are classically used
to avoid failures such as SEU or MCU. These techniques are based on
specific technology processes, Hardened memories, error detection and
correction codes (EDAC), SW redundancy, Triple Modular Redundancy
(TMR) or System level solutions.
This Thesis is focussed to minimize, and even to remove, the effects of
SEUs and MCUs, that particularly occurs in the airborne electronics as a
consequence of its exposition to solar radiation of non-charged particles (for
example the neutrons). These non-charged particles are even powered at
flying altitudes due to aircraft volume. The safety categorization of different
equipments/functionalities requires a design based on fault-tolerant approach
that means, the system will continue its normal operation even if a failure
occurs. The solution proposed in this Thesis is relevant for the industrial
sector because of its Fault-tolerant capability.
Thesis includes an initial description for the physics of the solar radiation
that affects into aircrafts, and also the analyses of their effects into the
airborne electronics based on semiconductor components that create the
SEUs and MCUs. This detailed analysis allows the correct sizing and also
the optimization of the procedures used to correct the errors.
This Thesis proposes a system that corrects the SEUs and MCUs
allowing the fulfilment of the Fault-Tolerant requirement, reducing the
redundancy resources and also the complexity of the correction codes. The
redundancy resources are minimized thanks to the introduction of the
concept of HSB (Hardwired Seed Bits), in which the essential information is
reduced to a few seed bits, neutral to radiation. The correction codes
required are reduced to the correction of one error thanks to the use of the
concept of interleaving distance between adjacent bits, this allows the
simultaneous multiple error correction with simple single error correcting
codes.
An example of the application of this Thesis is the implementation of the
Fault-tolerant architecture of an SRAM-based FPGA. That means that the
information saved in the memory is protected but also the correction
functionality is auto protected as well, also saved into SRAM memory. In this
way, the system is able to self-regenerate the information lost in case of
SEUs or MCUs. This is independent of the SRAM area affected by the
radiation. Furthermore, this performance is achieved by means simple error
correcting codes, as parity bits or Hamming, that minimize the use of
computational resources to this supervision tasks for system.Programa Oficial de Doctorado en Ingeniería Eléctrica, Electrónica y AutomáticaPresidente: Luis Alfonso Entrena Arrontes.- Secretario: Pedro Reviriego Vasallo.- Vocal: Mª Luisa López Vallej
Design and Validation for FPGA Trust under Hardware Trojan Attacks
Field programmable gate arrays (FPGAs) are being increasingly used in a wide range of critical applications, including industrial, automotive, medical, and military systems. Since FPGA vendors are typically fabless, it is more economical to outsource device production to off-shore facilities. This introduces many opportunities for the insertion of malicious alterations of FPGA devices in the foundry, referred to as hardware Trojan attacks, that can cause logical and physical malfunctions during field operation. The vulnerability of these devices to hardware attacks raises serious security concerns regarding hardware and design assurance. In this paper, we present a taxonomy of FPGA-specific hardware Trojan attacks based on activation and payload characteristics along with Trojan models that can be inserted by an attacker. We also present an efficient Trojan detection method for FPGA based on a combined approach of logic-testing and side-channel analysis. Finally, we propose a novel design approach, referred to as Adapted Triple Modular Redundancy (ATMR), to reliably protect against Trojan circuits of varying forms in FPGA devices. We compare ATMR with the conventional TMR approach. The results demonstrate the advantages of ATMR over TMR with respect to power overhead, while maintaining the same or higher level of security and performances as TMR. Further improvement in overhead associated with ATMR is achieved by exploiting reconfiguration and time-sharing of resources
Resilience of an embedded architecture using hardware redundancy
In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound.
Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures.
In this work we study the concepts of fault tolerance and dependability and
extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators
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