32 research outputs found

    Time-to-digital converters and histogram builders in SPAD arrays for pulsed-LiDAR

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    Light Detection and Ranging (LiDAR) is a 3D imaging technique widely used in many applications such as augmented reality, automotive, machine vision, spacecraft navigation and landing. Pulsed-LiDAR is one of the most diffused LiDAR techniques which relies on the measurement of the round-trip travel time of an optical pulse back-scattered from a distant target. Besides the light source and the detector, Time-to-Digital Converters (TDCs) are fundamental components in pulsed-LiDAR systems, since they allow to measure the back-scattered photon arrival times and their performance directly impact on LiDAR system requirements (i.e., range, precision, and measurements rate). In this work, we present a review of recent TDC architectures suitable to be integrated in SPAD-based CMOS arrays and a review of data processing solutions to derive the TOF information. Furthermore, main TDC parameters and processing techniques are described and analyzed considering pulsed-LiDAR requirements

    The Efficient Design of Time-to-Digital Converters

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    Noise shaping techniques for analog and time to digital converters using voltage controlled oscillators

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    Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.Includes bibliographical references (p. 175-181).Advanced CMOS processes offer very fast switching speed and high transistor density that can be utilized to implement analog signal processing functions in interesting and unconventional ways, for example by leveraging time as a signal domain. In this context, voltage controlled ring oscillators are circuit elements that are not only very attractive due to their highly digital implementation which takes advantage of scaling, but also due to their ability to amplify or integrate conventional voltage signals into the time domain. In this work, we take advantage of voltage controlled oscillators to implement analog- and time-to-digital converters with first-order quantization and mismatch noise-shaping. To implement a time-to-digital converter (TDC) with noise-shaping, we present a oscillator that is enabled during the measurement of an input, and then disabled in between measurements. By holding the state of the oscillator in between samples, the quantization error is saved and transferred to the following sample, which can be seen as first-order noise-shaping in the frequency domain. In order to achieve good noise shaping performance, we also present key details of a multi-path oscillator topology that is able to reduce the effective delay per stage by a factor of 5 and accurately preserve the quantization error from measurement to measurement. An 11-bit, 50Msps prototype time-to-digital converter (TDC) using a multi-path gated ring oscillator with 6ps of delay per stage demonstrates over 20dB of ist-order noise shaping. At frequencies below 1MHz, the TDC error integrates to 80fsrms for a dynamic range of 95dB with no calibration of differential non-linearity required. The 157x258pm TDC is realized in 0.13ipm CMOS and operates from a 1.5V supply.(cont.) The use of VCO-based quantization within continuous-time (CT) [Epsilon] [Delta] ADC structures is also explored, with a custom prototype in 0.13pm CMOS showing measured performance of 86/72dB SNR/SNDR with 10MHz bandwidth while consuming 40mW from a 1.2V supply and occupying an active area of 640pm X 660pm. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which we show achieves first-order noise-shaping of its quantization noise. The quantizer structure allows the second order CT Epsilon] [Delta] ADC topology to achieve third order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching (DEM) of the DAC elements.by Matthew A. Z. Straayer.Ph.D

    Characterization of Interconnection Delays in FPGAS Due to Single Event Upsets and Mitigation

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    RÉSUMÉ L’utilisation incessante de composants électroniques à géométrie toujours plus faible a engendré de nouveaux défis au fil des ans. Par exemple, des semi-conducteurs à mémoire et à microprocesseur plus avancés sont utilisés dans les systèmes avioniques qui présentent une susceptibilité importante aux phénomènes de rayonnement cosmique. L'une des principales implications des rayons cosmiques, observée principalement dans les satellites en orbite, est l'effet d'événements singuliers (SEE). Le rayonnement atmosphérique suscite plusieurs préoccupations concernant la sécurité et la fiabilité de l'équipement avionique, en particulier pour les systèmes qui impliquent des réseaux de portes programmables (FPGA). Les FPGA à base de cellules de mémoire statique (SRAM) présentent une solution attrayante pour mettre en oeuvre des systèmes complexes dans le domaine de l’avionique. Les expériences de rayonnement réalisées sur les FPGA ont dévoilé la vulnérabilité de ces dispositifs contre un type particulier de SEE, à savoir, les événements singuliers de changement d’état (SEU). Un SEU est considérée comme le changement de l'état d'un élément bistable (c'est-à-dire, un bit-flip) dû à l'effet d'un ion, d'un proton ou d’un neutron énergétique. Cet effet est non destructif et peut être corrigé en réécrivant la partie de la SRAM affectée. Les changements de délai (DC) potentiels dus aux SEU affectant la mémoire de configuration de routage ont été récemment confirmés. Un des objectifs de cette thèse consiste à caractériser plus précisément les DC dans les FPGA causés par les SEU. Les DC observés expérimentalement sont présentés et la modélisation au niveau circuit de ces DC est proposée. Les circuits impliqués dans la propagation du délai sont validés en effectuant une modélisation précise des blocs internes à l'intérieur du FPGA et en exécutant des simulations. Les résultats montrent l’origine des DC qui sont en accord avec les mesures expérimentales de délais. Les modèles proposés au niveau circuit sont, aux meilleures de notre connaissance, le premier travail qui confirme et explique les délais combinatoires dans les FPGA. La conception d'un circuit moniteur de délai pour la détection des DC a été faite dans la deuxième partie de cette thèse. Ce moniteur permet de détecter un changement de délai sur les sections critiques du circuit et de prévenir les pannes de synchronisation engendrées par les SEU sans utiliser la redondance modulaire triple (TMR).----------ABSTRACT The unrelenting demand for electronic components with ever diminishing feature size have emerged new challenges over the years. Among them, more advanced memory and microprocessor semiconductors are being used in avionic systems that exhibit a substantial susceptibility to cosmic radiation phenomena. One of the main implications of cosmic rays, which was primarily observed in orbiting satellites, is single-event effect (SEE). Atmospheric radiation causes several concerns regarding the safety and reliability of avionics equipment, particularly for systems that involve field programmable gate arrays (FPGA). SRAM-based FPGAs, as an attractive solution to implement systems in aeronautic sector, are very susceptible to SEEs in particular Single Event Upset (SEU). An SEU is considered as the change of the state of a bistable element (i.e., bit-flip) due to the effect of an energetic ion or proton. This effect is non-destructive and may be fixed by rewriting the affected part. Sensitivity evaluation of SRAM-based FPGAs to a physical impact such as potential delay changes (DC) has not been addressed thus far in the literature. DCs induced by SEU can affect the functionality of the logic circuits by disturbing the race condition on critical paths. The objective of this thesis is toward the characterization of DCs in SRAM-based FPGAs due to transient ionizing radiation. The DCs observed experimentally are presented and the circuit-level modeling of those DCs is proposed. Circuits involved in delay propagation are reverse-engineered by performing precise modeling of internal blocks inside the FPGA and executing simulations. The results show the root cause of DCs that are in good agreement with experimental delay measurements. The proposed circuit level models are, to the best of our knowledge, the first work on modeling of combinational delays in FPGAs.In addition, the design of a delay monitor circuit for DC detection is investigated in the second part of this thesis. This monitor allowed to show experimentally cumulative DCs on interconnects in FPGA. To this end, by avoiding the use of triple modular redundancy (TMR), a mitigation technique for DCs is proposed and the system downtime is minimized. A method is also proposed to decrease the clock frequency after DC detection without interrupting the process

    Online Timing Slack Measurement and its Application in Field-Programmable Gate Arrays

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    Reliability, power consumption and timing performance are key concerns for today's integrated circuits. Measurement techniques capable of quantifying the timing characteristics of a circuit, while it is operating, facilitate a range of benefits. Delay variation due to environmental and operational conditions, and degradation can be monitored by tracking changes in timing performance. Using the measurements in a closed-loop to control power supply voltage or clock frequency allows for the reduction of timing safety margins, leading to improvements in power consumption or throughput performance through the exploitation of better-than worst-case operation. This thesis describes a novel online timing slack measurement method which can directly measure the timing performance of a circuit, accurately and with minimal overhead. Enhancements allow for the improvement of absolute accuracy and resolution. A compilation flow is reported that can automatically instrument arbitrary circuits on FPGAs with the measurement circuitry. On its own this measurement method is able to track the "health" of an integrated circuit, from commissioning through its lifetime, warning of impending failure or instigating pre-emptive degradation mitigation techniques. The use of the measurement method in a closed-loop dynamic voltage and frequency scaling scheme has been demonstrated, achieving significant improvements in power consumption and throughput performance.Open Acces

    Design and validation of key components for the readout electronics of future PET scanners

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    This thesis work discusses the design and validation of two circuit components used in the electronic readout of positron emission tomography (PET) scanners for biomedical applications: a constant fraction discriminator (CFD) and an integrated CMOS time to digital converter (TDC). The former is used in the read out of a double-head PET scanner already developed by the group of medical physics at INFN Pisa for non-invasive dose delivery monitoring in hadrontherapy. The goal of the work has been the optimization of the front-end PCB in terms of timing performances so as to reduce the dead time and resolution at system level. A new CFD board has been implemented and experimental results have shown a significant enhancement of the timing characteristics which have enabled performing in-beam PET data acquisition which is fundamental in hadrontherapy treatment. The design of an integrated CMOS TDC to be used for the time of flight measurement in a magnetic field-compatible PET block detector is the second topic of the thesis. The required time resolutions, linear behaviour as well as the communication with other readout elements have been taken into account in the definition of the circuit topology. Cadence and Verilog simulations have shown that a bin size of 100 ps can be obtained with the combination of a submicron technology (UMC 65 nm LLLVT) and a pipeline approach where a 10 bit systolic counter coupled to a 4 stage delay locked loop (DLL) are exploited. This translates into a nominal resolution of 29 ps. In addition, the use of a short DLL leads to a high linearity which is an issue in PET measurements. Despite lower resolutions are obtained in literature with different TDC topologies, achieving good performances in terms of both time resolution and linearity is not straightforward. The converter also features a real-time validation algorithm which is capable to reject noise inputs generated by the photodetector without impairing the acquisition capability of the system. A standard-cell unit has been also designed which is in charge of data buffering and serial communication with external readout boards. A 47 bit output word is provided by the semi-custom stage at a measurement rate which is selectable between 31.25 MHz and 62.5 MHz with a double hit resolution of 170 ns. An 8 channel prototype of 1.875 x 1.875 mm2 has been submitted in March 2013 in order to validate simulated data with experimental results

    고속 시리얼 링크를 위한 고리 발진기를 기반으로 하는 주파수 합성기

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    학위논문(박사) -- 서울대학교대학원 : 공과대학 전기·정보공학부, 2022. 8. 정덕균.In this dissertation, major concerns in the clocking of modern serial links are discussed. As sub-rate, multi-standard architectures are becoming predominant, the conventional clocking methodology seems to necessitate innovation in terms of low-cost implementation. Frequency synthesis with active, inductor-less oscillators replacing LC counterparts are reviewed, and solutions for two major drawbacks are proposed. Each solution is verified by prototype chip design, giving a possibility that the inductor-less oscillator may become a proper candidate for future high-speed serial links. To mitigate the high flicker noise of a high-frequency ring oscillator (RO), a reference multiplication technique that effectively extends the bandwidth of the following all-digital phase-locked loop (ADPLL) is proposed. The technique avoids any jitter accumulation, generating a clean mid-frequency clock, overall achieving high jitter performance in conjunction with the ADPLL. Timing constraint for the proper reference multiplication is first analyzed to determine the calibration points that may correct the existent phase errors. The weight for each calibration point is updated by the proposed a priori probability-based least-mean-square (LMS) algorithm. To minimize the time required for the calibration, each gain for the weight update is adaptively varied by deducing a posteriori which error source dominates the others. The prototype chip is fabricated in a 40-nm CMOS technology, and its measurement results verify the low-jitter, high-frequency clock generation with fast calibration settling. The presented work achieves an rms jitter of 177/223 fs at 8/16-GHz output, consuming 12.1/17-mW power. As the second embodiment, an RO-based ADPLL with an analog technique that addresses the high supply sensitivity of the RO is presented. Unlike prior arts, the circuit for the proposed technique does not extort the RO voltage headroom, allowing high-frequency oscillation. Further, the performance given from the technique is robust over process, voltage, and temperature (PVT) variations, avoiding the use of additional calibration hardware. Lastly, a comprehensive analysis of phase noise contribution is conducted for the overall ADPLL, followed by circuit optimizations, to retain the low-jitter output. Implemented in a 40-nm CMOS technology, the frequency synthesizer achieves an rms jitter of 289 fs at 8 GHz output without any injected supply noise. Under a 20-mVrms white supply noise, the ADPLL suppresses supply-noise-induced jitter by -23.8 dB.본 논문은 현대 시리얼 링크의 클락킹에 관여되는 주요한 문제들에 대하여 기술한다. 준속도, 다중 표준 구조들이 채택되고 있는 추세에 따라, 기존의 클라킹 방법은 낮은 비용의 구현의 관점에서 새로운 혁신을 필요로 한다. LC 공진기를 대신하여 능동 소자 발진기를 사용한 주파수 합성에 대하여 알아보고, 이에 발생하는 두가지 주요 문제점과 각각에 대한 해결 방안을 탐색한다. 각 제안 방법을 프로토타입 칩을 통해 그 효용성을 검증하고, 이어서 능동 소자 발진기가 미래의 고속 시리얼 링크의 클락킹에 사용될 가능성에 대해 검토한다. 첫번째 시연으로써, 고주파 고리 발진기의 높은 플리커 잡음을 완화시키기 위해 기준 신호를 배수화하여 뒷단의 위상 고정 루프의 대역폭을 효과적으로 극대화 시키는 회로 기술을 제안한다. 본 기술은 지터를 누적 시키지 않으며 따라서 깨끗한 중간 주파수 클락을 생성시켜 위상 고정 루프와 함께 높은 성능의 고주파 클락을 합성한다. 기준 신호를 성공적으로 배수화하기 위한 타이밍 조건들을 먼저 분석하여 타이밍 오류를 제거하기 위한 방법론을 파악한다. 각 교정 중량은 연역적 확률을 기반으로한 LMS 알고리즘을 통해 갱신되도록 설계된다. 교정에 필요한 시간을 최소화 하기 위하여, 각 교정 이득은 타이밍 오류 근원들의 크기를 귀납적으로 추론한 값을 바탕으로 지속적으로 제어된다. 40-nm CMOS 공정으로 구현된 프로토타입 칩의 측정을 통해 저소음, 고주파 클락을 빠른 교정 시간안에 합성해 냄을 확인하였다. 이는 177/223 fs의 rms 지터를 가지는 8/16 GHz의 클락을 출력한다. 두번째 시연으로써, 고리 발진기의 높은 전원 노이즈 의존성을 완화시키는 기술이 포함된 주파수 합성기가 설계되었다. 이는 고리 발진기의 전압 헤드룸을 보존함으로서 고주파 발진을 가능하게 한다. 나아가, 전원 노이즈 감소 성능은 공정, 전압, 온도 변동에 대하여 민감하지 않으며, 따라서 추가적인 교정 회로를 필요로 하지 않는다. 마지막으로, 위상 노이즈에 대한 포괄적 분석과 회로 최적화를 통하여 주파수 합성기의 저잡음 출력을 방해하지 않는 방법을 고안하였다. 해당 프로토타입 칩은 40-nm CMOS 공정으로 구현되었으며, 전원 노이즈가 인가되지 않은 상태에서 289 fs의 rms 지터를 가지는 8 GHz의 클락을 출력한다. 또한, 20 mVrms의 전원 노이즈가 인가되었을 때에 유도되는 지터의 양을 -23.8 dB 만큼 줄이는 것을 확인하였다.1 Introduction 1 1.1 Motivation 3 1.1.1 Clocking in High-Speed Serial Links 4 1.1.2 Multi-Phase, High-Frequency Clock Conversion 8 1.2 Dissertation Objectives 10 2 RO-Based High-Frequency Synthesis 12 2.1 Phase-Locked Loop Fundamentals 12 2.2 Toward All-Digital Regime 15 2.3 RO Design Challenges 21 2.3.1 Oscillator Phase Noise 21 2.3.2 Challenge 1: High Flicker Noise 23 2.3.3 Challenge 2: High Supply Noise Sensitivity 26 3 Filtering RO Noise 28 3.1 Introduction 28 3.2 Proposed Reference Octupler 34 3.2.1 Delay Constraint 34 3.2.2 Phase Error Calibration 38 3.2.3 Circuit Implementation 51 3.3 IL-ADPLL Implementation 55 3.4 Measurement Results 59 3.5 Summary 63 4 RO Supply Noise Compensation 69 4.1 Introduction 69 4.2 Proposed Analog Closed Loop for Supply Noise Compensation 72 4.2.1 Circuit Implementation 73 4.2.2 Frequency-Domain Analysis 76 4.2.3 Circuit Optimization 81 4.3 ADPLL Implementation 87 4.4 Measurement Results 90 4.5 Summary 98 5 Conclusions 99 A Notes on the 8REF 102 B Notes on the ACSC 105박

    Time resolved single photon imaging in Nanometer Scale CMOS technology

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    Time resolved imaging is concerned with the measurement of photon arrival time. It has a wealth of emerging applications including biomedical uses such as fluorescence lifetime microscopy and positron emission tomography, as well as laser ranging and imaging in three dimensions. The impact of time resolved imaging on human life is significant: it can be used to identify cancerous cells in-vivo, how well new drugs may perform, or to guide a robot around a factory or hospital. Two essential building blocks of a time resolved imaging system are a photon detector capable of sensing single photons, and fast time resolvers that can measure the time of flight of light to picosecond resolution. In order to address these emerging applications, miniaturised, single-chip, integrated arrays of photon detectors and time resolvers must be developed with state of the art performance and low cost. The goal of this research is therefore the design, layout and verification of arrays of low noise Single Photon Avalanche Diodes (SPADs) together with high resolution Time-Digital Converters (TDCs) using an advanced silicon fabrication process. The research reported in this Thesis was carried out as part of the E.U. funded Megaframe FP6 Project. A 32x32 pixel, one million frames per second, time correlated imaging device has been designed, simulated and fabricated using a 130nm CMOS Imaging process from ST Microelectronics. The imager array has been implemented together with required support cells in order to transmit data off chip at high speed as well as providing a means of device control, test and calibration. The fabricated imaging device successfully demonstrates the research objectives. The Thesis presents details of design, simulation and characterisation results of the elements of the Megaframe device which were the author’s own work. Highlights of the results include the smallest and lowest noise SPAD devices yet published for this class of fabrication process and an imaging array capable of recording single photon arrivals every microsecond, with a minimum time resolution of fifty picoseconds and single bit linearity
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