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    T1T_1- and T2T_2-spin relaxation time limitations of phosphorous donor electrons near crystalline silicon to silicon dioxide interface defects

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    A study of donor electron spins and spin--dependent electronic transitions involving phosphorous (31^{31}P) atoms in proximity of the (111) oriented crystalline silicon (c-Si) to silicon dioxide (SiO2_{2}) interface is presented for [31^{31}P] = 1015^{15} cmβˆ’3\mathrm{cm}^{-3} and [31^{31}P] = 1016^{16} cmβˆ’3\mathrm{cm}^{-3} at about liquid 4^4He temperatures (T=5T = 5 Kβˆ’15\mathrm{K} - 15 K\mathrm{K}). Using pulsed electrically detected magnetic resonance (pEDMR), spin--dependent transitions between the \Phos donor state and two distinguishable interface states are observed, namely (i) \Pb centers which can be identified by their characteristic anisotropy and (ii) a more isotropic center which is attributed to Eβ€²^\prime defects of the \sio bulk close to the interface. Correlation measurements of the dynamics of spin--dependent recombination confirm that previously proposed transitions between \Phos and the interface defects take place. The influence of these electronic near--interface transitions on the \Phos donor spin coherence time T2T_2 as well as the donor spin--lattice relaxation time T1T_1 is then investigated by comparison of spin Hahn--echo decay measurements obtained from conventional bulk sensitive pulsed electron paramagnetic resonance and surface sensitive pEDMR, as well as surface sensitive electrically detected inversion recovery experiments. The measurements reveal that both T2T_2 and T1T_1 of \Phos donor electrons spins in proximity of energetically lower interface states at T≀13T\leq 13 K are reduced by several orders of magnitude

    Large potential steps at weakly interacting metal-insulator interfaces

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    Potential steps exceeding 1 eV are regularly formed at metal|insulator interfaces, even when the interaction between the materials at the interface is weak physisorption. From first-principles calculations on metal|h-BN interfaces we show that these potential steps are only indirectly sensitive to the interface bonding through the dependence of the binding energy curves on the van der Waals interaction. Exchange repulsion forms the main contribution to the interface potential step in the weakly interacting regime, which we show with a simple model based upon a symmetrized product of metal and h-BN wave functions. In the strongly interacting regime, the interface potential step is reduced by chemical bonding

    Negative Differential Resistance Induced by Mn Substitution at SrRuO3/Nb:SrTiO3 Schottky Interfaces

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    We observed a strong modulation in the current-voltage characteristics of SrRuO3_3/Nb:SrTiO3_3 Schottky junctions by Mn substitution in SrRuO3_3, which induces a metal-insulator transition in bulk. The temperature dependence of the junction ideality factor indicates an increased spatial inhomogeneity of the interface potential with substitution. Furthermore, negative differential resistance was observed at low temperatures, indicating the formation of a resonant state by Mn substitution. By spatially varying the position of the Mn dopants across the interface with single unit cell control, we can isolate the origin of this resonant state to the interface SrRuO3_3 layer. These results demonstrate a conceptually different approach to controlling interface states by utilizing the highly sensitive response of conducting perovskites to impurities
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