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    A reduced complexity numerical method for optimal gate synthesis

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    Although quantum computers have the potential to efficiently solve certain problems considered difficult by known classical approaches, the design of a quantum circuit remains computationally difficult. It is known that the optimal gate design problem is equivalent to the solution of an associated optimal control problem, the solution to which is also computationally intensive. Hence, in this article, we introduce the application of a class of numerical methods (termed the max-plus curse of dimensionality free techniques) that determine the optimal control thereby synthesizing the desired unitary gate. The application of this technique to quantum systems has a growth in complexity that depends on the cardinality of the control set approximation rather than the much larger growth with respect to spatial dimensions in approaches based on gridding of the space, used in previous literature. This technique is demonstrated by obtaining an approximate solution for the gate synthesis on SU(4)SU(4)- a problem that is computationally intractable by grid based approaches.Comment: 8 pages, 4 figure

    Neural Class-Specific Regression for face verification

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    Face verification is a problem approached in the literature mainly using nonlinear class-specific subspace learning techniques. While it has been shown that kernel-based Class-Specific Discriminant Analysis is able to provide excellent performance in small- and medium-scale face verification problems, its application in today's large-scale problems is difficult due to its training space and computational requirements. In this paper, generalizing our previous work on kernel-based class-specific discriminant analysis, we show that class-specific subspace learning can be cast as a regression problem. This allows us to derive linear, (reduced) kernel and neural network-based class-specific discriminant analysis methods using efficient batch and/or iterative training schemes, suited for large-scale learning problems. We test the performance of these methods in two datasets describing medium- and large-scale face verification problems.Comment: 9 pages, 4 figure
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