4,961 research outputs found

    Evolving more efficient digital circuits by allowing circuit layout evolution and multi-objective fitness

    Get PDF
    We use evolutionary search to design combinational logic circuits. The technique is based on evolving the functionality and connectivity of a rectangular array of logic cells whose dimension is defined by the circuit layout. The main idea of this approach is to improve quality of the circuits evolved by the GA by reducing the number of active gates used. We accomplish this by combining two ideas: 1) using multi-objective fitness function; 2) evolving circuit layout. It will be shown that using these two approaches allows us to increase the quality of evolved circuits. The circuits are evolved in two phases. Initially the genome fitness in given by the percentage of output bits that are correct. Once 100% functional circuits have been evolved, the number of gates actually used in the circuit is taken into account in the fitness function. This allows us to evolve circuits with 100% functionality and minimise the number of active gates in circuit structure. The population is initialised with heterogeneous circuit layouts and the circuit layout is allowed to vary during the evolutionary process. Evolving the circuit layout together with the function is one of the distinctive features of proposed approach. The experimental results show that allowing the circuit layout to be flexible is useful when we want to evolve circuits with the smallest number of gates used. We find that it is better to use a fixed circuit layout when the objective is to achieve the highest number of 100% functional circuits. The two-fitness strategy is most effective when we allow a large number of generations

    Some aspects of an evolvable hardware approach for multiple-valued combinational circuit design

    Get PDF
    In this paper a gate-level evolvable hardware technique for designing multiple-valued (MV) combinational circuits is proposed for the first time. In comparison with the decomposition techniques used for synthesis of combinational circuits previously employed, this new approach is easily adapted for the different types of MV gates associated with operations corresponding to different algebra types and can include other more complex logical expressions (e.g. singlecontrol MV multiplexer called T-gate). The technique is based on evolving the functionality and connectivity of a rectangular array of logic cells. The experimental results show how the success of genetic algorithm depends on the number of columns, the number of rows in circuit structure and levels-back parameter (the number of columns to the left of current cell to which cell input may be connected). We show that the choice of the set of MV gates used radically affects the chances of successful evolution (in terms of number of 100% functional solutions found)

    Single-Event Upset Analysis and Protection in High Speed Circuits

    Get PDF
    The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

    Metastability-Containing Circuits

    Get PDF
    In digital circuits, metastability can cause deteriorated signals that neither are logical 0 or logical 1, breaking the abstraction of Boolean logic. Unfortunately, any way of reading a signal from an unsynchronized clock domain or performing an analog-to-digital conversion incurs the risk of a metastable upset; no digital circuit can deterministically avoid, resolve, or detect metastability (Marino, 1981). Synchronizers, the only traditional countermeasure, exponentially decrease the odds of maintained metastability over time. Trading synchronization delay for an increased probability to resolve metastability to logical 0 or 1, they do not guarantee success. We propose a fundamentally different approach: It is possible to contain metastability by fine-grained logical masking so that it cannot infect the entire circuit. This technique guarantees a limited degree of metastability in---and uncertainty about---the output. At the heart of our approach lies a time- and value-discrete model for metastability in synchronous clocked digital circuits. Metastability is propagated in a worst-case fashion, allowing to derive deterministic guarantees, without and unlike synchronizers. The proposed model permits positive results and passes the test of reproducing Marino's impossibility results. We fully classify which functions can be computed by circuits with standard registers. Regarding masking registers, we show that they become computationally strictly more powerful with each clock cycle, resulting in a non-trivial hierarchy of computable functions
    • …
    corecore