235 research outputs found
Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices
This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results
On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation
Machine Learning (ML) is making a strong resurgence in tune with the massive
generation of unstructured data which in turn requires massive computational
resources. Due to the inherently compute- and power-intensive structure of
Neural Networks (NNs), hardware accelerators emerge as a promising solution.
However, with technology node scaling below 10nm, hardware accelerators become
more susceptible to faults, which in turn can impact the NN accuracy. In this
paper, we study the resilience aspects of Register-Transfer Level (RTL) model
of NN accelerators, in particular, fault characterization and mitigation. By
following a High-Level Synthesis (HLS) approach, first, we characterize the
vulnerability of various components of RTL NN. We observed that the severity of
faults depends on both i) application-level specifications, i.e., NN data
(inputs, weights, or intermediate), NN layers, and NN activation functions, and
ii) architectural-level specifications, i.e., data representation model and the
parallelism degree of the underlying accelerator. Second, motivated by
characterization results, we present a low-overhead fault mitigation technique
that can efficiently correct bit flips, by 47.3% better than state-of-the-art
methods.Comment: 8 pages, 6 figure
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