Silicon compilation

Silicon compilation is a term used for many different purposes. In this paper we define silicon compilation as a mapping from some higher level description into layout. We define the basic issues in structural and behavioral silicon compilation and some possible solutions to those issues. Finally, we define the concept of an intelligent silicon compiler in which the compiler evaluates the quality of the generated design and attempts to improve it if it is not satisfactory

Custom Integrated Circuits

Contains reports on six research projects.U.S. Air Force - Office of Scientific Research (Contract F49620-84-C-0004)Analog Devices, Inc.Defense Advanced Research Projects Agency (Contract N00014-80-C-0622)National Science Foundation (Grant ECS83-10941

An approach to display layout of dynamic windows

The development of windows based user interface has introduced a new dimension to the field of human computer interaction. Now a user is able to perform multiple tasks at a time, often switching from one task to another. However windows environment also imposes the burden of manual windows management on the user. Several studies have suggested that manual window management is an unproductive chore often resulting in clutter and confusion on the display screen. Therefore we need a automatic windows layout generator to free the user to perform other useful tasks. This thesis introduces SPORDAC {Shadow Propagation for Overlap Removal and Display Area Compaction) algorithm. This algorithm aims to remove overlap from the display layout and encapsulate the layout in the finite display area. The SPORDAC prototype integrates the SPORDAC algorithm with simulated annealing to optimise the display area usage. The usefulness and applicability of the SPORDAC approach are illustrated with the implementation of a prototype, samples of generated layouts and analysis of the collected dat

New Techniques to Reduce the Execution Time of Functional Test Programs

The compaction of test programs for processor-based systems is of utmost practical importance: Software-Based Self-Test (SBST) is nowadays increasingly adopted, especially for in-field test of safety-critical applications, and both the size and the execution time of the test are critical parameters. However, while compacting the size of binary test sequences has been thoroughly studied over the years, the reduction of the execution time of test programs is still a rather unexplored area of research. This paper describes a family of algorithms able to automatically enhance an existing test program, reducing the time required to run it and, as a side effect, its size. The proposed solutions are based on instruction removal and restoration, which is shown to be computationally more efficient than instruction removal alone. Experimental results demonstrate the compaction capabilities, and allow analyzing computational costs and effectiveness of the different algorithms

Custom Integrated Circuits

Contains reports on six research projects.U.S. Air Force - Office of Scientific Research (Grant AFOSR-86-0164)U.S. Navy - Office of Naval Research (Contract N00014-80-C-0622)National Science Foundation (Grant ECS-83-10941

Automatic synthesis of analog layout : a survey

A review of recent research in the automatic synthesis of physical geometry for analog integrated circuits is presented. On introduction, an explanation of the difficulties involved in analog layout as opposed to digital layout is covered. Review of the literature then follows. Emphasis is placed on the exposition of general methods for addressing problems specific to analog layout, with the details of specific systems only being given when they surve to illustrate these methods well. The conclusion discusses problems remaining and offers a prediction as to how technology will evolve to solve them. It is argued that although progress has been and will continue to be made in the automation of analog IC layout, due to fundamental differences in the nature of analog IC design as opposed to digital design, it should not be expected that the level of automation of the former will reach that of the latter any time soon