Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability

25 Years Ago: The First Asynchronous Microprocessor

Twenty-five years ago, in December 1988, my research group at Caltech submitted the world’s first asynchronous (“clockless”) microprocessor design for fabrication to MOSIS. We received the chips in early 1989; testing started in February 1989. The chips were found fully functional on first silicon. The results were presented at the Decennial Caltech VLSI Conference in March of the same year. The first entirely asynchronous microprocessor had been designed and successfully fabricated. As the technology finally reaches industry, and with the benefit of a quarter-century hindsight, here is a recollection of this landmark project

An asynchronous instruction length decoder

Journal ArticleAbstract-This paper describes an investigation of potential advantages and pitfalls of applying an asynchronous design methodology to an advanced microprocessor architecture. A prototype complex instruction set length decoding and steering unit was implemented using self-timed circuits. [The Revolving Asynchronous Pentium® Processor Instruction Decoder (RAPPID) design implemented the complete Pentium II® 32-bit MMX instruction set.] The prototype chip was fabricated on a 0.25-CMOS process and tested successfully. Results show significant advantages-in particular, performance of 2.5-4.5 instructions per nanosecond-with manageable risks using this design technology. The prototype achieves three times the throughput and half the latency, dissipating only half the power and requiring about the same area as the fastest commercial 400-MHz clocked circuit fabricated on the same process

CAD directions for high performance asynchronous circuits

Journal ArticleThis paper describes a novel methodology for high performance asynchronous design based on timed circuits and on CAD support for their synthesis using Relative Timing. This methodology was developed for a prototype iA32 instruction length decoding and steering unit called RAPPID ("Revolving Asynchronous Pentium® Processor Instruction Decoder") that was fabricated and tested successfully. Silicon results show significant advantages - in particular, performance of 2.5-4.5 instructions per nS - with manageable risks using this design technology. RAPPID achieves three times faster performa the power and requiring a minor area penalty as a comparable 400MHz clocked circuit. Relative Timing is based on user-defined and automatically extracted relative tinning assumptions between signal transitions in a circuit and its environment. It supports the specification, synthesis, and verification of high-performance asynchronous circuits, such as pulse-mode circuits, that can be derived from an initial speed-independent specification. Relative timing presents a "middle-ground" between clocked and asynchronous circuits, and is a fertile area for CAD development. We discuss possible directions for future CAD development

An AER handshake-less modular infrastructure PCB with x8 2.5Gbps LVDS serial links

Nowadays spike-based brain processing emulation is taking off. Several EU and others worldwide projects are demonstrating this, like SpiNNaker, BrainScaleS, FACETS, or NeuroGrid. The larger the brain process emulation on silicon is, the higher the communication performance of the hosting platforms has to be. Many times the bottleneck of these system implementations is not on the performance inside a chip or a board, but in the communication between boards. This paper describes a novel modular Address-Event-Representation (AER) FPGA-based (Spartan6) infrastructure PCB (the AER-Node board) with 2.5Gbps LVDS high speed serial links over SATA cables that offers a peak performance of 32-bit 62.5Meps (Mega events per second) on board-to-board communications. The board allows back compatibility with parallel AER devices supporting up to x2 28-bit parallel data with asynchronous handshake. These boards also allow modular expansion functionality through several daughter boards. The paper is focused on describing in detail the LVDS serial interface and presenting its performance.Ministerio de Ciencia e Innovación TEC2009-10639-C04-02/01Ministerio de Economía y Competitividad TEC2012-37868-C04-02/01Junta de Andalucía TIC-6091Ministerio de Economía y Competitividad PRI-PIMCHI-2011-076

An asynchronous instruction length decoder

Journal ArticleThis paper describes an investigation of potential advantages and pitfalls of applying an asynchronous design methodology to an advanced microprocessor architecture. A prototype complex instruction set length decoding and steering unit was implemented using self-timed circuits. [The Revolving Asynchronous Pentium® Processor Instruction Decoder (RAPPID) design implemented the complete Pentium II® 32-bit MMX instruction set.] The prototype chip was fabricated on a 0.25-CMOS process and tested successfully. Results show significant advantages-in particular, performance of 2.5-4.5 instructions per nanosecond-with manageable risks using this design technology. The prototype achieves three times the throughput and half the latency, dissipating only half the power and requiring about the same area as the fastest commercial 400-MHz clocked circuit fabricated on the same process

Fsimac: a fault simulator for asynchronous sequential circuits

Journal ArticleAt very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper presents Fsimac, a gate-level fault simulator for stuck-at and gate-delay faults in asynchronous sequential circuits. Fsimac not only evaluates combinational logic and typical asynchronous gates such as Muller C-elements, but also complex domino gates, which are widely used in high-speed designs. Our algorithm for detecting feedback loops is designed so as to minimize the iterations for simulating the unfolded circuit. We use min-max timing analysis to compute the bounds on the signal delays. Stuck-at faults are detected by comparing logic values at the primary outputs against the corresponding values in the fault-free design. For delay faults, we additionally compare min-max time stamps for primary output signals. Fault coverage reported by Fsimac for pseudo-random tests generated by Cellular Automata show some very good results, but also indicate test holes for which more specific patterns are needed. We intend to deploy Fsimac for designing more effective CA-BIST