Design for testability of high-order OTA-C filters

Copyright © 2016 John Wiley & Sons, Ltd.A study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright ÂPeer reviewe

A design for testability study on a high performance automatic gain control circuit.

A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

Low-cost dc bist for analog circuits: a case study

This paper presents a DC analog testing technique based on a simple voltage comparison of the highest sensitivity node, which is found by simulation. The technique is a structural, fault driven testing approach and can be applied to any analog circuit with very few extra added circuitry. A proof of concept has been implemented in a 65nm low-voltage transconductor, showing good fault coverage for both catastrophic and parametric faults.Fil: Petrashin, Pablo. Universidad Nacional de Córdoba. Facultad de Ciencias Exactas Físicas y Naturales. Carrera de Ingeniería Electrónica; Argentina.Fil: Dualibe, Carlos. Universidad Católica de Córdoba. Facultad de Ingeniería. Laboratorio de Microelectrónica; Argentina.Fil: Lancioni, Walter. Universidad Cátólica de Córdoba. Facultad de Ingeniería; Argentina.Fil: Toledo, Luis. Universidad Católica de Córdoba; Argentina.Otras Ingeniería Eléctrica, Ingeniería Electrónica e Ingeniería de la Informació

Analog circuit test based on a digital signature

Production verification of analog circuit specifica- tions is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost on-chip parameter verification based on the analysis of a digital signature. A 65 nm CMOS on-chip monitor is proposed and validated in practice. The monitor composes two signals (x(t), y(t)) and divides the X-Y plane with nonlinear boundaries in order to generate a digital code for every analog (x, y) location. A digital signature is obtained using the digital code and its time duration. A metric defining a discrepancy factor is used to verify circuit parameters. The method is applied to detect possible deviations in the natural frequency of a Biquad filter. Simulated and experimental results show the possibilities of the proposal.Peer ReviewedPostprint (published version

A new BIST scheme for low-power and high-resolution DAC testing

A BIST scheme for testing on chip DAC is presented in this paper. We discuss the generation of on chip testing stimuli and the measurement of digital signals with a narrow-band digital filter. We validate the scheme with software simulation and point out the possibility of ADC BIST with verified DACicus-journals

Communication Subsystems for Emerging Wireless Technologies

The paper describes a multi-disciplinary design of modern communication systems. The design starts with the analysis of a system in order to define requirements on its individual components. The design exploits proper models of communication channels to adapt the systems to expected transmission conditions. Input filtering of signals both in the frequency domain and in the spatial domain is ensured by a properly designed antenna. Further signal processing (amplification and further filtering) is done by electronics circuits. Finally, signal processing techniques are applied to yield information about current properties of frequency spectrum and to distribute the transmission over free subcarrier channels

Single-Chip Isolated DC-DC Converter with Self-Tuned Maximum Power Transfer Frequency

abstract: There is an increasing demand for fully integrated point-of-load (POL) isolated DC-DC converters that can provide an isolation barrier between the primary and the secondary side, while delivering a low ripple, low noise regulated voltage at their isolated sides to a high dynamic range, sensitive mixed signal devices, such as sensors, current-shunt-monitors and ADCs. For these applications, smaller system size and integration level is important because the whole system may need to fit to limited space. Traditional methods for providing isolated power are discrete solutions using bulky transformers. Miniaturization of isolated POL regulators is becoming highly desirable for low power applications. A fully integrated, low noise isolated point-of-load DC-DC converter for supply regulation of high dynamic range analog and mixed signal sensor signal-chains is presented. The isolated DC-DC converter utilizes an integrated planar air-core micro-transformer as a coupled resonator and isolation barrier and enables direct connection of low-voltage mixed signal circuits to higher supply rails. The air core transformer is driven at its primary resonant frequency of 100 MHz to achieve maximum power transfer. A mixed-signal perturb-and-observe based frequency search algorithm is developed to improve maximum power transfer efficiency by 60% across the isolation barrier compared to fixed driving frequency method. The isolated converter’s output ripple is reduced by utilizing spread spectrum clocking in the driver. An isolated PMOS LDO in the secondary side is used to suppress switching noise and ripple by 21dB. Conducted and radiated EMI distribution on the IC is measured by a set of integrated ring oscillator based noise sensors with -68dBm noise sensitivity. The proposed isolated converter achieves highest level of integration with respect to earlier reported integrated isolated converters, while providing 50V on-chip junction isolation without the need for extra silicon post-processing steps.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201