Efficient modular arithmetic units for low power cryptographic applications

The demand for high security in energy constrained devices such as mobiles and PDAs is growing rapidly. This leads to the need for efficient design of cryptographic algorithms which offer data integrity, authentication, non-repudiation and confidentiality of the encrypted data and communication channels. The public key cryptography is an ideal choice for data integrity, authentication and non-repudiation whereas the private key cryptography ensures the confidentiality of the data transmitted. The latter has an extremely high encryption speed but it has certain limitations which make it unsuitable for use in certain applications. Numerous public key cryptographic algorithms are available in the literature which comprise modular arithmetic modules such as modular addition, multiplication, inversion and exponentiation. Recently, numerous cryptographic algorithms have been proposed based on modular arithmetic which are scalable, do word based operations and efficient in various aspects. The modular arithmetic modules play a crucial role in the overall performance of the cryptographic processor. Hence, better results can be obtained by designing efficient arithmetic modules such as modular addition, multiplication, exponentiation and squaring. This thesis is organized into three papers, describes the efficient implementation of modular arithmetic units, application of these modules in International Data Encryption Algorithm (IDEA). Second paper describes the IDEA algorithm implementation using the existing techniques and using the proposed efficient modular units. The third paper describes the fault tolerant design of a modular unit which has online self-checking capability --Abstract, page iv

Design of ALU and Cache Memory for an 8 bit ALU

The design of an ALU and a Cache memory for use in a high performance processor was examined in this thesis. Advanced architectures employing increased parallelism were analyzed to minimize the number of execution cycles needed for 8 bit integer arithmetic operations. In addition to the arithmetic unit, an optimized SRAM memory cell was designed to be used as cache memory and as fast Look Up Table. The ALU consists of stand alone units for bit parallel computation of basic integer arithmetic operations. Addition and subtraction were performed using Kogge Stone parallel prefix hardware operating at 330MHz. A high performance multiplier was built using Radix 4 Modified Booth Encoder (MBE) and a Wallace Tree summation array. The multiplier requires single clock cycle for 8 bit integer multiplication and operates at a maximum frequency of 100MHz. Multiplicative division hardware was built for executing both integer division and square root. The division hardware computes 8-bit division and square root in 4 clock cycles. Multiplier forms the basic building block of all these functional units, making high level of resource sharing feasible with this architecture. The optimal operating frequency for the arithmetic unit is 70MHz. A 6T CMOS SRAM cell measuring 90 µm2 was designed using minimum size transistors. The layout allows for horizontal overlap resulting in effective area of 76 µm2 for an 8x8 array. By substituting equivalent bit line capacitance of P4 L1 Cache, the memory was simulated to have a read time of 3.27ns. An optimized set of test vectors were identified to enable high fault coverage without the need for any additional test circuitry. Sixteen test cases were identified that would toggle all the nodes and provide all possible inputs to the sub units of the multiplier. A correlation based semi automatic method was investigated to facilitate test case identification for large multipliers. This method of testability eliminates performance and area overhead associated with conventional testability hardware. Bottom up design methodology was employed for the design. The performance and area metrics are presented along with estimated power consumption. A set of Monte Carlo analysis was carried out to ensure the dependability of the design under process variations as well as fluctuations in operating conditions. The arithmetic unit was found to require a total die area of 2mm2 (approx.) in 0.35 micron process

The 1992 4th NASA SERC Symposium on VLSI Design

Papers from the fourth annual NASA Symposium on VLSI Design, co-sponsored by the IEEE, are presented. Each year this symposium is organized by the NASA Space Engineering Research Center (SERC) at the University of Idaho and is held in conjunction with a quarterly meeting of the NASA Data System Technology Working Group (DSTWG). One task of the DSTWG is to develop new electronic technologies that will meet next generation electronic data system needs. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The NASA SERC is proud to offer, at its fourth symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories, the electronics industry, and universities. These speakers share insights into next generation advances that will serve as a basis for future VLSI design

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

NASA Space Engineering Research Center Symposium on VLSI Design

The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers

A study of arithmetic circuits and the effect of utilising Reed-Muller techniques

Reed-Muller algebraic techniques, as an alternative means in logic design, became more attractive recently, because of their compact representations of logic functions and yielding of easily testable circuits. It is claimed by some researchers that Reed-Muller algebraic techniques are particularly suitable for arithmetic circuits. In fact, no practical application in this field can be found in the open literature.This project investigates existing Reed-Muller algebraic techniques and explores their application in arithmetic circuits. The work described in this thesis is concerned with practical applications in arithmetic circuits, especially for minimizing logic circuits at the transistor level. These results are compared with those obtained using the conventional Boolean algebraic techniques. This work is also related to wider fields, from logic level design to layout level design in CMOS circuits, the current leading technology in VLSI. The emphasis is put on circuit level (transistor level) design. The results show that, although Boolean logic is believed to be a more general tool in logic design, it is not the best tool in all situations. Reed-Muller logic can generate good results which can't be easily obtained by using Boolean logic.F or testing purposes, a gate fault model is often used in the conventional implementation of Reed-Muller logic, which leads to Reed-Muller logic being restricted to using a small gate set. This usually leads to generating more complex circuits. When a cell fault model, which is more suitable for regular and iterative circuits, such as arithmetic circuits, is used instead of the gate fault model in Reed-Muller logic, a wider gate set can be employed to realize Reed-Muller functions. As a result, many circuits designed using Reed-Muller logic can be comparable to that designed using Boolean logic. This conclusion is demonstrated by testing many randomly generated functions.The main aim of this project is to develop arithmetic circuits for practical application. A number of practical arithmetic circuits are reported. The first one is a carry chain adder. Utilising the CMOS circuit characteristics, a simple and high speed carry chain is constructed to perform the carry operation. The proposed carry chain adder can be reconstructed to form a fast carry skip adder, and it is also found to be a good application for residue number adders. An algorithm for an on-line adder and its implementation are also developed. Another circuit is a parallel multiplier based on 5:3 counter. The simulations show that the proposed circuits are better than many previous designs, in terms of the number of transistors and speed. In addition, a 4:2 compressor for a carry free adder is investigated. It is shown that the two main schemes to construct the 4:2 compressor have a unified structure. A variant of the Baugh and Wooley algorithm is also studied and generalized in this work

Early Dependability Analysis of FPGA-Based Space Applications Using Formal Verification

SRAM-based FPGAs are increasingly attractive in the aerospace industry for their field programmability and low cost. Unfortunately, they suffer from cosmic radiation induced Single Event Effects (SEEs). In safety-critical applications, the dependability of the design is a prime concern since failures may have catastrophic consequences. Hence, an early analysis of dependability of such safety-critical applications will enable designers to develop systems that meet high dependability requirements, such as the DO-254 standard. In this thesis, we propose a high-level dependability and performability analysis methodology based on probabilistic model checking. Compared to the pen-and-pencil and discrete-event simulation approach, our methodology is more accurate due to the use of an automated formal verification technique. Moreover, compared to fault injection or beam testing, analysis at early design stages can guide designers to build more reliable designs reducing the overall cost and effort. The proposed methodology can perform three different types of analysis: evaluation of available design options, optimization of scrub intervals while satisfying its design assurance level requirements, and optimal partitioning of Triple-Modular Redundant (TMR) Systems. Such analysis can also guide designers to adopt proper mitigation technique(s), such as rescheduling, TMR, TMR with less frequent scrubs, or even can help to decide the number of TMR partitions for a given scrub intervals. Starting from a high-level description of a system, based on the preferred analysis, a Markov model or Markov (reward) model is constructed from the extracted Control Data Flow Graph (CDFG) and the failure/mitigation parameters for the targeted FPGA. Such modeling and exhaustive analysis elaborated using a probabilistic model checking technique can capture all the failures and repairs possible (according to some general model) in the system within the radiation environment. To illustrate the applicability of the proposed approach, we present our quantitative analysis obtained from DSP benchmark circuits