Analysis of Hardware Descriptions

The design process for integrated circuits requires a lot of analysis of circuit descriptions. An important class of analyses determines how easy it will be to determine if a physical component suffers from any manufacturing errors. As circuit complexities grow rapidly, the problem of testing circuits also becomes increasingly difficult. This thesis explores the potential for analysing a recent high level hardware description language called Ruby. In particular, we are interested in performing testability analyses of Ruby circuit descriptions. Ruby is ammenable to algebraic manipulation, so we have sought transformations that improve testability while preserving behaviour. The analysis of Ruby descriptions is performed by adapting a technique called abstract interpretation. This has been used successfully to analyse functional programs. This technique is most applicable where the analysis to be captured operates over structures isomorphic to the structure of the circuit. Many digital systems analysis tools require the circuit description to be given in some special form. This can lead to inconsistency between representations, and involves additional work converting between representations. We propose using the original description medium, in this case Ruby, for performing analyses. A related technique, called non-standard interpretation, is shown to be very useful for capturing many circuit analyses. An implementation of a system that performs non-standard interpretation forms the central part of the work. This allows Ruby descriptions to be analysed using alternative interpretations such test pattern generation and circuit layout interpretations. This system follows a similar approach to Boute's system semantics work and O'Donnell's work on Hydra. However, we have allowed a larger class of interpretations to be captured and offer a richer description language. The implementation presented here is constructed to allow a large degree of code sharing between different analyses. Several analyses have been implemented including simulation, test pattern generation and circuit layout. Non-standard interpretation provides a good framework for implementing these analyses. A general model for making non-standard interpretations is presented. Combining forms that combine two interpretations to produce a new interpretation are also introduced. This allows complex circuit analyses to be decomposed in a modular manner into smaller circuit analyses which can be built independently

Fault Models for Quantum Mechanical Switching Networks

The difference between faults and errors is that, unlike faults, errors can be corrected using control codes. In classical test and verification one develops a test set separating a correct circuit from a circuit containing any considered fault. Classical faults are modelled at the logical level by fault models that act on classical states. The stuck fault model, thought of as a lead connected to a power rail or to a ground, is most typically considered. A classical test set complete for the stuck fault model propagates both binary basis states, 0 and 1, through all nodes in a network and is known to detect many physical faults. A classical test set complete for the stuck fault model allows all circuit nodes to be completely tested and verifies the function of many gates. It is natural to ask if one may adapt any of the known classical methods to test quantum circuits. Of course, classical fault models do not capture all the logical failures found in quantum circuits. The first obstacle faced when using methods from classical test is developing a set of realistic quantum-logical fault models. Developing fault models to abstract the test problem away from the device level motivated our study. Several results are established. First, we describe typical modes of failure present in the physical design of quantum circuits. From this we develop fault models for quantum binary circuits that enable testing at the logical level. The application of these fault models is shown by adapting the classical test set generation technique known as constructing a fault table to generate quantum test sets. A test set developed using this method is shown to detect each of the considered faults.Comment: (almost) Forgotten rewrite from 200

Fast Heuristic and Exact Algorithms for Two-Level Hazard-Free Logic Minimization

None of the available minimizers for 2-level hazard-free logic minimization can synthesize very large circuits. This limitation has forced researchers to resort to manual and automated circuit partitioning techniques. This paper introduces two new 2-level logic minimizers:ESPRESSO-HF, a heuristic method which is loosely based on ESPRESSO-II, and IMPYMIN, an exact method based on implicit data structures. Both minimizers can solve all currently available examples, which range up to 32 inputs and 33 outputs.These include examples that have never been solved before.For examples that can be solved by other minimizers our methods are several orders of magnitude faster. As by-products of these algorithms, we also present two additional results. First, we introduce a fast new algorithm to check if a hazard-free covering problem can feasibly be solved. Second, we introduce a novel formulation of the 2-level hazard-free logic minimization problem by capturing hazard-freedom constraints within a synchronous function by adding new variables

Fast Heuristic and Exact Algorithms for Two-Level Hazard-Free Logic Minimization

None of the available minimizers for 2-level hazard-free logic minimization can synthesize very large circuits. This limitation has forced researchers to resort to manual and automated circuit partitioning techniques. This paper introduces two new 2-level logic minimizers:ESPRESSO-HF, a heuristic method which is loosely based on ESPRESSO-II, and IMPYMIN, an exact method based on implicit data structures. Both minimizers can solve all currently available examples, which range up to 32 inputs and 33 outputs.These include examples that have never been solved before.For examples that can be solved by other minimizers our methods are several orders of magnitude faster. As by-products of these algorithms, we also present two additional results. First, we introduce a fast new algorithm to check if a hazard-free covering problem can feasibly be solved. Second, we introduce a novel formulation of the 2-level hazard-free logic minimization problem by capturing hazard-freedom constraints within a synchronous function by adding new variables

Embedded System Design

A unique feature of this open access textbook is to provide a comprehensive introduction to the fundamental knowledge in embedded systems, with applications in cyber-physical systems and the Internet of things. It starts with an introduction to the field and a survey of specification models and languages for embedded and cyber-physical systems. It provides a brief overview of hardware devices used for such systems and presents the essentials of system software for embedded systems, including real-time operating systems. The author also discusses evaluation and validation techniques for embedded systems and provides an overview of techniques for mapping applications to execution platforms, including multi-core platforms. Embedded systems have to operate under tight constraints and, hence, the book also contains a selected set of optimization techniques, including software optimization techniques. The book closes with a brief survey on testing. This fourth edition has been updated and revised to reflect new trends and technologies, such as the importance of cyber-physical systems (CPS) and the Internet of things (IoT), the evolution of single-core processors to multi-core processors, and the increased importance of energy efficiency and thermal issues

Logic Synthesis for Established and Emerging Computing

Logic synthesis is an enabling technology to realize integrated computing systems, and it entails solving computationally intractable problems through a plurality of heuristic techniques. A recent push toward further formalization of synthesis problems has shown to be very useful toward both attempting to solve some logic problems exactly--which is computationally possible for instances of limited size today--as well as creating new and more powerful heuristics based on problem decomposition. Moreover, technological advances including nanodevices, optical computing, and quantum and quantum cellular computing require new and specific synthesis flows to assess feasibility and scalability. This review highlights recent progress in logic synthesis and optimization, describing models, data structures, and algorithms, with specific emphasis on both design quality and emerging technologies. Example applications and results of novel techniques to established and emerging technologies are reported

Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures

abstract: Digital architectures for data encryption, processing, clock synthesis, data transfer, etc. are susceptible to radiation induced soft errors due to charge collection in complementary metal oxide semiconductor (CMOS) integrated circuits (ICs). Radiation hardening by design (RHBD) techniques such as double modular redundancy (DMR) and triple modular redundancy (TMR) are used for error detection and correction respectively in such architectures. Multiple node charge collection (MNCC) causes domain crossing errors (DCE) which can render the redundancy ineffectual. This dissertation describes techniques to ensure DCE mitigation with statistical confidence for various designs. Both sequential and combinatorial logic are separated using these custom and computer aided design (CAD) methodologies. Radiation vulnerability and design overhead are studied on VLSI sub-systems including an advanced encryption standard (AES) which is DCE mitigated using module level coarse separation on a 90-nm process with 99.999% DCE mitigation. A radiation hardened microprocessor (HERMES2) is implemented in both 90-nm and 55-nm technologies with an interleaved separation methodology with 99.99% DCE mitigation while achieving 4.9% increased cell density, 28.5 % reduced routing and 5.6% reduced power dissipation over the module fences implementation. A DMR register-file (RF) is implemented in 55 nm process and used in the HERMES2 microprocessor. The RF array custom design and the decoders APR designed are explored with a focus on design cycle time. Quality of results (QOR) is studied from power, performance, area and reliability (PPAR) perspective to ascertain the improvement over other design techniques. A radiation hardened all-digital multiplying pulsed digital delay line (DDL) is designed for double data rate (DDR2/3) applications for data eye centering during high speed off-chip data transfer. The effect of noise, radiation particle strikes and statistical variation on the designed DDL are studied in detail. The design achieves the best in class 22.4 ps peak-to-peak jitter, 100-850 MHz range at 14 pJ/cycle energy consumption. Vulnerability of the non-hardened design is characterized and portions of the redundant DDL are separated in custom and auto-place and route (APR). Thus, a range of designs for mission critical applications are implemented using methodologies proposed in this work and their potential PPAR benefits explored in detail.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

Aeronautical engineering: A continuing bibliography with indexes (supplement 216)

This bibliography lists 505 reports, articles and other documents introduced into the NASA scientific and technical information system in July, 1987