Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

Generating Property-Directed Potential Invariants By Backward Analysis

This paper addresses the issue of lemma generation in a k-induction-based formal analysis of transition systems, in the linear real/integer arithmetic fragment. A backward analysis, powered by quantifier elimination, is used to output preimages of the negation of the proof objective, viewed as unauthorized states, or gray states. Two heuristics are proposed to take advantage of this source of information. First, a thorough exploration of the possible partitionings of the gray state space discovers new relations between state variables, representing potential invariants. Second, an inexact exploration regroups and over-approximates disjoint areas of the gray state space, also to discover new relations between state variables. k-induction is used to isolate the invariants and check if they strengthen the proof objective. These heuristics can be used on the first preimage of the backward exploration, and each time a new one is output, refining the information on the gray states. In our context of critical avionics embedded systems, we show that our approach is able to outperform other academic or commercial tools on examples of interest in our application field. The method is introduced and motivated through two main examples, one of which was provided by Rockwell Collins, in a collaborative formal verification framework.Comment: In Proceedings FTSCS 2012, arXiv:1212.657

Selecting Maximally Informative Frequency Subsets for Acoustic Surveys

Masteroppgave i informatikkINF399MAMN-INFMAMN-PRO

A Comparative Study of Efficient Initialization Methods for the K-Means Clustering Algorithm

K-means is undoubtedly the most widely used partitional clustering algorithm. Unfortunately, due to its gradient descent nature, this algorithm is highly sensitive to the initial placement of the cluster centers. Numerous initialization methods have been proposed to address this problem. In this paper, we first present an overview of these methods with an emphasis on their computational efficiency. We then compare eight commonly used linear time complexity initialization methods on a large and diverse collection of data sets using various performance criteria. Finally, we analyze the experimental results using non-parametric statistical tests and provide recommendations for practitioners. We demonstrate that popular initialization methods often perform poorly and that there are in fact strong alternatives to these methods.Comment: 17 pages, 1 figure, 7 table