280,716 research outputs found

    Test generation from P systems using model checking

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    This paper presents some testing approaches based on model checking and using different testing criteria. First, test sets are built from different Kripke structure representations. Second, various rule coverage criteria for transitional, non-deterministic, cell-like P systems, are considered in order to generate adequate test sets. Rule based coverage criteria (simple rule coverage, context-dependent rule coverage and variants) are defined and, for each criterion, a set of LTL (Linear Temporal Logic) formulas is provided. A codification of a P system as a Kripke structure and the sets of LTL properties are used in test generation: for each criterion, test cases are obtained from the counterexamples of the associated LTL formulas, which are automatically generated from the Kripke structure codification of the P system. The method is illustrated with an implementation using a specific model checker, NuSMV. (C) 2010 Elsevier Inc. All rights reserved

    Model Checking Based Test Generation from P Systems Using P-Lingua

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    This paper presents an approach for P system testing, that uses model- checking for automatic test generation and P-Lingua as specification language. This approach is based on a transformation of the transitional, non-deterministic, cell-like P system into a Kripke structure, which is further used for test generation, by adding convenient temporal logic specifications. This paper extends our previous work in this field to multi-membrane, transitional P system, having cooperative rules, communication between membranes and membrane dissolution. A tool, which takes as input a P system specified in P-Lingua and translates it into the language accepted by the model checker NuSMV was developed and used for test case generation. Some hints regarding the automatic test generation using NuSMV and P-Lingua are also given

    Development of a framework for automated systematic testing of safety-critical embedded systems

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    ā€œThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." ā€œCopyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ā€In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain

    Automatic Generation of Minimal Cut Sets

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    A cut set is a collection of component failure modes that could lead to a system failure. Cut Set Analysis (CSA) is applied to critical systems to identify and rank system vulnerabilities at design time. Model checking tools have been used to automate the generation of minimal cut sets but are generally based on checking reachability of system failure states. This paper describes a new approach to CSA using a Linear Temporal Logic (LTL) model checker called BT Analyser that supports the generation of multiple counterexamples. The approach enables a broader class of system failures to be analysed, by generalising from failure state formulae to failure behaviours expressed in LTL. The traditional approach to CSA using model checking requires the model or system failure to be modified, usually by hand, to eliminate already-discovered cut sets, and the model checker to be rerun, at each step. By contrast, the new approach works incrementally and fully automatically, thereby removing the tedious and error-prone manual process and resulting in significantly reduced computation time. This in turn enables larger models to be checked. Two different strategies for using BT Analyser for CSA are presented. There is generally no single best strategy for model checking: their relative efficiency depends on the model and property being analysed. Comparative results are given for the A320 hydraulics case study in the Behavior Tree modelling language.Comment: In Proceedings ESSS 2015, arXiv:1506.0325

    Chaining Test Cases for Reactive System Testing (extended version)

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    Testing of synchronous reactive systems is challenging because long input sequences are often needed to drive them into a state at which a desired feature can be tested. This is particularly problematic in on-target testing, where a system is tested in its real-life application environment and the time required for resetting is high. This paper presents an approach to discovering a test case chain---a single software execution that covers a group of test goals and minimises overall test execution time. Our technique targets the scenario in which test goals for the requirements are given as safety properties. We give conditions for the existence and minimality of a single test case chain and minimise the number of test chains if a single test chain is infeasible. We report experimental results with a prototype tool for C code generated from Simulink models and compare it to state-of-the-art test suite generators.Comment: extended version of paper published at ICTSS'1
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