Optimising Simulation Data Structures for the Xeon Phi

In this paper, we propose a lock-free architecture to accelerate logic gate circuit simulation using SIMD multi-core machines. We evaluate its performance on different test circuits simulated on the Intel Xeon Phi and 2 other machines. Comparisons are presented of this software/hardware combination with reported performances of GPU and other multi-core simulation platforms. Comparisons are also given between the lock free architecture and a leading commercial simulator running on the same Intel hardware

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real tim

On testing VLSI chips for the big Viterbi decoder

A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, design for testability, which is included in the BVD VLSI chip design, is described in considerable detail. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for the testability feature

Efficient VLSI fault simulation

AbstractLet C be an acyclic Boolean circuit with n gates and ≤ n inputs. A circuit manufacture error may result in a “Stuck-at” (S-A) fault in a circuit identical to C except a gate v only outputs a fixed Boolean value. The S-A fault simulation problem for C is to determine all possible (S-A) faults which can be detected (i.e., faults circuit and C would give distinct outputs) by a given test pattern input.We consider the case where C is a tree (i.e., has fan-out 1.)We give a practical algorithm for fault simulation which simultaneously determines all detectable S-A faults for every gate in the circuit tree C. Our algorithm required only the evaluation of a circuit FS(C) which has ≤ 7n gates and has depth ≤ 3(d + 1), when d is the depth of C. Thus the sequential time of our algorithm is ≤ 7n, and the parallel time is ≤ 3(d + 1). Furthermore, FS(C) requires only a small constant factor more VLSI area than does the original circuit C.We also extend our results to get efficient methods for fault simulation of oblivious VLSI circuits with feedback lines

ATPG for Faults Analysis in VLSI Circuits Using Immune Genetic Algorithm

As design trends move toward nanometer technology, new Automatic Test Pattern Generation (ATPG)problems are merging. During design validation, the effect of crosstalk on reliability and performance cannot be ignored. So new ATPG Techniques has to be developed for testing crosstalk faults which affect the timing behaviour of circuits. In this paper, we present a Genetic Algorithm (GA) based test generation for crosstalk induced delay faults in VLSI circuits. The GA produces reduced test set which contains as few as possible test vector pairs, which detect as many as possible crosstalk delay faults. It uses a crosstalk delay fault simulator which computes the fitness of each test sequence. Tests are generated for ISCAS’85 and scan version of ISCAS’89 benchmark circuits. Experimental results demonstrate that GA gives higher fault coverage and compact test vectors for most of the benchmark circuits

VLSI Implementation of Deep Neural Network Using Integral Stochastic Computing

The hardware implementation of deep neural networks (DNNs) has recently received tremendous attention: many applications in fact require high-speed operations that suit a hardware implementation. However, numerous elements and complex interconnections are usually required, leading to a large area occupation and copious power consumption. Stochastic computing has shown promising results for low-power area-efficient hardware implementations, even though existing stochastic algorithms require long streams that cause long latencies. In this paper, we propose an integer form of stochastic computation and introduce some elementary circuits. We then propose an efficient implementation of a DNN based on integral stochastic computing. The proposed architecture has been implemented on a Virtex7 FPGA, resulting in 45% and 62% average reductions in area and latency compared to the best reported architecture in literature. We also synthesize the circuits in a 65 nm CMOS technology and we show that the proposed integral stochastic architecture results in up to 21% reduction in energy consumption compared to the binary radix implementation at the same misclassification rate. Due to fault-tolerant nature of stochastic architectures, we also consider a quasi-synchronous implementation which yields 33% reduction in energy consumption w.r.t. the binary radix implementation without any compromise on performance.Comment: 11 pages, 12 figure

Using genetic algorithms to generate test sequences for complex timed systems

The generation of test data for state based specifications is a computationally expensive process. This problem is magnified if we consider that time con- straints have to be taken into account to govern the transitions of the studied system. The main goal of this paper is to introduce a complete methodology, sup- ported by tools, that addresses this issue by represent- ing the test data generation problem as an optimisa- tion problem. We use heuristics to generate test cases. In order to assess the suitability of our approach we consider two different case studies: a communication protocol and the scientific application BIPS3D. We give details concerning how the test case generation problem can be presented as a search problem and automated. Genetic algorithms (GAs) and random search are used to generate test data and evaluate the approach. GAs outperform random search and seem to scale well as the problem size increases. It is worth to mention that we use a very simple fitness function that can be eas- ily adapted to be used with other evolutionary search techniques