65 research outputs found

    Test-Delivery Optimization in Manycore SOCs

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    We present two test-data delivery optimization algorithms for system-on-chip (SOC) designs with hundreds of cores, where a network-on-chip (NOC) is used as the interconnection fabric. We first present an e ective algorithm based on a subsetsum formulation to solve the test-delivery problem in NOCs with arbitrary topology that use dedicated routing. We further propose an algorithm for the important class of NOCs with grid topology and XY routing. The proposed algorithm is the first to co-optimize the number of access points, access-point locations, pin distribution to access points, and assignment of cores to access points for optimal test resource utilization of such NOCs. Testtime minimization is modeled as an NOC partitioning problem and solved with dynamic programming in polynomial time. Both the proposed methods yield high-quality results and are scalable to large SOCs with many cores. We present results on synthetic grid topology NOC-based SOCs constructed using cores from the ITC’02 benchmark, and demonstrate the scalability of our approach for two SOCs of the future, one with nearly 1,000 cores and the other with 1,600 cores. Test scheduling under power constraints is also incorporated in the optimization framework

    Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC

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    [[abstract]]Testing is regarded as one of the most difficult challenges for three-dimensional integrated circuits (3D ICs). In this paper, we want to optimize the cost of TAM (test access mechanism) and the test time for 3D IC. We used both greedy and simulated annealing algorithms to solve this optimization problem. We compare the results of two assumptions: soft-die mode and hard-die mode. The former assumes that the DfT of dies cannot be changed, while the latter assumes that the DfT of dies can be adjusted. The results show that thermal-aware cooptimization is essential to decide the optimal TAM and test schedule. Blindly adding TAM cannot reduce the total test cost due to temperature constraints. Another conclusion is that soft-die mode is more effective than hard-die mode to reduce the total test cost for 3D IC.[[notice]]補正完畢[[booktype]]電子

    Network-on-Chip

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    Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and mapping of applications onto NoC. It details the design and evaluation of different proposed NoC structures, low-power techniques, signal integrity and reliability issues, application mapping, testing, and future trends. Utilizing examples of chips that have been implemented in industry and academia, this text presents the full architectural design of components verified through implementation in industrial CAD tools. It describes NoC research and developments, incorporates theoretical proofs strengthening the analysis procedures, and includes algorithms used in NoC design and synthesis. In addition, it considers other upcoming NoC issues, such as low-power NoC design, signal integrity issues, NoC testing, reconfiguration, synthesis, and 3-D NoC design. This text comprises 12 chapters and covers: The evolution of NoC from SoC—its research and developmental challenges NoC protocols, elaborating flow control, available network topologies, routing mechanisms, fault tolerance, quality-of-service support, and the design of network interfaces The router design strategies followed in NoCs The evaluation mechanism of NoC architectures The application mapping strategies followed in NoCs Low-power design techniques specifically followed in NoCs The signal integrity and reliability issues of NoC The details of NoC testing strategies reported so far The problem of synthesizing application-specific NoCs Reconfigurable NoC design issues Direction of future research and development in the field of NoC Network-on-Chip: The Next Generation of System-on-Chip Integration covers the basic topics, technology, and future trends relevant to NoC-based design, and can be used by engineers, students, and researchers and other industry professionals interested in computer architecture, embedded systems, and parallel/distributed systems

    Communication synthesis of networks-on-chip (NoC)

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    The emergence of networks-on-chip (NoC) as the communication infrastructure solution for complex multi-core SoCs presents communication synthesis challenges. This dissertation addresses the design and run-time management aspects of communication synthesis. Design reuse and the infeasibility of Intellectual Property (IP) core interface redesign, requires the development of a Core-Network Interface (CNI) which allows them to communicate over the on-chip network. The absence of intelligence amongst the NoC components, entails the introduction of a CNI capable of not only providing basic packetization and depacketization, but also other essential services such as reliability, power management, reconguration and test support. A generic CNI architecture providing these services for NoCs is proposed and evaluated in this dissertation. Rising on-chip communication power costs and reliability concerns due to these, motivate the development of a peak power management technique that is both scalable to dierent NoCs and adaptable to varying trac congurations. A scalable and adaptable peak power management technique - SAPP - is proposed and demonstrated. Latency and throughput improvements observed with SAPP demonstrate its superiority over existing techniques. Increasing design complexity make prediction of design lifetimes dicult. Post SoC deployment, an on-line health monitoring scheme, is essential to maintain con- dence in the correct operation of on-chip cores. The rising design complexity and IP core test costs makes non-concurrent testing of the IP cores infeasible. An on-line scheme capable of managing IP core test in the presence of executing applications is essential. Such a scheme ensures application performance and system power budgets are eciently managed. This dissertation proposes Concurrent On-Line Test (COLT) for NoC-based systems and demonstrates how a robust implementation of COLT using a Test Infrastructure-IP (TI-IP) can be used to maintain condence in the correct operation of the SoC

    Reliable Design of Three-Dimensional Integrated Circuits

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    An efficient task mapping algorithm with power-aware optimization for network on chip

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    More and more cores are integrated onto a single chip to improve the performance and reduce the power consumption of CPU without the increased frequency. The cores are connected by lines and organized as a network, which is called network on chip (NOC) as the promising paradigm of the processor design. However, it is still a challenge to enhance performance with lower power consumption. The core issue is how to map the tasks to the different cores to take full advantages of the on-chip network. In this paper, we proposed a novel mapping algorithm with power-aware optimization for NOC. The traffic of the tasks will be analyzed. The tasks of the same application with high communication with the others will be mapped to the on-chip network as neighborhoods. And then the tasks of different applications are mapped to the cores step by step. The mapping of the tasks and the cores is computed at run-time dynamically and implement online. The experimental results showed that this proposed algorithm can reduce the power consumption in communication and the performance enhanced

    Center for Aeronautics and Space Information Sciences

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    This report summarizes the research done during 1991/92 under the Center for Aeronautics and Space Information Science (CASIS) program. The topics covered are computer architecture, networking, and neural nets

    Studies on Core-Based Testing of System-on-Chips Using Functional Bus and Network-on-Chip Interconnects

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    The tests of a complex system such as a microprocessor-based system-onchip (SoC) or a network-on-chip (NoC) are difficult and expensive. In this thesis, we propose three core-based test methods that reuse the existing functional interconnects-a flat bus, hierarchical buses of multiprocessor SoC's (MPSoC), and a N oC-in order to avoid the silicon area cost of a dedicated test access mechanism (TAM). However, the use of functional interconnects as functional TAM's introduces several new problems. During tests, the interconnects-including the bus arbitrator, the bus bridges, and the NoC routers-operate in the functional mode to transport the test stimuli and responses, while the core under tests (CUT) operate in the test mode. Second, the test data is transported to the CUT through the functional bus, and not directly to the test port. Therefore, special core test wrappers that can provide the necessary control signals required by the different functional interconnect are proposed. We developed two types of wrappers, one buffer-based wrapper for the bus-based systems and another pair of complementary wrappers for the NoCbased systems. Using the core test wrappers, we propose test scheduling schemes for the three functionally different types of interconnects. The test scheduling scheme for a flat bus is developed based on an efficient packet scheduling scheme that minimizes both the buffer sizes and the test time under a power constraint. The schedulingscheme is then extended to take advantage of the hierarchical bus architecture of the MPSoC systems. The third test scheduling scheme based on the bandwidth sharing is developed specifically for the NoC-based systems. The test scheduling is performed under the objective of co-optimizing the wrapper area cost and the resulting test application time using the two complementary NoC wrappers. For each of the proposed methodology for the three types of SoC architec .. ture, we conducted a thorough experimental evaluation in order to verify their effectiveness compared to other methods
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