Study of spin-scan imaging for outer planets missions

The constraints that are imposed on the Outer Planet Missions (OPM) imager design are of critical importance. Imager system modeling analyses define important parameters and systematic means for trade-offs applied to specific Jupiter orbiter missions. Possible image sequence plans for Jupiter missions are discussed in detail. Considered is a series of orbits that allow repeated near encounters with three of the Jovian satellites. The data handling involved in the image processing is discussed, and it is shown that only minimal processing is required for the majority of images for a Jupiter orbiter mission

Low-Capture-Power Test Generation for Scan-Based At-Speed Testing

Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0\u27s and 1\u27s to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield lossIEEE International Conference on Test, 2005, 8 November 2005, Austin, TX, US

Terrestrial applications: An intelligent Earth-sensing information system

For Abstract see A82-2214

Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests

As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test generation. We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which captures both large and small delay defects. Under this fault model, a path delay fault is detected only if all the individual transition faults along the path are detected by the same test. To reduce the complexity of test generation, sub-procedures with low complexity are applied before a complete branch-and-bound procedure. Next, we describe a method based on static timing analysis to select critical paths for test generation. Logic conditions that are necessary for detecting a path delay fault are considered to refine the accuracy of static timing analysis, using input necessary assignments. Input necessary assignments are input values that must be assigned to detect a fault. The method calculates more accurate path delays, selects paths that are critical during test application, and identifies undetectable path delay faults. These two methods are applicable to off-line test generation. For large circuits with high complexity and frequency, built-in test generation is a cost-effective method for delay testing. For a circuit that is embedded in a larger design, we developed a method for built-in generation of functional broadside tests to avoid excessive power dissipation during test application and the overtesting of delay faults, taking the functional constraints on the primary input sequences of the circuit into consideration. Functional broadside tests are scan-based two-pattern tests for delay faults that create functional operation conditions during test application. To avoid the potential fault coverage loss due to the exclusive use of functional broadside tests, we also developed an optional DFT method based on state holding to improve fault coverage. High delay fault coverage can be achieved by the developed method for benchmark circuits using simple hardware

Testing for delay defects utilizing test data compression techniques

textAs technology shrinks new types of defects are being discovered and new fault models are being created for those defects. Transition delay and path delay fault models are two such models that have been created, but they still fall short in that they are unable to obtain a high test coverage of smaller delay defects; these defects can cause functional behavior to fail and also indicate potential reliability issues. The first part of this dissertation addresses these problems by presenting an enhanced timing-based delay fault testing technique that incorporates the use of standard delay ATPG, along with timing information gathered from standard static timing analysis. Utilizing delay fault patterns typically increases the test data volume by 3-5X when compared to stuck-at patterns. Combined with the increase in test data volume associated with the increase in gate count that typically accompanies the miniaturization of technology, this adds up to a very large increase in test data volume that directly affect test time and thus the manufacturing cost. The second part of this dissertation presents a technique for improving test compression and reducing test data volume by using multiple expansion ratios while determining the configuration of the scan chains for each of the expansion ratios using a dependency analysis procedure that accounts for structural dependencies as well as free variable dependencies to improve the probability of detecting faults. Finally, this dissertation addresses the problem of unknown values (X’s) in the output response data corrupting the data and degrading the performance of the output response compactor and thus the overall amount of test compression. Four techniques are presented that focus on handling response data with large percentages of X’s. The first uses X-canceling MISR architecture that is based on deterministically observing scan cells, and the second is a hybrid approach that combines a simple X-masking scheme with the X-canceling MISR for further gains in test compression. The third and fourth techniques revolve around reiterative LFSR X-masking, which take advantage of LFSR-encoded masks that can be reused for multiple scan slices in novel ways.Electrical and Computer Engineerin

A Novel Rate Control Algorithm for Onboard Predictive Coding of Multispectral and Hyperspectral Images

Predictive coding is attractive for compression onboard of spacecrafts thanks to its low computational complexity, modest memory requirements and the ability to accurately control quality on a pixel-by-pixel basis. Traditionally, predictive compression focused on the lossless and near-lossless modes of operation where the maximum error can be bounded but the rate of the compressed image is variable. Rate control is considered a challenging problem for predictive encoders due to the dependencies between quantization and prediction in the feedback loop, and the lack of a signal representation that packs the signal's energy into few coefficients. In this paper, we show that it is possible to design a rate control scheme intended for onboard implementation. In particular, we propose a general framework to select quantizers in each spatial and spectral region of an image so as to achieve the desired target rate while minimizing distortion. The rate control algorithm allows to achieve lossy, near-lossless compression, and any in-between type of compression, e.g., lossy compression with a near-lossless constraint. While this framework is independent of the specific predictor used, in order to show its performance, in this paper we tailor it to the predictor adopted by the CCSDS-123 lossless compression standard, obtaining an extension that allows to perform lossless, near-lossless and lossy compression in a single package. We show that the rate controller has excellent performance in terms of accuracy in the output rate, rate-distortion characteristics and is extremely competitive with respect to state-of-the-art transform coding

In Situ Thermal Inspection of Automated Fiber Placement Operations for Tow and Ply Defect Detection

The advent of Automated Fiber Placement (AFP) systems have aided the rapid manufacturing of composite aerospace structures. One of the challenges that AFP systems pose is the uniformity of the deposited prepreg tape layers, which complicates detection of laps, gaps, overlaps and twists. The current detection method used in industry involves halting fabrication and performing a time consuming, visual inspection of each tape layer. Typical AFP systems use a quartz lamp to heat the base layer to make the surface tacky as it deposits another tape layer. The innovation proposed in this paper is to use the preheated base layer as a through-transmission heat source for inspecting the newly added tape layer in situ using a thermographic camera mounted on to the AFP hardware. Such a system would not only increase manufacturing throughput by reducing inspection times, but it would also aid in process development for new structural designs or material systems by providing data on as-built parts. To this end, a small thermal camera was mounted onto an AFP robotic research platform at NASA, and thermal data was collected during typical and experimental layup operations. The data was post processed to reveal defects such as tow overlap/gap, wrinkling, and peel-up. Defects that would have been impossible to detect visually were also discovered in the data, such as poor/loss of adhesion between plies and the effects of vacuum debulking. This paper will cover the results of our experiments, and the plans for future versions of this inspection system

Data compression in remote sensing applications

A survey of current data compression techniques which are being used to reduce the amount of data in remote sensing applications is provided. The survey aspect is far from complete, reflecting the substantial activity in this area. The purpose of the survey is more to exemplify the different approaches being taken rather than to provide an exhaustive list of the various proposed approaches