Diagnostic Applications for Micro-Synchrophasor Measurements

This report articulates and justifies the preliminary selection of diagnostic applications for data from micro-synchrophasors (µPMUs) in electric power distribution systems that will be further studied and developed within the scope of the three-year ARPA-e award titled Micro-synchrophasors for Distribution Systems

A new method of vibration analysis for the diagnosis of impeller in a centrifugal pump

Centrifugal pumps are widely used in many important industries such as power generation plants, chemical processes and petroleum refiners. The condition monitoring of centrifugal pumps is highly regarded by many researchers and users to minimize unexpected break-downs. Impellers are the core parts of pumps but often appear early damages due to flow cav-itation and erosion. This paper investigates a new approach to monitoring the conditions of impellers using surface vibration with advanced signal analysis. As overall vibration respons-es contain high level of broadband noises due to cavities and turbulences, noise reduction is critical to develop reliable and effective features. However, considering the modulation effect between rotating shaft and blade passing components, a modulation signal bispectrum (MSB) method is employed to extract these deterministic characteristics of modulations, which is different from previous researches in that broadband random sources are often used. Experi-mental results show that the diagnostic features developed by MSB allow impellers with inlet vane damages and exit vane faults to be identified under different operating conditions

Application of multiple resistive superconducting fault-current limiters for fast fault detection in highly interconnected distribution systems

Superconducting fault-current limiters (SFCLs) offer several benefits for electrical distribution systems, especially with increasing distributed generation and the requirements for better network reliability and efficiency. This paper examines the use of multiple SFCLs in a protection scheme to locate faulted circuits, using an approach which is radically different from typical proposed applications of fault current limitation, and also which does not require communications. The technique, referred to as “current division discrimination” (CDD), is based upon the intrinsic inverse current-time characteristics of resistive SFCLs, which ensures that only the SFCLs closest to a fault operate. CDD is especially suited to meshed networks and particularly when the network topology may change over time. Meshed networks are expensive and complex to protect using conventional methods. Simulation results with multiple SFCLs, using a thermal-electric superconductor model, confirm that CDD operates as expected. Nevertheless, CDD has limitations, which are examined in this paper. The SFCLs must be appropriately rated for the maximum system fault level, although some variation in actual fault level can be tolerated. For correct coordination between SFCLs, each bus must have at least three circuits that can supply fault current, and the SFCLs should have identical current-time characteristics

The Grid Dependence of Well Inflow Performance in Reservoir Simulation

Imperial Users onl

Model-Based Fault Detection and Identification for Prognostics of Electromechanical Actuators Using Genetic Algorithms

Traditional hydraulic servomechanisms for aircraft control surfaces are being gradually replaced by newer technologies, such as Electro-Mechanical Actuators (EMAs). Since field data about reliability of EMAs are not available due to their recent adoption, their failure modes are not fully understood yet; therefore, an effective prognostic tool could help detect incipient failures of the flight control system, in order to properly schedule maintenance interventions and replacement of the actuators. A twofold benefit would be achieved: Safety would be improved by avoiding the aircraft to fly with damaged components, and replacement of still functional components would be prevented, reducing maintenance costs. However, EMA prognostic presents a challenge due to the complexity and to the multi-disciplinary nature of the monitored systems. We propose a model-based fault detection and isolation (FDI) method, employing a Genetic Algorithm (GA) to identify failure precursors before the performance of the system starts being compromised. Four different failure modes are considered: dry friction, backlash, partial coil short circuit, and controller gain drift. The method presented in this work is able to deal with the challenge leveraging the system design knowledge in a more effective way than data-driven strategies, and requires less experimental data. To test the proposed tool, a simulated test rig was developed. Two numerical models of the EMA were implemented with different level of detail: A high fidelity model provided the data of the faulty actuator to be analyzed, while a simpler one, computationally lighter but accurate enough to simulate the considered fault modes, was executed iteratively by the GA. The results showed good robustness and precision, allowing the early identification of a system malfunctioning with few false positives or missed failures.https://susy.mdpi

Infrastructures and Algorithms for Testable and Dependable Systems-on-a-Chip

Every new node of semiconductor technologies provides further miniaturization and higher performances, increasing the number of advanced functions that electronic products can offer. Silicon area is now so cheap that industries can integrate in a single chip usually referred to as System-on-Chip (SoC), all the components and functions that historically were placed on a hardware board. Although adding such advanced functionality can benefit users, the manufacturing process is becoming finer and denser, making chips more susceptible to defects. Today’s very deep-submicron semiconductor technologies (0.13 micron and below) have reached susceptibility levels that put conventional semiconductor manufacturing at an impasse. Being able to rapidly develop, manufacture, test, diagnose and verify such complex new chips and products is crucial for the continued success of our economy at-large. This trend is expected to continue at least for the next ten years making possible the design and production of 100 million transistor chips. To speed up the research, the National Technology Roadmap for Semiconductors identified in 1997 a number of major hurdles to be overcome. Some of these hurdles are related to test and dependability. Test is one of the most critical tasks in the semiconductor production process where Integrated Circuits (ICs) are tested several times starting from the wafer probing to the end of production test. Test is not only necessary to assure fault free devices but it also plays a key role in analyzing defects in the manufacturing process. This last point has high relevance since increasing time-to-market pressure on semiconductor fabrication often forces foundries to start volume production on a given semiconductor technology node before reaching the defect densities, and hence yield levels, traditionally obtained at that stage. The feedback derived from test is the only way to analyze and isolate many of the defects in today’s processes and to increase process’s yield. With the increasing need of high quality electronic products, at each new physical assembly level, such as board and system assembly, test is used for debugging, diagnosing and repairing the sub-assemblies in their new environment. Similarly, the increasing reliability, availability and serviceability requirements, lead the users of high-end products performing periodic tests in the field throughout the full life cycle. To allow advancements in each one of the above scaling trends, fundamental changes are expected to emerge in different Integrated Circuits (ICs) realization disciplines such as IC design, packaging and silicon process. These changes have a direct impact on test methods, tools and equipment. Conventional test equipment and methodologies will be inadequate to assure high quality levels. On chip specialized block dedicated to test, usually referred to as Infrastructure IP (Intellectual Property), need to be developed and included in the new complex designs to assure that new chips will be adequately tested, diagnosed, measured, debugged and even sometimes repaired. In this thesis, some of the scaling trends in designing new complex SoCs will be analyzed one at a time, observing their implications on test and identifying the key hurdles/challenges to be addressed. The goal of the remaining of the thesis is the presentation of possible solutions. It is not sufficient to address just one of the challenges; all must be met at the same time to fulfill the market requirements

Practical applications of multi-agent systems in electric power systems

The transformation of energy networks from passive to active systems requires the embedding of intelligence within the network. One suitable approach to integrating distributed intelligent systems is multi-agent systems technology, where components of functionality run as autonomous agents capable of interaction through messaging. This provides loose coupling between components that can benefit the complex systems envisioned for the smart grid. This paper reviews the key milestones of demonstrated agent systems in the power industry and considers which aspects of agent design must still be addressed for widespread application of agent technology to occur

A two-level structure for advanced space power system automation

The tasks to be carried out during the three-year project period are: (1) performing extensive simulation using existing mathematical models to build a specific knowledge base of the operating characteristics of space power systems; (2) carrying out the necessary basic research on hierarchical control structures, real-time quantitative algorithms, and decision-theoretic procedures; (3) developing a two-level automation scheme for fault detection and diagnosis, maintenance and restoration scheduling, and load management; and (4) testing and demonstration. The outlines of the proposed system structure that served as a master plan for this project, work accomplished, concluding remarks, and ideas for future work are also addressed