16,091 research outputs found

    Techniques for the Fast Simulation of Models of Highly dependable Systems

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    With the ever-increasing complexity and requirements of highly dependable systems, their evaluation during design and operation is becoming more crucial. Realistic models of such systems are often not amenable to analysis using conventional analytic or numerical methods. Therefore, analysts and designers turn to simulation to evaluate these models. However, accurate estimation of dependability measures of these models requires that the simulation frequently observes system failures, which are rare events in highly dependable systems. This renders ordinary Simulation impractical for evaluating such systems. To overcome this problem, simulation techniques based on importance sampling have been developed, and are very effective in certain settings. When importance sampling works well, simulation run lengths can be reduced by several orders of magnitude when estimating transient as well as steady-state dependability measures. This paper reviews some of the importance-sampling techniques that have been developed in recent years to estimate dependability measures efficiently in Markov and nonMarkov models of highly dependable system

    Rare event simulation for highly dependable systems with fast repairs

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    Stochastic model checking has been used recently to assess, among others, dependability measures for a variety of systems. However, the employed numerical methods, as, e.g., supported by model checking tools such as PRISM and MRMC, suffer from the state-space explosion problem. The main alternative is statistical model checking, which uses standard simulation, but this performs poorly when small probabilities need to be estimated. Therefore, we propose a method based on importance sampling to speed up the simulation process in cases where the failure probabilities are small due to the high speed of the system's repair units. This setting arises naturally in Markovian models of highly dependable systems. We show that our method compares favourably to standard simulation, to existing importance sampling techniques and to the numerical techniques of PRISM

    Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration

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    Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC/IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time

    Cross-layer system reliability assessment framework for hardware faults

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    System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft

    A method for analyzing the performance aspects of the fault-tolerance mechanisms in FDDI

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    The ability of error recovery mechanisms to make the Fiber Distributed Data Interface (FDDI) satisfy real-time performance constraints in the presence of errors is analyzed. A complicating factor in these analyses is the rarity of the error occurrences, which makes direct simulation unattractive. Therefore, a fast simulation technique, called injection simulation, which makes it possible to analyze the performance of FDDI, including its fault tolerance behavior, was developed. The implementation of injection simulation for polling models of FDDI is discussed, along with simulation result

    Fast simulation for slow paths in Markov models

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    Inspired by applications in the context of stochastic model checking, we are interested in using simulation for estimating the probability of reaching a specific state in a Markov chain after a large amount of time tau has passed. Since this is a rare event, we apply importance sampling. We derive approximate expressions for the sojourn times on a given path in a Markov chain conditional on the sum exceeding tau, and use those expressions to construct a change of measure. Numerical examples show that this change of measure performs very well, leading to high precision estimates in short simulation times
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