Quantum-dot Cellular Automata: Review Paper

Quantum-dot Cellular Automata (QCA) is one of the most important discoveries that will be the successful alternative for CMOS technology in the near future. An important feature of this technique, which has attracted the attention of many researchers, is that it is characterized by its low energy consumption, high speed and small size compared with CMOS.  Inverter and majority gate are the basic building blocks for QCA circuits where it can design the most logical circuit using these gates with help of QCA wire. Due to the lack of availability of review papers, this paper will be a destination for many people who are interested in the QCA field and to know how it works and why it had taken lots of attention recentl

Design of Testable ripple carry adder in Quantum Dot Cellular AutomataÂ

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Power Droop Reduction In Logic BIST By Scan Chain Reordering

Significant peak power (PP), thus power droop (PD), during test is a serious concern for modern, complex ICs. In fact, the PD originated during the application of test vectors may produce a delay effect on the circuit under test signal transitions. This event may be erroneously recognized as presence of a delay fault, with consequent generation of an erroneous test fail, thus increasing yield loss. Several solutions have been proposed in the literature to reduce the PD during test of combinational ICs, while fewer approaches exist for sequential ICs. In this paper, we propose a novel approach to reduce peak power/power droop during test of sequential circuits with scan-based Logic BIST. In particular, our approach reduces the switching activity of the scan chains between following capture cycles. This is achieved by an original generation and arrangement of test vectors. The proposed approach presents a very low impact on fault coverage and test time

LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real tim

Generalized disjunction decomposition for evolvable hardware

Evolvable hardware (EHW) refers to self-reconfiguration hardware design, where the configuration is under the control of an evolutionary algorithm (EA). One of the main difficulties in using EHW to solve real-world problems is scalability, which limits the size of the circuit that may be evolved. This paper outlines a new type of decomposition strategy for EHW, the “generalized disjunction decomposition” (GDD), which allows the evolution of large circuits. The proposed method has been extensively tested, not only with multipliers and parity bit problems traditionally used in the EHW community, but also with logic circuits taken from the Microelectronics Center of North Carolina (MCNC) benchmark library and randomly generated circuits. In order to achieve statistically relevant results, each analyzed logic circuit has been evolved 100 times, and the average of these results is presented and compared with other EHW techniques. This approach is necessary because of the probabilistic nature of EA; the same logic circuit may not be solved in the same way if tested several times. The proposed method has been examined in an extrinsic EHW system using the$(1 + lambda)$evolution strategy. The results obtained demonstrate that GDD significantly improves the evolution of logic circuits in terms of the number of generations, reduces computational time as it is able to reduce the required time for a single iteration of the EA, and enables the evolution of larger circuits never before evolved. In addition to the proposed method, a short overview of EHW systems together with the most recent applications in electrical circuit design is provided

BIST test pattern generator based on partitioning circuit inputs

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.Includes bibliographical references (leaves 33-35).by Clara Sánchez.M.Eng

An asynchronous instruction length decoder

Journal ArticleAbstract-This paper describes an investigation of potential advantages and pitfalls of applying an asynchronous design methodology to an advanced microprocessor architecture. A prototype complex instruction set length decoding and steering unit was implemented using self-timed circuits. [The Revolving Asynchronous Pentium® Processor Instruction Decoder (RAPPID) design implemented the complete Pentium II® 32-bit MMX instruction set.] The prototype chip was fabricated on a 0.25-CMOS process and tested successfully. Results show significant advantages-in particular, performance of 2.5-4.5 instructions per nanosecond-with manageable risks using this design technology. The prototype achieves three times the throughput and half the latency, dissipating only half the power and requiring about the same area as the fastest commercial 400-MHz clocked circuit fabricated on the same process