315 research outputs found

    Self-Healing Partial Reconfiguration of an FPGA

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    The goal of this project, sponsored by General Dynamics, is to create an FPGA-based system capable of detecting and gracefully recovering from errors without compromising system functionality. Previous research developed a prototype for partial reconfiguration, but a major limitation was the need for a PC to partially reprogram the FPGA. By implementing a method of self-reconfiguration and developing a system using triple module redundancy, the FPGA can locate errors and partially self-reconfigure the corrupted areas while maintaining valid system outputs

    A Primer on Architectural Level Fault Tolerance

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    This paper introduces the fundamental concepts of fault tolerant computing. Key topics covered are voting, fault detection, clock synchronization, Byzantine Agreement, diagnosis, and reliability analysis. Low level mechanisms such as Hamming codes or low level communications protocols are not covered. The paper is tutorial in nature and does not cover any topic in detail. The focus is on rationale and approach rather than detailed exposition

    Virtual Runtime Application Partitions for Resource Management in Massively Parallel Architectures

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    This thesis presents a novel design paradigm, called Virtual Runtime Application Partitions (VRAP), to judiciously utilize the on-chip resources. As the dark silicon era approaches, where the power considerations will allow only a fraction chip to be powered on, judicious resource management will become a key consideration in future designs. Most of the works on resource management treat only the physical components (i.e. computation, communication, and memory blocks) as resources and manipulate the component to application mapping to optimize various parameters (e.g. energy efficiency). To further enhance the optimization potential, in addition to the physical resources we propose to manipulate abstract resources (i.e. voltage/frequency operating point, the fault-tolerance strength, the degree of parallelism, and the configuration architecture). The proposed framework (i.e. VRAP) encapsulates methods, algorithms, and hardware blocks to provide each application with the abstract resources tailored to its needs. To test the efficacy of this concept, we have developed three distinct self adaptive environments: (i) Private Operating Environment (POE), (ii) Private Reliability Environment (PRE), and (iii) Private Configuration Environment (PCE) that collectively ensure that each application meets its deadlines using minimal platform resources. In this work several novel architectural enhancements, algorithms and policies are presented to realize the virtual runtime application partitions efficiently. Considering the future design trends, we have chosen Coarse Grained Reconfigurable Architectures (CGRAs) and Network on Chips (NoCs) to test the feasibility of our approach. Specifically, we have chosen Dynamically Reconfigurable Resource Array (DRRA) and McNoC as the representative CGRA and NoC platforms. The proposed techniques are compared and evaluated using a variety of quantitative experiments. Synthesis and simulation results demonstrate VRAP significantly enhances the energy and power efficiency compared to state of the art.Siirretty Doriast

    Fault-tolerant computer study

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    A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed

    Autonomously Reconfigurable Artificial Neural Network on a Chip

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    Artificial neural network (ANN), an established bio-inspired computing paradigm, has proved very effective in a variety of real-world problems and particularly useful for various emerging biomedical applications using specialized ANN hardware. Unfortunately, these ANN-based systems are increasingly vulnerable to both transient and permanent faults due to unrelenting advances in CMOS technology scaling, which sometimes can be catastrophic. The considerable resource and energy consumption and the lack of dynamic adaptability make conventional fault-tolerant techniques unsuitable for future portable medical solutions. Inspired by the self-healing and self-recovery mechanisms of human nervous system, this research seeks to address reliability issues of ANN-based hardware by proposing an Autonomously Reconfigurable Artificial Neural Network (ARANN) architectural framework. Leveraging the homogeneous structural characteristics of neural networks, ARANN is capable of adapting its structures and operations, both algorithmically and microarchitecturally, to react to unexpected neuron failures. Specifically, we propose three key techniques --- Distributed ANN, Decoupled Virtual-to-Physical Neuron Mapping, and Dual-Layer Synchronization --- to achieve cost-effective structural adaptation and ensure accurate system recovery. Moreover, an ARANN-enabled self-optimizing workflow is presented to adaptively explore a "Pareto-optimal" neural network structure for a given application, on the fly. Implemented and demonstrated on a Virtex-5 FPGA, ARANN can cover and adapt 93% chip area (neurons) with less than 1% chip overhead and O(n) reconfiguration latency. A detailed performance analysis has been completed based on various recovery scenarios

    Data flow models for fault-tolerant computation

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    Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1983.MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERINGBibliography: p. 82-83.by Gregory M. Papadopoulos.M.S

    High-level synthesis of triple modular redundant FPGA circuits with energy efficient error recovery mechanisms

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    There is a growing interest in deploying commercial SRAM-based Field Programmable Gate Array (FPGA) circuits in space due to their low cost, reconfigurability, high logic capacity and rich I/O interfaces. However, their configuration memory (CM) is vulnerable to ionising radiation which raises the need for effective fault-tolerant design techniques. This thesis provides the following contributions to mitigate the negative effects of soft errors in SRAM FPGA circuits. Triple Modular Redundancy (TMR) with periodic CM scrubbing or Module-based CM error recovery (MER) are popular techniques for mitigating soft errors in FPGA circuits. However, this thesis shows that MER does not recover CM soft errors in logic instantiated outside the reconfigurable regions of TMR modules. To address this limitation, a hybrid error recovery mechanism, namely FMER, is proposed. FMER uses selective periodic scrubbing and MER to recover CM soft errors inside and outside the reconfigurable regions of TMR modules, respectively. Experimental results indicate that TMR circuits with FMER achieve higher dependability with less energy consumption than those using periodic scrubbing or MER alone. An imperative component of MER and FMER is the reconfiguration control network (RCN) that transfers the minority reports of TMR components, i.e., which, if any, TMR module needs recovery, to the FPGA's reconfiguration controller (RC). Although several reliable RCs have been proposed, a study of reliable RCNs has not been previously reported. This thesis fills this research gap, by proposing a technique that transfers the circuit's minority reports to the RC via the configuration-layer of the FPGA. This reduces the resource utilisation of the RCN and therefore its failure rate. Results show that the proposed RCN achieves higher reliability than alternative RCN architectures reported in the literature. The last contribution of this thesis is a high-level synthesis (HLS) tool, namely TLegUp, developed within the LegUp HLS framework. TLegUp triplicates Xilinx 7-series FPGA circuits during HLS rather than during the register-transfer level pre- or post-synthesis flow stage, as existing computer-aided design tools do. Results show that TLegUp can generate non-partitioned TMR circuits with 500x less soft error sensitivity than non-triplicated functional equivalent baseline circuits, while utilising 3-4x more resources and having 11% lower frequency

    New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs

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    Tesis por compendio[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances to fulfill such functionality requirements, while keeping power and budget low. In this scenario, industry is struggling to provide a technology which meets all the performance, power and price specifications, at the cost of an increased vulnerability to several types of known faults or the appearance of new ones. To provide a solution for the new and growing faults in the systems, designers have been using traditional techniques from safety-critical applications, which offer in general suboptimal results. In fact, modern embedded architectures offer the possibility of optimizing the dependability properties by enabling the interaction of hardware, firmware and software levels in the process. However, that point is not yet successfully achieved. Advances in every level towards that direction are much needed if flexible, robust, resilient and cost effective fault tolerance is desired. The work presented here focuses on the hardware level, with the background consideration of a potential integration into a holistic approach. The efforts in this thesis have focused several issues: (i) to introduce additional fault models as required for adequate representativity of physical effects blooming in modern manufacturing technologies, (ii) to provide tools and methods to efficiently inject both the proposed models and classical ones, (iii) to analyze the optimum method for assessing the robustness of the systems by using extensive fault injection and later correlation with higher level layers in an effort to cut development time and cost, (iv) to provide new detection methodologies to cope with challenges modeled by proposed fault models, (v) to propose mitigation strategies focused towards tackling such new threat scenarios and (vi) to devise an automated methodology for the deployment of many fault tolerance mechanisms in a systematic robust way. The outcomes of the thesis constitute a suite of tools and methods to help the designer of critical systems in his task to develop robust, validated, and on-time designs tailored to his application.[ES] La relevancia que la electrónica adquiere en la seguridad de los productos ha crecido inexorablemente, puesto que cada vez ésta copa una mayor influencia en la funcionalidad de los mismos. Pero, por supuesto, este hecho viene acompañado de una necesidad constante de mayores prestaciones para cumplir con los requerimientos funcionales, al tiempo que se mantienen los costes y el consumo en unos niveles reducidos. En este escenario, la industria está realizando esfuerzos para proveer una tecnología que cumpla con todas las especificaciones de potencia, consumo y precio, a costa de un incremento en la vulnerabilidad a múltiples tipos de fallos conocidos o la introducción de nuevos. Para ofrecer una solución a los fallos nuevos y crecientes en los sistemas, los diseñadores han recurrido a técnicas tradicionalmente asociadas a sistemas críticos para la seguridad, que ofrecen en general resultados sub-óptimos. De hecho, las arquitecturas empotradas modernas ofrecen la posibilidad de optimizar las propiedades de confiabilidad al habilitar la interacción de los niveles de hardware, firmware y software en el proceso. No obstante, ese punto no está resulto todavía. Se necesitan avances en todos los niveles en la mencionada dirección para poder alcanzar los objetivos de una tolerancia a fallos flexible, robusta, resiliente y a bajo coste. El trabajo presentado aquí se centra en el nivel de hardware, con la consideración de fondo de una potencial integración en una estrategia holística. Los esfuerzos de esta tesis se han centrado en los siguientes aspectos: (i) la introducción de modelos de fallo adicionales requeridos para la representación adecuada de efectos físicos surgentes en las tecnologías de manufactura actuales, (ii) la provisión de herramientas y métodos para la inyección eficiente de los modelos propuestos y de los clásicos, (iii) el análisis del método óptimo para estudiar la robustez de sistemas mediante el uso de inyección de fallos extensiva, y la posterior correlación con capas de más alto nivel en un esfuerzo por recortar el tiempo y coste de desarrollo, (iv) la provisión de nuevos métodos de detección para cubrir los retos planteados por los modelos de fallo propuestos, (v) la propuesta de estrategias de mitigación enfocadas hacia el tratamiento de dichos escenarios de amenaza y (vi) la introducción de una metodología automatizada de despliegue de diversos mecanismos de tolerancia a fallos de forma robusta y sistemática. Los resultados de la presente tesis constituyen un conjunto de herramientas y métodos para ayudar al diseñador de sistemas críticos en su tarea de desarrollo de diseños robustos, validados y en tiempo adaptados a su aplicación.[CA] La rellevància que l'electrònica adquireix en la seguretat dels productes ha crescut inexorablement, puix cada volta més aquesta abasta una major influència en la funcionalitat dels mateixos. Però, per descomptat, aquest fet ve acompanyat d'un constant necessitat de majors prestacions per acomplir els requeriments funcionals, mentre es mantenen els costos i consums en uns nivells reduïts. Donat aquest escenari, la indústria està fent esforços per proveir una tecnologia que complisca amb totes les especificacions de potència, consum i preu, tot a costa d'un increment en la vulnerabilitat a diversos tipus de fallades conegudes, i a la introducció de nous tipus. Per oferir una solució a les noves i creixents fallades als sistemes, els dissenyadors han recorregut a tècniques tradicionalment associades a sistemes crítics per a la seguretat, que en general oferixen resultats sub-òptims. De fet, les arquitectures empotrades modernes oferixen la possibilitat d'optimitzar les propietats de confiabilitat en habilitar la interacció dels nivells de hardware, firmware i software en el procés. Tot i això eixe punt no està resolt encara. Es necessiten avanços a tots els nivells en l'esmentada direcció per poder assolir els objectius d'una tolerància a fallades flexible, robusta, resilient i a baix cost. El treball ací presentat se centra en el nivell de hardware, amb la consideració de fons d'una potencial integració en una estratègia holística. Els esforços d'esta tesi s'han centrat en els següents aspectes: (i) la introducció de models de fallada addicionals requerits per a la representació adequada d'efectes físics que apareixen en les tecnologies de fabricació actuals, (ii) la provisió de ferramentes i mètodes per a la injecció eficient del models proposats i dels clàssics, (iii) l'anàlisi del mètode òptim per estudiar la robustesa de sistemes mitjançant l'ús d'injecció de fallades extensiva, i la posterior correlació amb capes de més alt nivell en un esforç per retallar el temps i cost de desenvolupament, (iv) la provisió de nous mètodes de detecció per cobrir els reptes plantejats pels models de fallades proposats, (v) la proposta d'estratègies de mitigació enfocades cap al tractament dels esmentats escenaris d'amenaça i (vi) la introducció d'una metodologia automatitzada de desplegament de diversos mecanismes de tolerància a fallades de forma robusta i sistemàtica. Els resultats de la present tesi constitueixen un conjunt de ferramentes i mètodes per ajudar el dissenyador de sistemes crítics en la seua tasca de desenvolupament de dissenys robustos, validats i a temps adaptats a la seua aplicació.Espinosa García, J. (2016). New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/73146TESISCompendi

    Techniques for the realization of ultra- reliable spaceborne computer Final report

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    Bibliography and new techniques for use of error correction and redundancy to improve reliability of spaceborne computer
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