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Design of circuits for sub-threshold voltages : implementation of adders
The demand and the need for low-power circuits is an ever increasing trend particularly due to the added overhead of design of efficient cooling systems or more sophisticated and expensive packaging techniques. In most new emerging applications that demand low power consumption such as biomedical implants, wearable devices, micro-sensor nodes and countless others, energy efficiency emphasis far supersedes the traditional focus on improving the speed. Such energy constrained systems can be operated at considerably reduced performance levels in order to save power and extend their battery lifetimes. Sub-Threshold design has proven useful for ultra-low power and low energy applications since the dynamic power is reduced quadratically with supply voltage; the least energy operation usually takes place in the sub-threshold region. This work provides a comprehensive analysis of the CMOS standard cell characterization in the sub-threshold region, layout, logical library extraction, optimization and top-level implementation of 2 of the parallel prefix adders of different word sizes in 45nm technology with comparison between the sub-threshold region and strong inversion regions of operation. The analysis is done on PPA: power (energy), performance and area, the common metrics for any chip design. The switching activities of the circuits were captured using dynamic gate level simulation to perform the time based peak power analysis. Static timing analysis was performed to estimate the delay of the critical path for each circuit. The analysis and results presented in this report will be helpful in choosing a specific adder configuration for an integrated circuit based on the constraints related to its application.Electrical and Computer Engineerin
Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations
We present the detailed results of the application of mathematical optimization algorithms to transistor sizing in a full-adder cell design, to obtain the maximum expected fabrication yield. The approach takes into account all the fabrication process parameter variations specified in an industrial PDK, in addition to operating condition range and NBTI aging. The final design solutions present transistor sizing, which depart from intuitive transistor sizing criteria and show dramatic yield improvements, which have been verified by Monte Carlo SPICE analysis
An Experimental Study of Reduced-Voltage Operation in Modern FPGAs for Neural Network Acceleration
We empirically evaluate an undervolting technique, i.e., underscaling the
circuit supply voltage below the nominal level, to improve the power-efficiency
of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable
Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing
faults due to excessive circuit latency increase. We evaluate the
reliability-power trade-off for such accelerators. Specifically, we
experimentally study the reduced-voltage operation of multiple components of
real FPGAs, characterize the corresponding reliability behavior of CNN
accelerators, propose techniques to minimize the drawbacks of reduced-voltage
operation, and combine undervolting with architectural CNN optimization
techniques, i.e., quantization and pruning. We investigate the effect of
environmental temperature on the reliability-power trade-off of such
accelerators. We perform experiments on three identical samples of modern
Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification
CNN benchmarks. This approach allows us to study the effects of our
undervolting technique for both software and hardware variability. We achieve
more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain
is the result of eliminating the voltage guardband region, i.e., the safe
voltage region below the nominal level that is set by FPGA vendor to ensure
correct functionality in worst-case environmental and circuit conditions. 43%
of the power-efficiency gain is due to further undervolting below the
guardband, which comes at the cost of accuracy loss in the CNN accelerator. We
evaluate an effective frequency underscaling technique that prevents this
accuracy loss, and find that it reduces the power-efficiency gain from 43% to
25%.Comment: To appear at the DSN 2020 conferenc
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