Design And Simulation Of Cmos-Based Bandgap Reference Voltage With Compensation Circuit Using 0.18 Μm Process Technology

Voltage reference circuit is important in electronic world nowadays. A CMOS based bandgap reference (BGR) circuit is preferred due to its size is smaller and consume less power. However, the drawback is the reference voltage variation of CMOS based BGR circuit is big in wide range of temperature, thus the temperature coefficient of it is high. Hence, an improved version of piecewise curvature-corrected Bandgap voltage reference circuit which has low voltage variation in wide range of temperature is introduced in this project to overcome the problem mentioned above. The BGR circuit is designed using CMOS compatible process in 0.18μm CMOS process technology and simulated by using Cadence tool. The proposed piecewise curvature-corrected BGR operate properly with output voltage of 558.6 mV to 558.3 mV by varying the voltage supply 1.4 V to 3.3 V at 27°C and the line regulation is 0.016% . Besides that, the best temperature coefficient obtained is 9.2 ppm/°C in the temperature range of -25°C to 150°C at 1.8 V. The PSSR of the proposed circuit is -69.91 dB at frequency less 10 kHz. The layout design of the proposed circuit is done by using Silterra 0.18 μm standard CMOS process and total die area is 0.0175 mm2 and temperature coefficient obtained in post layout simulation is 11.66ppm/°C. In short, it is found that the proposed design of BGR circuit is able to achieve high temperature range and relatively low voltage variation

Bandgap Reference Design at the 14-Nanometer FinFET Node

As supply voltages continue to decrease, it becomes harder to ensure that the voltage drop across a diode-connected BJT is sufficient to conduct current without sacrificing die area. One such solution to this potential problem is the diode-connected MOSFET operating in weak inversion. In addition to conducting appreciable current at voltages significantly lower than the power supply, the diode-connected MOSFET reduces the total area for the bandgap implementation. Reference voltage variations across Monte Carlo perturbations are more pronounced as the variation of process parameters are exponentially affected in subthreshold conduction. In order for this proposed solution to be feasible, a design methodology was introduced to mitigate the effects of process variation. A 14 nm bandgap reference was created and simulated across Monte Carlo perturbations for 100 runs at nominal supply voltage and 10% variation of the power supply in either direction. The best case reference voltage was found and used to verify the proposed resistive network solution. The average temperature coefficient was measured to be 66.46 ppm/◦C and the voltage adjustment range was found to be 204.1 mV. The two FinFET subthreshold diodes consume approximately 2.8% of the area of the BJT diode equivalent. Utilizing an appropriate process control technique, subthreshold bandgap references have the potential to overtake traditional BJT-based bandgap architectures in low-power, limited-area applications

Near-Zero-Power Temperature Sensing via Tunneling Currents Through Complementary Metal-Oxide-Semiconductor Transistors.

Temperature sensors are routinely found in devices used to monitor the environment, the human body, industrial equipment, and beyond. In many such applications, the energy available from batteries or the power available from energy harvesters is extremely limited due to limited available volume, and thus the power consumption of sensing should be minimized in order to maximize operational lifetime. Here we present a new method to transduce and digitize temperature at very low power levels. Specifically, two pA current references are generated via small tunneling-current metal-oxide-semiconductor field effect transistors (MOSFETs) that are independent and proportional to temperature, respectively, which are then used to charge digitally-controllable banks of metal-insulator-metal (MIM) capacitors that, via a discrete-time feedback loop that equalizes charging time, digitize temperature directly. The proposed temperature sensor was integrated into a silicon microchip and occupied 0.15 mm2 of area. Four tested microchips were measured to consume only 113 pW with a resolution of 0.21 °C and an inaccuracy of ±1.65 °C, which represents a 628× reduction in power compared to prior-art without a significant reduction in performance

Nanopower CMOS transponders for UHF and microwave RFID systems

At first, we present an analysis and a discussion of the design options and tradeoffs for a passive microwave transponder. We derive a set of criteria for the optimization of the voltage multiplier, the power matching network and the backscatter modulator in order to optimize the operating range. In order to match the strictly power requirements, the communication protocol between transponder and reader has been chosen in a convenient way, in order to make the architecture of the passive transponder very simple and then ultra-low-power. From the circuital point of view, the digital section has been implemented in subthreshold CMOS logic with very low supply voltage and clock frequency. We present different solutions to supply power to the transponder, in order to keep the power consumption in the deep sub-µW regime and to drastically reduce the huge sensitivity of the subthreshold logic to temperature and process variations. Moreover, a low-voltage and low-power EEPROM in a standard CMOS process has been implemented. Finally, we have presented the implementation of the entire passive transponder, operating in the UHF or microwave frequency range

Integrated Circuits for Programming Flash Memories in Portable Applications

Smart devices such as smart grids, smart home devices, etc. are infrastructure systems that connect the world around us more than before. These devices can communicate with each other and help us manage our environment. This concept is called the Internet of Things (IoT). Not many smart nodes exist that are both low-power and programmable. Floating-gate (FG) transistors could be used to create adaptive sensor nodes by providing programmable bias currents. FG transistors are mostly used in digital applications like Flash memories. However, FG transistors can be used in analog applications, too. Unfortunately, due to the expensive infrastructure required for programming these transistors, they have not been economical to be used in portable applications. In this work, we present low-power approaches to programming FG transistors which make them a good candidate to be employed in future wireless sensor nodes and portable systems. First, we focus on the design of low-power circuits which can be used in programming the FG transistors such as high-voltage charge pumps, low-drop-out regulators, and voltage reference cells. Then, to achieve the goal of reducing the power consumption in programmable sensor nodes and reducing the programming infrastructure, we present a method to program FG transistors using negative voltages. We also present charge-pump structures to generate the necessary negative voltages for programming in this new configuration

A 1.8-V 4-ppm oC Reference Current with Process and Temperature

[[abstract]]A current reference generator with a proposed compensation circuit against temperature variation is presented. The current reference generator provides a reference current of 10 uA with temperature coefficient (TC) of 4 ppm/°C under temperature range from -40 to 125°C. The circuit occupies 0.008 mm2 in a 180-nm standard CMOS process.[[conferencetype]]國際[[conferencedate]]20130630~20130703[[booktype]]電子版[[iscallforpapers]]Y[[conferencelocation]]Yeosu, Kore

A Low-Power, Highly Stabilized Three-Electrode Potentiostat Using Subthreshold Techniques

Implantable micro- and nano- sensors and implantable microdevices (IMDs) have demonstrated potential for monitoring various physiological parameters such as glucose, lactate, CO2 [carbon dioxide], pH, etc. Potentiostats are essential components of electrochemical sensors such as glucose monitoring devices for diabetic patients. Diabetes is a metabolic disorder associated with insufficient production or inefficient utilization of insulin. The most important role of this enzyme is to regulate the metabolic breakdown of glucose generating the necessary energy for human activities. Diabetic patients typically monitor their blood glucose levels by pricking a fingertip with a lancing device and applying the blood to a glucose meter. This painful process may need to be repeated once before each meal and once 1- 4 hour after meal. Patients may need to inject insulin manually to keep the blood glucose level at 3.9-6.7 mmol [mili mol] /liter. Frequent glucose measurement can help reduce the long term complication of this disease which includes kidney disease, nerve damage, heart and blood vessel diseases, gum disease, glaucoma and etc. Having an implanted close loop insulin delivery system can help increase the frequency of glucose measurement and the accuracy of insulin injection. The implanted close loop system consists of three main blocks: (1) an electrochemical sensor in conjunction with a potentiostat to measure the blood glucose level, (2) a control block that defines the level of insulin injection and (3) an implanted insulin pump. To provide a continuous health-care monitoring the implantable unit has to be powered up using wireless techniques. Minimizing the power consumption associated with the implantable system can improve the battery life times or minimize the power transfer through the human body. The focus of this work is on the design of low-power potentiostats for the implantable glucose monitoring system. This work addresses the conventional structures in potentiostat design and the problems associated with these designs. Based on this discussion a modification is made to improve the stability without increasing the complexity of the system. The proposed design adopts a subthreshold biasing scheme for the design of a highly-stabilized, low-power potentiostats

A Sub-kT/q Voltage Reference Operating at 150 mV

We propose a subthreshold CMOS voltage reference operating with a minimum supply voltage of only 150 mV, which is three times lower than the minimum value presently reported in the literature. The generated reference voltage is only 17.69 mV. This result has been achieved by introducing a temperature compensation technique that does not require the drain-source voltage of each MOSFET to be larger than 4kT/q. The implemented solution consists in two transistors voltage reference with two MOSFETs of the same threshold-type and exploits the dependence of the threshold voltage on transistor size. Measurements performed over a large sample population of 60 chips from two separate batches show a standard deviation of only 0.29 mV. The mean variation of the reference voltage for VDD ranging from 0.15 to 1.8 V is 359.5 μV/V, whereas the mean variation of VREF in the temperature range from 0°C to 120°C is 26.74 μV/°C. The mean power consumption at 25 °C for VDD = 0.15 V is 26.1 pW. The occupied area is 1200 μm2